A control and measurement system is described that provides direct digital output of the electrical resistance of a metal sample with an uncertainty of ⩽5×10−9 Ω at 1.7 K with a linearity of ±0.04%. In addition, the system allows in situ isochronal and isothermal annealing experiments to be performed with ΔT⩽0.1°C and Δt⩽3 s between any two temperatures. With the exception of two commerical instruments, all devices were made with readily available components.
Topics
Electrical resistivity
REFERENCES
1.
A. S. Berger, S. T. Ockers, M. K. Chason, and R. W. Siegel, Proceedings of the International Conference on the Properties of Atomic Defects in Metals, Argonne, III. Oct. 18–22, 1976, to be published in J. Nucl. Mater.
2.
D. Soderquist and G. Erdi, Precision Monolithics Inc., Application Notes, AN‐13, 1975, p. 10.
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© 1978 American Institute of Physics.
1978
American Institute of Physics
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