Recent developments in instrumentation for low‐energy electron diffraction (LEED) are reviewed. After a summary of the major types of measurements in LEED, the properties of LEED instruments that are important in performing these measurements are described. A detailed discussion is presented on the major components of a LEED diffractometer. LEED is compared briefly to some other techniques that are sensitive to surface structure.

1.
C. J.
Davisson
and
L. H.
Germer
,
Phys. Rev.
30
,
705
(
1927
).
2.
W. T.
Sproull
,
Rev. Sci. Instrum.
4
,
193
(
1933
).
3.
W.
Ehrenberg
,
Philos. Mag.
18
,
878
(
1934
).
4.
J. J.
Lander
,
J.
Morrison
, and
F.
Unterwald
,
Rev. Sci. Instrum.
33
,
782
(
1962
).
5.
C. W.
Caldwell
,
Rev. Sci. Instrum.
36
,
1500
(
1965
).
6.
R. L.
Park
and
H. E.
Farnsworth
,
Rev. Sci. Instrum.
35
,
1592
(
1964
).
7.
For a recent review, see
M. G.
Lagally
,
Appl. Surf. Sci.
13
,
260
(
1982
).
8.
For reviews, see (a)
M. B.
Webb
and
M. G.
Lagally
,
Solid State Phys.
28
,
305
(
1973
);
(b) J. B. Pendry, Low‐Energy Electron Diffraction (Academic), New York, (1974);
(c) J. A. Strozier, D. W. Jepsen, and F. Jona, in Surface Physics of Materials, edited by J. M. Blakely (Academic, New York, 1975);
(d) M. A. van Hove and S. Y. Tong, Surface Crystallography by LEED (Springer, Berlin, 1979);
(e) M. A. van Hove, in The Nature of the Surface Chemical Bond, edited by T. N. Rhodin and G. Ertl (North‐Holland, Amsterdam, 1979).
9.
See, for example, W. W. Beeman, P. Kaesberg, J. W. Anderegg, and M. B. Webb, in Handbuch der Physik, edited by S. Flügge (Springer, Berlin, 1957), Vol. 32;
(b) A. Guinier, X‐Ray Diffraction (Freeman, San Francisco, 1963);
(c) B. E. Warren, X‐Ray Diffraction (Addison‐Wesley, Reading, MA, 1969).
10.
(a) M. Henzler, in Electron Spectroscopy for Surface Analysis, edited by H. Ibach (Springer, Berlin, 1977);
(b)
Appl. Surf. Sci.
11/12
,
450
(
1982
);
(c) M. G. Lagally and D. G. Welkie, in Advanced Techniques for Characterizing Microstructures, edited by F. W. Wiffen and J. A. Spitznagel (The Metallurgical Society of AIME, Warrendale, PA, 1982);
(d) M. G. Lagally, in Chemistry and Physics of Solid Surfaces, Vol. IV, edited by R. Vanselow, and R. Howe, Springer Series in Chemical Physics (Springer, Heidelberg, 1982), Vol. 20;
(e)
R. L.
Park
,
J. Appl. Phys.
37
,
295
(
1966
);
(f)
J. E.
Houston
and
R. L.
Park
,
Surf. Sci.
21
,
209
(
1970
);
J. E.
Houston
and
R. L.
Park
,
26
,
269
(
1971
); ,
Surf. Sci.
(g)
S. C.
Fain
,Jr.
and
M. D.
Chinn
,
J. Phys. (Paris)
38
Suppl.
10
,
C4
99
(
1977
);
(h)
P. J.
Estrup
and
E. G.
McRae
,
Surf. Sci.
25
,
1
(
1971
);
(i)
S.
Semancik
and
P. J.
Estrup
,
J. Vac. Sci. Technol.
18
,
541
(
1981
);
(j)
R. A.
Barker
and
P. J.
Estrup
,
J. Chem. Phys.
74
,
1442
(
1981
).
11.
R. L.
Park
,
J. E.
Houston
, and
D. G.
Schreiner
,
Rev. Sci. Instrum.
42
,
60
(
1971
).
12.
T.‐M.
Lu
and
M. G.
Lagally
,
Surf. Sci.
99
,
695
(
1980
).
13.
See, for example, K. R. Spangenberg, Fundamentals of Electron Devices, (McGraw‐Hill, New York, 1957);
R. L. Park, in Experimental Methods in Catalytic Research, edited by M. Dawson and C. A. Anderson (Academic, New York, 1976), Vol. III.
