A new technique to determine the edge of an electron-free sheath is presented. The technique takes advantage of the variation of the inflection point of the emissive probe I-V characteristic with electron emission. The edge of the electron-free sheath is identified as the position where the inflection point changes from increasing with emission to decreasing with emission.

1.
P.
Coakley
and
N.
Hershkowitz
,
Phys. Fluids
22
,
1171
(
1979
).
2.
E. Y.
Wang
,
N.
Hershkowitz
,
T.
Intrator
, and
C.
Forest
,
Rev. Sci. Instrum.
57
,
2425
(
1986
).
3.
R. E.
Kemp
and
J. M.
Sellen
,
Rev. Sci. Instrum.
37
,
455
(
1966
).
4.
J. R.
Smith
,
N.
Hershkowitz
, and
P.
Coakley
,
Rev. Sci. Instrum.
50
,
210
(
1979
).
5.
M. A.
Lieberman
and
A. J.
Lichtenberg
,
Principles of Plasma Discharges and Materials Processing
(
Wiley
,
New York
,
1994
), p.
166
.
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