A simple low-cost heating stage for scanning probe microscopes has been developed. The goal of this design is to minimize the drift due to thermal expansion of the sample and of the heater itself both in the vertical and the in-plane directions. It is composed of materials with different thermal expansion coefficients. The key point is to adjust the relative length of the different elements in such a way that the sample surface’s position is fixed when temperature changes. It has been proven to drift laterally less than 60 nm per degree and vertically less than 42 nm per degree. It allows one to access temperatures up to 150 °C. This stage can be adapted to most commercial microscopes and does not require modifications of the microscope itself. The design of the heating stage is presented with calibration results providing the good thermal stability of the design.
Skip Nav Destination
Article navigation
March 1999
Letter|
March 01 1999
Simple low-drift heating stage for scanning probe microscopes
F. Oulevey;
F. Oulevey
Institut de Génie Atomique, Département de Physique, Ecole Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland
Search for other works by this author on:
G. Gremaud;
G. Gremaud
Institut de Génie Atomique, Département de Physique, Ecole Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland
Search for other works by this author on:
A. J. Kulik;
A. J. Kulik
Institut de Génie Atomique, Département de Physique, Ecole Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland
Search for other works by this author on:
B. Guisolan
B. Guisolan
Institut de Génie Atomique, Département de Physique, Ecole Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland
Search for other works by this author on:
Rev. Sci. Instrum. 70, 1889–1890 (1999)
Article history
Received:
August 31 1998
Accepted:
December 03 1998
Citation
F. Oulevey, G. Gremaud, A. J. Kulik, B. Guisolan; Simple low-drift heating stage for scanning probe microscopes. Rev. Sci. Instrum. 1 March 1999; 70 (3): 1889–1890. https://doi.org/10.1063/1.1149689
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
Overview of the early campaign diagnostics for the SPARC tokamak (invited)
M. L. Reinke, I. Abramovic, et al.
An instrumentation guide to measuring thermal conductivity using frequency domain thermoreflectance (FDTR)
Dylan J. Kirsch, Joshua Martin, et al.
A glovebox-integrated confocal microscope for quantum sensing in inert atmosphere
Kseniia Volkova, Abhijeet M. Kumar, et al.
Related Content
Setup for observing living cells using a commercial atomic force microscope
Rev. Sci. Instrum. (November 2000)
Fast heating stage for open liquid-cell atomic force microscopy
Rev. Sci. Instrum. (March 2006)
A replaceable, low thermal mass hot stage for scanning probe microscopy
Rev. Sci. Instrum. (March 2003)