We describe a novel single-coil mutual inductance technique for measuring the magnetic penetration depth λ of superconductors at 2–4 MHz as a function of temperature in the 4–100 K range. We combine a single-coil configuration with a high-stability marginal oscillator; this enables us to measure the absolute value of λ on both bulk samples and thin films with very high resolution pm) and a precision of 30 nm. As example of application, we report measurements on NbTi bulk samples and Nb films. This contactless technique is suited for probing the superconducting properties of samples over large surfaces.
REFERENCES
1.
See, for example,
F.
Gross
, B. S.
Chandrasekhar
, D.
Einzel
, K.
Andres
, P. J.
Hirschfeld
, H. R.
Ott
, J.
Beuers
, Z.
Fisk
, and J. L.
Smith
, Z. Phys. B: Condens. Matter
64
, 175
(1988
).2.
W. N.
Hardy
, D. A.
Bonn
, D. C.
Morgan
, R.
Liang
, and K.
Zhang
, Phys. Rev. Lett.
70
, 3999
(1993
).3.
J. R.
Kirtley
, C. C.
Tsuei
, M.
Rupp
, J. Z.
Sun
, L. S.
Yu-Jahnes
, A.
Gupta
, M. B.
Ketchen
, K. A.
Moler
, and M.
Bhushan
, Phys. Rev. Lett.
76
, 1336
(1996
), and references therein.4.
5.
A. P.
Mackenzie
, R. K. W.
Haselwimmer
, A. W.
Tyler
, G. G.
Lonzarich
, Y.
Mori
, S.
Nishizaki
, and Y.
Maeno
, Phys. Rev. Lett.
80
, 161
(1998
).6.
Li
Qiang
, Y. N.
Tsay
, M.
Suenaga
, R. A.
Klemm
, G. D.
Cu
, and N.
Koshizuka
, Phys. Rev. Lett.
83
, 4160
(1999
), and references therein.7.
A W.
Overhauser
and L. L.
Daemen
, Phys. Rev. Lett.
61
, 1885
(1988
);8.
N.
Klein
, H.
Chaloupka
, G.
Müller
, S.
Orbach
, H.
Piel
, B.
Roas
, L.
Schultz
, U.
Klein
, and M.
Peiniger
, J. Appl. Phys.
67
, 6940
(1990
).9.
10.
A. T.
Fiory
, A. F.
Hebard
, P. M.
Mankiewich
, and R. E.
Howard
, Appl. Phys. Lett.
52
, 2165
(1988
).11.
B.
Jeanneret
, J. L.
Gavilano
, G. A.
Racine
, Ch.
Leemann
, and P.
Martinoli
, Appl. Phys. Lett.
55
, 2336
(1989
).12.
13.
V. A. Gasparov, I. Batov, Qi Li, and C. Kwon, Physica B (in press);
V. A.
Gasparov
, I.
Batov
, Qi
Li
, and C.
Kwon
, Proc. SPIE
2697
, 391
(1996
).14.
P.-A.
Probst
, B.
Collet
, and W. M.
MacInnes
, Rev. Sci. Instrum.
47
, 1522
(1976
).15.
V. A.
Gasparov
, M. R.
Mkrtchyan
, M. A.
Obolensky
, and A. V.
Bondarenko
, Physica C
231
, 197
(1994
).16.
B.
Plaçais
, P.
Mathieu
, Y.
Simon
, E. B.
Sonin
, and K. B.
Traito
, Phys. Rev. B
54
, 13083
(1996
).17.
J. Pearl, Ph.D. thesis, Polytechnic Institute of Brooklyn, New York, 1965.
18.
J. H.
Claassen
, M. L.
Wilson
, J. M.
Byers
, and S.
Adrian
, J. Appl. Phys.
82
, 3028
(1997
).19.
S. J.
Turneaure
, E. R.
Ulm
, and T. R.
Lemberger
, J. Appl. Phys.
79
, 4221
(1996
).20.
G. White, in Experimental Techniques in Low Temperature Physics (Oxford University Press, Oxford, 1987).
21.
22.
L. V.
Mercaldo
, S. M.
Anlage
, and L.
Maritato
, Phys. Rev. B
59
, 4455
(1999
).23.
L. D. Landau and E. M. Lifshitz, Statistical Physics, Part II (Pergamon, Oxford, 1980).
24.
H.
Zhang
, J. W.
Lynn
, C. F.
Majkrzak
, S. K.
Satija
, J. H.
Kang
, and X. D.
Wu
, Phys. Rev. B
52
, 10395
(1998
).25.
This content is only available via PDF.
© 2000 American Institute of Physics.
2000
American Institute of Physics
You do not currently have access to this content.
