Development efforts are directed at advanced reflectometry systems for next generation tokamaks such as ITER. Laboratory tests have been successfully completed for a pulsed radar reflectometer (τ≂200 ps) to be tested on DIII‐D. In addition, there exists a need for sources and components beyond those commercially available. Monolithic quasi‐optical spatial power combined arrays of solid state devices will provide continuous, watt level swept source coverage up to 200 GHz as well as electronically controlled beam steering, focusing, and modulation. Studies are also underway to address the feasibility of instantaneous profile coverage using monolithic impulse generators (τ≂1–3 ps) comprised of spatially combined nonlinear transmission lines, employing novel quantum barrier varactors.
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October 1992
Proceedings of the 9th topical conference on high temperature plasma diagnotics
15−19 Mar 1992
Santa Fe, New Mexico (USA)
Research Article|
October 01 1992
Development of technology and techniques for reflectometry Available to Purchase
C. W. Domier;
C. W. Domier
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
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E. Chung;
E. Chung
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
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E. J. Doyle;
E. J. Doyle
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
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H.‐X. L. Liu;
H.‐X. L. Liu
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
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A. Lapidus;
A. Lapidus
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
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N. C. Luhmann, Jr.;
N. C. Luhmann, Jr.
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
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W. A. Peebles;
W. A. Peebles
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
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X.‐H. Qin;
X.‐H. Qin
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
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T. L. Rhodes;
T. L. Rhodes
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
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L. Sjogren
L. Sjogren
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
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C. W. Domier
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
E. Chung
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
E. J. Doyle
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
H.‐X. L. Liu
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
A. Lapidus
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
N. C. Luhmann, Jr.
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
W. A. Peebles
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
X.‐H. Qin
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
T. L. Rhodes
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
L. Sjogren
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California 90024
Rev. Sci. Instrum. 63, 4666–4668 (1992)
Citation
C. W. Domier, E. Chung, E. J. Doyle, H.‐X. L. Liu, A. Lapidus, N. C. Luhmann, W. A. Peebles, X.‐H. Qin, T. L. Rhodes, L. Sjogren; Development of technology and techniques for reflectometry. Rev. Sci. Instrum. 1 October 1992; 63 (10): 4666–4668. https://doi.org/10.1063/1.1143657
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