A simple Kerr microscope designed for in situ investigation of magnetic ultrathin films in ultrahigh vacuum environment is described. The system permits quick visualization of domain patterns with 10 μm lateral resolution. Simultaneous optical magnetometry is also possible. The performance of the system is illustrated with domain images in a few layers thick Fe films on Cu(001) and W(110).

Topics
Thin films, Kerr microscopy, Kerr effects, Optical devices
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© 1996 American Institute of Physics.
1996
American Institute of Physics
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