A third-generation synchrotron radiation source provides enough brilliance to acquire complete tomographic data sets at 100 nm or better resolution in a few minutes. To take advantage of such high-brilliance sources at the Advanced Photon Source, we have constructed a pipelined data acquisition and reconstruction system that combines a fast detector system, high-speed data networks, and massively parallel computers to rapidly acquire the projection data and perform the reconstruction and rendering calculations. With the current setup, a data set can be obtained and reconstructed in tens of minutes. A specialized visualization computer makes rendered three-dimensional (3D) images available to the beamline users minutes after the data acquisition is completed. This system is capable of examining a large number of samples at sub-μm 3D resolution or studying the full 3D structure of a dynamically evolving sample on a 10 min temporal scale. In the near future, we expect to increase the spatial resolution to below 100 nm by using zone-plate x-ray focusing optics and to improve the time resolution by the use of a broadband x-ray monochromator and a faster detector system.
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April 2001
Research Article|
April 01 2001
A high-throughput x-ray microtomography system at the Advanced Photon Source
Yuxin Wang;
Yuxin Wang
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois
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Francesco De Carlo;
Francesco De Carlo
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois
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Derrick C. Mancini;
Derrick C. Mancini
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois
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Ian McNulty;
Ian McNulty
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois
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Brian Tieman;
Brian Tieman
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois
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John Bresnahan;
John Bresnahan
Mathematics and Computer Science Division, Argonne National Laboratory, Argonne, Illinois
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Ian Foster;
Ian Foster
Mathematics and Computer Science Division, Argonne National Laboratory, Argonne, Illinois
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Joseph Insley;
Joseph Insley
Mathematics and Computer Science Division, Argonne National Laboratory, Argonne, Illinois
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Peter Lane;
Peter Lane
Mathematics and Computer Science Division, Argonne National Laboratory, Argonne, Illinois
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Gregor von Laszewski;
Gregor von Laszewski
Mathematics and Computer Science Division, Argonne National Laboratory, Argonne, Illinois
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Carl Kesselman;
Carl Kesselman
Information Sciences Institute, University of Southern California, California
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Mei-Hui Su;
Mei-Hui Su
Information Sciences Institute, University of Southern California, California
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Marcus Thiebaux
Marcus Thiebaux
Information Sciences Institute, University of Southern California, California
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Rev. Sci. Instrum. 72, 2062–2068 (2001)
Article history
Received:
November 14 2000
Accepted:
January 23 2001
Citation
Yuxin Wang, Francesco De Carlo, Derrick C. Mancini, Ian McNulty, Brian Tieman, John Bresnahan, Ian Foster, Joseph Insley, Peter Lane, Gregor von Laszewski, Carl Kesselman, Mei-Hui Su, Marcus Thiebaux; A high-throughput x-ray microtomography system at the Advanced Photon Source. Rev. Sci. Instrum. 1 April 2001; 72 (4): 2062–2068. https://doi.org/10.1063/1.1355270
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