A new type of a two‐stage electron beam chopping system is proposed. It is easily adapted to a scanning electron microscope because it needs no additional lens. The system operates with primary electron energies between 0.75 and 3 keV and pulse repetition frequencies up to the microwave range. The experimental setup as well as the operational and measurement procedure are described in detail. The achieved results are: rise‐time distortion less than 35 ps, electron beam pulses of 15 ps full width at half‐maximum, and an extremly small drift of less than 40 ps during 10 000 s between the electron beam sampling pulse and the main trigger input.

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