We present a new technique to measure the complex surface impedance of the mixed state of superconducting thin films over the broad frequency range 45 MHz–20 GHz. The surface impedance is extracted from measurements of the complex reflection coefficient made on the film using a vector network analyzer. The technique takes advantage of a special geometry in which the self‐fields from currents flowing in the film are everywhere parallel to the film surface, making it an ideal configuration in which to study vortex dynamics in superconductors. The broadband nature of the measurement system allows us to explore a region of magnetic field–temperature–frequency parameter space of superconductors previously inaccessible with other measurement techniques. The power of the technique is illustrated by measurements on thin films of the high temperature superconductor YBa2Cu3O7−δ.
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June 1994
Research Article|
June 01 1994
A broadband method for the measurement of the surface impedance of thin films at microwave frequencies
J. C. Booth;
J. C. Booth
Center for Superconductivity Research, Department of Physics, University of Maryland, College Park, Maryland 20742‐4111
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Dong Ho Wu;
Dong Ho Wu
Center for Superconductivity Research, Department of Physics, University of Maryland, College Park, Maryland 20742‐4111
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Steven M. Anlage
Steven M. Anlage
Center for Superconductivity Research, Department of Physics, University of Maryland, College Park, Maryland 20742‐4111
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Rev. Sci. Instrum. 65, 2082–2090 (1994)
Article history
Received:
February 11 1994
Accepted:
March 15 1994
Citation
J. C. Booth, Dong Ho Wu, Steven M. Anlage; A broadband method for the measurement of the surface impedance of thin films at microwave frequencies. Rev. Sci. Instrum. 1 June 1994; 65 (6): 2082–2090. https://doi.org/10.1063/1.1144816
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