Recent developments in instrumentation for low‐energy electron diffraction (LEED) are reviewed. After a summary of the major types of measurements in LEED, the properties of LEED instruments that are important in performing these measurements are described. A detailed discussion is presented on the major components of a LEED diffractometer. LEED is compared briefly to some other techniques that are sensitive to surface structure.
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Research Article| October 01 1983
Instrumentation for low‐energy electron diffraction
M. G. Lagally;
M. G. Lagally, J. A. Martin; Instrumentation for low‐energy electron diffraction. Rev. Sci. Instrum. 1 October 1983; 54 (10): 1273–1288. https://doi.org/10.1063/1.1137259
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