A versatile system has been developed for the measurement under LABVIEW™ control of junction temperatures in a light emitting diode (LED). Measurements are reported on a commercially available high-intensity InGaAlP LED immersed in liquid nitrogen and driven by currents in the range of . The measured junction temperature has an expanded uncertainty of at the 95% level of confidence for temperatures from . Using the measured junction temperatures, the junction-to-case thermal resistance of the LED was established as for devices with intact encapsulation and for partial encapsulation.
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Brief Report| April 14 2006
System for measuring the junction temperature of a light emitting diode immersed in liquid nitrogen
L. Kirkup, W. Kalceff, G. McCredie; System for measuring the junction temperature of a light emitting diode immersed in liquid nitrogen. Rev. Sci. Instrum. 1 April 2006; 77 (4): 046107. https://doi.org/10.1063/1.2194482
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