Methods are described for the measurement of the lateral chromatic aberration and distortion of microscope objectives and eyepieces. Measurements have been made on 20 apochromatic microscope objectives of 4 different makes, and on 10 compensating eyepieces of 2 different makes. The results show that the compensating eyepieces in general do not entirely compensate the chromatic aberration of the objectives and that the complete microscope system is usually undercorrected. The bearing of this on the performance of the system in photomicrographic work by a three color process and in the direct visual observation of objects is considered in detail.

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Publication approved by the Director of the Bureau of Standards of the U.S. Department of Commerce.
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The dotted line is perpendicular to the axis of the parabola. It is oblique with respect to the coordinate axes because of a slight lack of parallelism of object and photographic plate. The effect of such tilts was considered when measuring the distortions.
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Applied Optics and Optical Design, vol. 1, p. 510. Published by Oxford University Press, London.
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© 1931 American Institute of Physics.
1931
American Institute of Physics
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