14.
For a lucid discussion of the proper interpretation of instrument response functions and “coherence widths” in LEED, see
G.
Comsa
,
Surf. Sci.
81
,
57
(
1979
).
15.
G.‐C.
Wang
and
M. G.
Lagally
,
Surf. Sci.
81
,
69
(
1979
).
16.
T.‐M.
Lu
,
M. G.
Lagally
, and
G.‐C.
Wang
,
Surf. Sci.
104
,
L229
(
1981
).
17.
D. G.
Welkie
and
M. G.
Lagally
,
Appl. Surf. Sci.
3
,
272
(
1979
).
18.
H. M. Clearfield (unpublished).
19.
For reviews, see R. F. Wallis, in Progress in Surface Science, edited by S. G. Davison (Pergamon, New York, 1973), Vol. 4;
M. G. Lagally, in Surface Physics of Materials, edited by J. M. Blakely (Academic, New York, 1975).
20.
Cliftronics, Model 406‐S, Clifton, NJ.
21.
J. A.
Martin
and
M. G.
Lagally
,
J. Vac. Sci. Technol.
18
,
58
(
1981
).
22.
J. A. Martin (unpublished).
23.
W. N. Unertl (private communication).
24.
C. W.
Tucker
, Jr.
,
Appl. Phys. Lett.
1
,
34
(
1962
).
25.
R. L. Dennis, Ph.D. dissertation, University of Wisconsin‐Madison, 1972 (unpublished);
R. L.
Dennis
and
M. B.
Webb
,
J. Vac. Sci. Technol.
10
,
192
(
1973
).
26.
P. I. Cohen, Ph.D. dissertation, University of Wisconsin‐Madison, 1975 (unpublished);
P. I.
Cohen
,
J.
Unguris
, and
M. B.
Webb
,
Surf. Sci.
58
,
429
(
1976
).
27.
F.‐W. Wulfert, Ph.D. dissertation, University of Hannover, 1982 (unpublished);
Ref. 10b.
28.
J. A.
Martin
and
M. G.
Lagally
,
J. Vac. Sci. Technol. A
1
,
1210
(
1983
).
29.
K. G.
Predko
and
M. P.
Znachenok
,
J. Appl. Spectrosc. (USSR)
10
,
694
(
1969
);
I. P.
Csorba
,
RCA Rev.
30
,
36
(
1969
).
30.
A.
Bril
and
F. A.
Kröger
,
Phillips Tech. Rev.
12
,
120
(
1950
).
31.
L.
de Bersuder
,
Rev. Sci. Instrum.
45
,
1569
(
1972
);
P. A. Bennett and M. B. Webb (private communication).
32.
A. G.
Schrott
,
M. D.
Chinn
,
C. G.
Shaw
, and
S. C.
Fain
, Jr.
,
J. Vac. Sci. Technol.
21
,
101
(
1982
).
33.
P. C.
Stair
,
T. J.
Kaminska
,
L. L.
Kesmodel
, and
G. A.
Somorjai
,
Phys. Rev. B
11
,
623
(
1975
).
34.
D. C.
Frost
,
K. A. R.
Mitchell
,
F. R.
Shepherd
, and
P. R.
Watson
,
J. Vac. Sci. Technol.
13
,
1196
(
1976
);
T. N.
Tommet
,
G. B.
Olszewski
,
P. A.
Chadwick
, and
S. L.
Bernasek
,
Rev. Sci. Instrum.
50
,
147
(
1979
).
35.
P.
Heilman
,
E.
Lang
,
K.
Heinz
, and
K.
Müller
,
Appl. Phys.
9
,
247
(
1976
).
36.
E.
Lang
,
P.
Heilman
,
G.
Hanke
,
K.
Heinz
, and
K.
Müller
,
Appl. Phys.
19
,
287
(
1979
).
37.
R. L.
Lamberts
,
G.‐C.
Higgins
, and
R. N.
Wolfe
,
J. Opt. Soc. Am.
48
,
487
(
1958
);
R. C.
Lamberts
,
J. SMPTE
71
,
635
(
1962
).
38.
M. D.
Chinn
and
S. C.
Fain
,
J. Vac. Sci. Technol.
14
,
314
(
1977
).
39.
P. C.
Stair
,
Rev. Sci. Instrum.
51
,
132
(
1980
).
40.
M.
Lampton
and
F.
