A microcomparator illumination system is described which permits Rayleigh diffusiometer diagrams to be measured with increased precision. Measurement is based on the use of diffraction patterns generated by the Rayleigh diagram when this diagram is illuminated with point source, divergent, monochromatic light. Under favorable conditions a two‐ to fivefold increase in precision of measurement may be obtained with this illumination system.

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© 1958 The American Institute of Physics.
1958
The American Institute of Physics
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