A new 20-channel electron cyclotron absorption diagnostic has been developed at the Rijnhuizen tokamak project. It is the first time the electron pressure profile in a tokamak plasma can be measured directly with a time resolution of 1 ms. The diagnostic measures simultaneously the emission and absorption of the second harmonic electron cyclotron frequencies. Microwaves are injected from the high field side and detected at the low field side in the equatorial midplane. The transmitted power is measured after a single pass through the plasma column. The absorption measurements are complicated by nonresonant losses: refraction of the injected microwaves (losses up to 100%), and scattering of microwaves by density fluctuations (losses 2%–3%). A fast algorithm has been developed to obtain a quantitative measure for these nonresonant losses. This calculation method is based on a parametrization of the experimental data. Combining the electron cyclotron absorption (ECA) measurements and the parametrization provides a reliable tool for determining the optical depth, the electron temperature, and the electron pressure. A good agreement was found between pressure and temperature profiles, measured with ECA and other diagnostics.
Skip Nav Destination
Article navigation
December 1997
Research Article|
December 01 1997
The electron cyclotron absorption diagnostic at the Rijnhuizen tokamak project
J. F. M. van Gelder;
J. F. M. van Gelder
FOM-Instituut voor Plasmafysica “Rijnhuizen,” Association Euratom-FOM, Trilateral Euregio Cluster, P.O. Box 1207, 3430 BE Nieuwegein, The Netherlands
Search for other works by this author on:
H. S. Miedema;
H. S. Miedema
FOM-Instituut voor Plasmafysica “Rijnhuizen,” Association Euratom-FOM, Trilateral Euregio Cluster, P.O. Box 1207, 3430 BE Nieuwegein, The Netherlands
Search for other works by this author on:
A. J. H. Donné;
A. J. H. Donné
FOM-Instituut voor Plasmafysica “Rijnhuizen,” Association Euratom-FOM, Trilateral Euregio Cluster, P.O. Box 1207, 3430 BE Nieuwegein, The Netherlands
Search for other works by this author on:
A. A. M. Oomens;
A. A. M. Oomens
FOM-Instituut voor Plasmafysica “Rijnhuizen,” Association Euratom-FOM, Trilateral Euregio Cluster, P.O. Box 1207, 3430 BE Nieuwegein, The Netherlands
Search for other works by this author on:
F. C. Schüller
F. C. Schüller
FOM-Instituut voor Plasmafysica “Rijnhuizen,” Association Euratom-FOM, Trilateral Euregio Cluster, P.O. Box 1207, 3430 BE Nieuwegein, The Netherlands
Search for other works by this author on:
Rev. Sci. Instrum. 68, 4439–4447 (1997)
Article history
Received:
July 28 1997
Accepted:
September 03 1997
Citation
J. F. M. van Gelder, H. S. Miedema, A. J. H. Donné, A. A. M. Oomens, F. C. Schüller; The electron cyclotron absorption diagnostic at the Rijnhuizen tokamak project. Rev. Sci. Instrum. 1 December 1997; 68 (12): 4439–4447. https://doi.org/10.1063/1.1148411
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
An instrumentation guide to measuring thermal conductivity using frequency domain thermoreflectance (FDTR)
Dylan J. Kirsch, Joshua Martin, et al.
Overview of the early campaign diagnostics for the SPARC tokamak (invited)
M. L. Reinke, I. Abramovic, et al.
Analysis methodology of coherent oscillations in time- and angle-resolved photoemission spectroscopy
Nicolas Gauthier, Hadas Soifer, et al.
Related Content
Heterodyne radiometer at Rijnhuizen Tokamak Project for electron cyclotron emission and absorption measurements
Rev. Sci. Instrum. (January 1995)
Electron cyclotron emission imaging diagnostic system for Rijnhuizen Tokamak Project
Rev. Sci. Instrum. (January 1999)
Steady state off-axis sawtoothing in the Rijnhuizen Tokamak project
Phys. Plasmas (October 1999)
Structures in T e profiles: High resolution Thomson scattering in the Rijnhuizen tokamak project
Rev. Sci. Instrum. (January 1999)
A high resolution multiposition Thomson scattering system for the Rijnhuizen Tokamak Project
Rev. Sci. Instrum. (September 1997)