X-ray excited optical luminescence (XEOL) studies of several classes of light emitting materials excited using soft x rays (photon energy ranging from 10 to 2500 eV) are presented. We show that XEOL with soft x rays (short penetration depths) is often site specific and is ideally suited for the study of light emitting thin films and devices. Several examples including porous silicon, organic light emitting diode materials, and CdS based nanostructures are used to illustrate the unique properties of XEOL and its applications in the soft x-ray energy region.
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© 2002 American Institute of Physics.
2002
American Institute of Physics
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