An apparatus has been built to measure the shear response of a multicontact interface between flat-ended solid bodies, rough at the micron scale. The device makes use of inertia to apply a steady sinusoidal shear force to a slider without direct mechanical drive. Both elastic compliance and damping losses are deduced from the in-phase and out-of-phase components of the submicronic shear displacement. Operating frequencies range between 15 Hz and 1 kHz, while below 100 Hz quasistatic motion of the slider is achieved. Acceleration amplitudes range typically between 0.1 and 7 m where gross sliding occurs. The resolution of the microslip detection is 1 nm. Apparatus design and operation are described, and the application and limitation of the method to a weakly nonlinear response are discussed and illustrated by experimental results with a polymer glass.
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June 1998
Research Article|
June 01 1998
An inertial tribometer for measuring microslip dissipation at a solid–solid multicontact interface
Tristan Baumberger;
Tristan Baumberger
Laboratoire de Physique de la Matière Condensée, École Normale supérieure, 24 rue Lhomond, 75231 Paris Cedex 05, France
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Lionel Bureau;
Lionel Bureau
Laboratoire de Physique de la Matière Condensée, École Normale supérieure, 24 rue Lhomond, 75231 Paris Cedex 05, France
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Michel Busson;
Michel Busson
Laboratoire de Physique de la Matière Condensée, École Normale supérieure, 24 rue Lhomond, 75231 Paris Cedex 05, France
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Eric Falcon;
Eric Falcon
Laboratoire de Physique de la Matière Condensée, École Normale supérieure, 24 rue Lhomond, 75231 Paris Cedex 05, France
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Bernard Perrin
Bernard Perrin
Laboratoire de Physique de la Matière Condensée, École Normale supérieure, 24 rue Lhomond, 75231 Paris Cedex 05, France
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Rev. Sci. Instrum. 69, 2416–2420 (1998)
Article history
Received:
November 17 1997
Accepted:
March 05 1998
Citation
Tristan Baumberger, Lionel Bureau, Michel Busson, Eric Falcon, Bernard Perrin; An inertial tribometer for measuring microslip dissipation at a solid–solid multicontact interface. Rev. Sci. Instrum. 1 June 1998; 69 (6): 2416–2420. https://doi.org/10.1063/1.1148969
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