A new high‐pressure diamond anvil device is described which allows for x‐ray diffraction intensity measurements on single crystals up to hydrostatic pressures of about 100 kilobar. The present device fits into commercial x‐ray diffractometers such as precession cameras and four‐circle diffractometers. The pressure is determined by measuring the ruby R1‐line shift with a Fabry–Pérot interferometer which is coupled to a microscope system. First measurements on Se carried out on a precession camera indicate that atomic position parameters and pressures can be determined with standard deviations of ±0.002 and ±0.7 kilobar.
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© 1977 American Institute of Physics.
1977
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