A photomultiplier (PMT)-based diagnostic system for monitoring spectral lines along multiple viewchords, named the “Filterscope” [R. J. Colchin et al, Rev. Sci. Instrum. 74, 2068 (2003)], is currently in use at the DIII-D, NSTX, and CDX-U fusion plasma devices in the US, and has been installed at the KSTAR device in Korea. This diagnostic has recently been upgraded for application to long-pulse devices, such as KSTAR, EAST in China, and the future ITER in France. A new data acquisition system, employing the PXI instrumentation platform with an embedded Windows microprocessor controller, can simultaneously record up to 72 channels at sampling rates for plasma periods lasting up to . Based on the average signal level during an adjustable time interval ( in the present DIII-D implementation), the controller digitally adjusts PMT dynode voltage throughout the course of a discharge, thereby maintaining the output signals at a level where they are neither saturated nor dominated by digitizer noise. The new system’s ability to accommodate large variations in source strength, discharge to discharge and within a single discharge, has proved particularly valuable during DIII-D operations, since changes between top, bottom, and double-null divertor magnetic configurations lead to large temporal variations in signal brightness.
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October 2008
PROCEEDINGS OF THE 17TH TOPICAL CONFERENCE ON HIGH-TEMPERATURE PLASMA DIAGNOSTICS (HTPD0)
11-15 May 2008
Albuquerque, New Mexico (USA)
Research Article|
October 31 2008
Filterscopes: Spectral line monitors for long-pulse plasma devicesa)
N. H. Brooks;
N. H. Brooks
1
General Atomics
, P.O. Box 85608, San Diego, California 92186-5608, USA
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R. J. Colchin;
R. J. Colchin
2
Oak Ridge National Laboratory
, Oak Ridge, Tennessee 37831-8072, USA
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D. T. Fehling;
D. T. Fehling
2
Oak Ridge National Laboratory
, Oak Ridge, Tennessee 37831-8072, USA
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D. L. Hillis;
D. L. Hillis
2
Oak Ridge National Laboratory
, Oak Ridge, Tennessee 37831-8072, USA
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Y. Mu;
Y. Mu
3
University of Toronto
, 10 King’s College Road, Toronto, Ontario M5S 3G4, Canada
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E. Unterberg
E. Unterberg
4
Oak Ridge Institute for Science and Education
, 120 Badger Avenue, Oak Ridge, Tennessee 37831-0117, USA
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a)
Contributed paper, published as part of the Proceedings of the 17th Topical Conference on High-Temperature Plasma Diagnostics, Albuquerque, New Mexico, May 2008.
Rev. Sci. Instrum. 79, 10F330 (2008)
Article history
Received:
May 07 2008
Accepted:
May 12 2008
Citation
N. H. Brooks, R. J. Colchin, D. T. Fehling, D. L. Hillis, Y. Mu, E. Unterberg; Filterscopes: Spectral line monitors for long-pulse plasma devices. Rev. Sci. Instrum. 1 October 2008; 79 (10): 10F330. https://doi.org/10.1063/1.2957777
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