Paresce
,
Rev. Sci. Instrum.
45
,
1098
(
1974
).
41.
H. O.
Anger
,
Instrum. Soc. Am. Trans.
5
,
311
(
1966
).
42.
C.
Martin
,
P.
Jelinsky
,
M.
Lampton
,
R. F.
Malina
, and
H. O.
Anger
,
Rev. Sci. Instrum.
52
,
1068
(
1981
).
43.
K. D.
Gronwald
and
M.
Henzler
,
Surf. Sci.
117
,
180
(
1982
).
44.
P. A. Bennett, Ph.D. dissertation, University of Wisconsin‐Madison, 1980 (unpublished);
P. A.
Bennett
and
M. B.
Webb
,
Surf. Sci.
104
,
74
(
1981
).
45.
Tran C.
Ngoc
,
M. G.
Lagally
, and
M. B.
Webb
,
Surf. Sci.
35
,
117
(
1973
).
46.
W.
Heiland
,
Appl. Surf. Sci.
13
,
282
(
1982
). This review contains a list of additional reviews.
W. Heiland and E. Taglauer, in Methods of Experimental Physics: Surfaces edited by R. L. Park and M. G. Lagally (in press).
47.
S. H.
Overbury
,
W.
Heiland
,
D. M.
Zehner
,
S.
Datz
, and
R. S.
Thoe
,
Surf. Sci.
109
,
239
(
1981
).
48.
L. C.
Feldman
,
Surf. Sci.
13
,
211
(
1982
).
49.
N.
Osakabe
,
Y.
Tanashiro
,
K.
Yagi
, and
G.
Honjo
,
Surf. Sci.
97
,
393
(
1980
);
N.
Osakabe
,
Y.
Tanashiro
,
K.
Yagi
, and
G.
Honjo
,
102
,
424
(
1981
); ,
Surf. Sci.
N.
Osakabe
,
K.
Yagi
, and
G.
Honjo
,
Jpn. J. Appl. Phys.
19
,
L309
(
1980
);
P. S.
Turner
and
J. M.
Cowley
,
Ultramicroscopy
6
,
125
(
1981
);
J. M.
Cowley
,
J. L.
Albain
,
G. G.
Hembree
,
P. E.
Hojlund‐Nielsen
,
F. A.
Koch
,
J. D.
Landry
, and
H.
Schumann
,
Rev. Sci. Instrum.
46
,
826
(
1975
).
For additional references and a brief discussion, see J. A. Venables, in Chemistry and Physics of Solid Surfaces, Vol. IV, edited by R. Vanselow and R. Howe, Springer Series in Chemical Physics iSpringer, Heidelberg, (1982), Vol. 20.
See also papers in
J. M.
Cowley
,
J. L.
Albain
,
G. G.
Hembree
,
P. E.
Hojlund‐Nielsen
,
F. A.
Koch
,
J. D.
Landry
, and
H.
Schumann
,
Ultramicroscopy
8
(
1983
).
50.
S.
Ino
,
Jpn. J. Appl. Phys.
26
,
891
(
1977
).
51.
Osakabee et al., Ref. 49.
52.
K.
Matysik
,
Surf. Sci.
46
,
457
(
1974
);
K.
Matysik
,
J. Appl. Phys.
47
,
3826
(
1976
).
53.
J. M.
Van Hove
,
P.
Pukite
,
P. I.
Cohen
, and
C. S.
Lent
,
J. Vac. Sci. Technol. A
1
,
609
(
1983
).
54.
J. F.
Menadue
,
Acta Cryst. A
28
,
1
(
1972
).
55.
J. M.
Van Hove
,
C. S.
Lent
,
P. R.
Pukite
, and
P. I.
Cohen
,
J. Vac. Sci. Technol. B
1
,
741
(
1983
).
56.
W. C.
Marra
,
P. E.
Eisenberger
, and
A. Y.
Cho
,
J. Appl. Phys.
50
,
6927
(
1979
);
W. C.
Marra
,
P. H.
Fuoss
, and
P. E.
Eisenberger
,
Phys. Rev. Lett.
49
,
1169
(
1982
);
I. K.
Robinson
,
Phys. Rev. Lett.
50
,
1145
(
1983
).
57.
A. Bok, in Modern Diffraction and Imaging Techniques in Material Science, edited by S. Amelinckx, R. Gevers, G. Remaut, and J. Van Landuyt (North‐Holland, Amsterdam, 1970).
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