A simple modification to a Philips 100B electron microscope makes possible the production of dark field images without any loss of resolution. The method utilizes electrical tilting of the primary beam and permits rapid alternation between bright and dark field viewing.

1.
D. Kay, Techniques for Electron Microscopy (Blackwell Scientific Publications, Oxford, England, 1961) p. 24.
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© 1965 The American Institute of Physics.
1965
The American Institute of Physics
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