Diode temperature sensors are capable of being used at the accuracy level of a few hundredths of a kelvin. However, in order to achieve this performance, proper measurement techniques must be used. Poorly shielded or improperly grounded measurement systems can introduce ac noise which will create an apparent shift in the dc voltage reading across a diode sensor. This results in a temperature measurement error which may approach several tenths of a kelvin. The presence of the ac noise in question is not obvious during normal usage and several quick tests are outlined to verify whether or not a noise problem exists. Experimental data and derivations from theoretical p‐n junction characteristics are given which correlate the ac noise level with possible voltage/temperature measurement errors. These results can be used in estimating the accuracy and performance of a temperature measurement system. Several of the more common problems which introduce noise into diode circuitry are described.
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April 1986
Research Article|
April 01 1986
Measurement system induced errors in diode thermometry
John K. Krause;
John K. Krause
Lake Shore Cryotronics, Inc., 64 East Walnut Street, Westerville, Ohio 43081
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Brad C. Dodrill
Brad C. Dodrill
Lake Shore Cryotronics, Inc., 64 East Walnut Street, Westerville, Ohio 43081
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Rev. Sci. Instrum. 57, 661–665 (1986)
Article history
Received:
June 03 1985
Accepted:
December 02 1985
Citation
John K. Krause, Brad C. Dodrill; Measurement system induced errors in diode thermometry. Rev. Sci. Instrum. 1 April 1986; 57 (4): 661–665. https://doi.org/10.1063/1.1138886
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