Quicker imaging times for tapping mode atomic force microscopy in liquid could provide a real-time imaging tool for studying dynamic phenomena in physiological conditions. We demonstrate faster imaging speed using microcantilevers with integrated piezoelectric actuators. The exposed electric components of the cantilever necessitate an insulation scheme for use in liquid; three coating schemes have been tested. Preliminary tapping mode images have been taken using the insulated microactuator to simultaneously vibrate and actuate the cantilever over topographical features in liquid, including a high speed image of steps on a mica surface in water and an image of two e coli bacteria taken in saline solution at 75.5 μm/s, a threefold improvement in bandwidth versus conventional piezotube actuators.
Skip Nav Destination
Article navigation
November 2003
Research Article|
November 01 2003
High speed tapping mode atomic force microscopy in liquid using an insulated piezoelectric cantilever Available to Purchase
B. Rogers;
B. Rogers
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
Search for other works by this author on:
T. Sulchek;
T. Sulchek
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
Search for other works by this author on:
K. Murray;
K. Murray
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
Search for other works by this author on:
D. York;
D. York
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
Search for other works by this author on:
M. Jones;
M. Jones
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
Search for other works by this author on:
L. Manning;
L. Manning
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
Search for other works by this author on:
S. Malekos;
S. Malekos
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
Search for other works by this author on:
B. Beneschott;
B. Beneschott
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
Search for other works by this author on:
J. D. Adams;
J. D. Adams
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
Search for other works by this author on:
H. Cavazos;
H. Cavazos
Nanodevices Inc., 5571 Ekwill Street, Santa Barbara, California 93111
Search for other works by this author on:
S. C. Minne
S. C. Minne
Nanodevices Inc., 5571 Ekwill Street, Santa Barbara, California 93111
Search for other works by this author on:
B. Rogers
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
T. Sulchek
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
K. Murray
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
D. York
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
M. Jones
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
L. Manning
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
S. Malekos
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
B. Beneschott
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
J. D. Adams
Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, Nevada 89557
H. Cavazos
Nanodevices Inc., 5571 Ekwill Street, Santa Barbara, California 93111
S. C. Minne
Nanodevices Inc., 5571 Ekwill Street, Santa Barbara, California 93111
Rev. Sci. Instrum. 74, 4683–4686 (2003)
Article history
Received:
April 07 2003
Accepted:
August 21 2003
Citation
B. Rogers, T. Sulchek, K. Murray, D. York, M. Jones, L. Manning, S. Malekos, B. Beneschott, J. D. Adams, H. Cavazos, S. C. Minne; High speed tapping mode atomic force microscopy in liquid using an insulated piezoelectric cantilever. Rev. Sci. Instrum. 1 November 2003; 74 (11): 4683–4686. https://doi.org/10.1063/1.1619548
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
Overview of the early campaign diagnostics for the SPARC tokamak (invited)
M. L. Reinke, I. Abramovic, et al.
Line-scan imaging for real-time phenotypic screening of C.
elegans
Aaron Au, Maximiliano Giuliani, et al.
An ion-imaging detector for high count rates
Kai Golibrzuch, Florian Nitz, et al.
Related Content
Tapping mode atomic force microscopy in liquid with an insulated piezoelectric microactuator
Rev. Sci. Instrum. (September 2002)
A piezotube scanner for atomic force microscopy in solution
Rev. Sci. Instrum. (July 1996)
Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor
Appl. Phys. Lett. (February 1996)
Vacuum chamber for sample attachment in atomic force microscopy
Rev. Sci. Instrum. (August 1992)
Quantitative characterization of friction coefficient using lateral force microscope in the wearless regime
Rev. Sci. Instrum. (February 2004)