An apparatus is described which allows the preparation of transmission electron microscopy specimens at specified depths of the order of 1 μ below the initial surface of the specimen. The instrument is designed for electropolishing of the surface with in situ measurements by optical interference of the depth of material removed. The depth of the electropolish may be determined to an accuracy of approximately ±500 Å, and high‐quality specimens may be easily prepared.
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© 1975 American Institute of Physics.
1975
American Institute of Physics
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