The knowledge of the detection efficiency of the microchannel plate is of upmost importance in many applications using this type of particle detector. However, few attempts have been made to measure the absolute value of the detection efficiency of microchannel plates. In this article, a new way of accurately measuring the absolute value of the detection efficiency is described. When particles hit the detector in the interchannel web of the microchannel plate, secondary electrons are generated. These secondary electrons can be returned to neighboring channels by means of an electric field applied at the front face of the detector. The resulting increase in the detection efficiency has been quantified using the absolute measurement of the detection efficiency. It is found that the value of the returning field has to be carefully set in order to prevent detection artifacts that may lead to a wrong estimation of the detection efficiency. In the best conditions, the detection efficiency increase reaches 40%.
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April 2002
Research Article|
March 27 2002
Improved ion detection efficiency of microchannel plate detectors
B. Deconihout;
B. Deconihout
Groupe de Physique des Matériaux, UMR 6634 Université et INSA de ROUEN, 7821 Mont Saint-Aignan cedex, France
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F. Vurpillot;
F. Vurpillot
Groupe de Physique des Matériaux, UMR 6634 Université et INSA de ROUEN, 7821 Mont Saint-Aignan cedex, France
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M. Bouet;
M. Bouet
Groupe de Physique des Matériaux, UMR 6634 Université et INSA de ROUEN, 7821 Mont Saint-Aignan cedex, France
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L. Renaud
L. Renaud
Cameca France, 103 Boulevard Saint-Denis, BP 6, 92403 Courbevoie cedex, France
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Rev. Sci. Instrum. 73, 1734–1740 (2002)
Article history
Received:
August 01 2001
Accepted:
January 23 2002
Citation
B. Deconihout, F. Vurpillot, M. Bouet, L. Renaud; Improved ion detection efficiency of microchannel plate detectors. Rev. Sci. Instrum. 1 April 2002; 73 (4): 1734–1740. https://doi.org/10.1063/1.1461882
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