Recent developments in instrumentation for low‐energy electron diffraction (LEED) are reviewed. After a summary of the major types of measurements in LEED, the properties of LEED instruments that are important in performing these measurements are described. A detailed discussion is presented on the major components of a LEED diffractometer. LEED is compared briefly to some other techniques that are sensitive to surface structure.

Topics
Diffractometers, Electron diffraction
This content is only available via PDF.
© 1983 American Institute of Physics.
1983
American Institute of Physics
You do not currently have access to this content.