A method is described whereby space potentials in the interelectrode spaces of an electronic device may be mapped under operating conditions provided that approximately straight lines may be drawn through the equipotential surfaces to be determined. Results for a diode under temperature‐ and space‐charge‐limited conditions are given and compared with curves plotted from an analytical treatment of the problem.

1.
W. G. Dow, Fundamentals of Engineering Electronics (first edition, J. Wiley & Sons (1937)), p. 109.
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© 1940 American Institute of Physics.
1940
American Institute of Physics
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