Diffracted‐Beam Monochromatization Techniques in X‐Ray Diffractometry Available to Purchase

Four techniques using curved‐crystal focusing monochromators are described: combinations of a reflection specimen and reflection monochromator, a reflection specimen and transmission monochromator, a transmission specimen and reflection monochromator, and a transmission specimen and transmission monochromator. The first technique allows recording of diffraction patterns due to Kα₁ radiation only, and elimination of Compton‐scattered radiation (except at low angles). The second technique provides a back‐reflection diffractometer for measurements at Bragg angles up to 90°. The third technique can be applied to weakly absorbing specimens when a strictly monochromatic diffraction pattern is required. Various aspects of the focusing geometry are analyzed.