A new type of ion gun is described which greatly improves the resolution of a nonmagnetic time‐of‐flight mass spectrometer. The focusing action of this gun is discussed and analyzed mathematically. The validity of the analysis and the practicability of the gun are demonstrated by the spectra obtained. The spectrometer is capable of measuring the relative abundance of adjacent masses well beyond 100 amu.

1.
V. H.
Dibeler
,
Anal. Chem.
26
,
58
(
1954
).
2.
A. E.
Cameron
and
D. F.
Eggers
, Jr.
,
Rev. Sci. Instr.
19
,
605
(
1948
).
3.
M. M.
Wolff
and
W. E.
Stephens
,
Rev. Sci. Instr.
24
,
616
(
1953
).
4.
H. S.
Katzenstein
and
S. S.
Friedland
,
Rev. Sci. Instr.
26
,
324
(
1955
).
5.
Hays
,
Richards
, and
Goudsmit
,
Phys. Rev.
84
,
824
(
1951
).
6.
W. C. Wiley, U.S. Patent 2 685 035.
7.
L. G.
Smith
,
Rev. Sci. Instr.
22
,
166
(
1951
).
This content is only available via PDF.
You do not currently have access to this content.