We discuss techniques for managing and visualizing x-ray diffraction spectrum data for thin film composition spreads which map large fractions of ternary compositional phase diagrams. An in-house x-ray microdiffractometer is used to obtain spectra from over 500 different compositions on an individual spread. The MATLAB software is used to quickly organize the data and create various plots from which one can quickly grasp different information regarding structural and phase changes across the composition spreads. Such exercises are valuable in rapidly assessing the “overall” picture of the structural evolution across phase diagrams before focusing in on specific composition regions for detailed structural analysis. We have also shown that simple linear correlation analysis of the x-ray diffraction peak information (position, intensity and full width at half maximum) and physical properties such as magnetization can be used to obtain insight about the physical properties.
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June 2005
Research Article|
June 01 2005
Data management and visualization of x-ray diffraction spectra from thin film ternary composition spreads
I. Takeuchi;
I. Takeuchi
a)
Department of Materials Science and Engineering and Center for Superconducting Research,
University of Maryland
, College Park, Maryland 20742
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C. J. Long;
C. J. Long
Department of Materials Science and Engineering and Center for Superconducting Research,
University of Maryland
, College Park, Maryland 20742
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O. O. Famodu;
O. O. Famodu
Department of Materials Science and Engineering and Center for Superconducting Research,
University of Maryland
, College Park, Maryland 20742
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M. Murakami;
M. Murakami
Department of Materials Science and Engineering and Center for Superconducting Research,
University of Maryland
, College Park, Maryland 20742
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J. Hattrick-Simpers;
J. Hattrick-Simpers
Department of Materials Science and Engineering and Center for Superconducting Research,
University of Maryland
, College Park, Maryland 20742
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G. W. Rubloff;
G. W. Rubloff
Department of Materials Science and Engineering and Center for Superconducting Research,
University of Maryland
, College Park, Maryland 20742
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M. Stukowski;
M. Stukowski
Department of Materials Science and Engineering,
Rensselaer Polytechnic Institute
, Troy, New York 12180
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K. Rajan
K. Rajan
Department of Materials Science and Engineering,
Rensselaer Polytechnic Institute
, Troy, New York 12180
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a)
Author to whom correspondence should be addressed; electronic mail: takeuchi@umd.edu
Rev. Sci. Instrum. 76, 062223 (2005)
Article history
Received:
December 09 2004
Accepted:
April 13 2005
Citation
I. Takeuchi, C. J. Long, O. O. Famodu, M. Murakami, J. Hattrick-Simpers, G. W. Rubloff, M. Stukowski, K. Rajan; Data management and visualization of x-ray diffraction spectra from thin film ternary composition spreads. Rev. Sci. Instrum. 1 June 2005; 76 (6): 062223. https://doi.org/10.1063/1.1927079
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