An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation Technique

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Research Article| November 11 2003

S. N. Jasperson;

S. N. Jasperson

Palmer Physical Laboratory, Princeton University, Princeton, New Jersey 08540

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S. E. Schnatterly

Palmer Physical Laboratory, Princeton University, Princeton, New Jersey 08540

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Rev. Sci. Instrum. 41, 152 (1970)

https://doi.org/10.1063/1.1684264

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