Secondary electron emission from copper is probed utilizing Monte Carlo simulations that take account of elastic scattering based on the Mott theory and inelastic collisions based on energy-dependent energy loss functions. The loss function and stopping power were obtained through first-principles density functional theory. Angular assignment of electrons following elastic scattering or the creation of secondaries is shown to affect the energy-dependent secondary electron yield (SEY). A good match of the simulation results (with a peak SEY of ∼180% at around 300 eV and less than 10% deviation over the 0 to 1000 eV energy range) to available experimental data is shown based on an energy and momentum conservation scheme. Also, the distribution of delay times for the generation of secondaries, the SEY behavior at different incident angles, the energy distribution of emergent secondaries, and their creation profiles as a function of depth are computed to provide a more complete picture of the governing mechanisms and predicted responses.
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September 2020
Research Article|
September 16 2020
Coupled analysis to probe the effect of angular assignments on the secondary electron yield (SEY) from copper electrodes Available to Purchase
X. Qiu
;
X. Qiu
1
Department of Electrical and Computer Engineering, Texas Tech University
, Lubbock, Texas 79409, USA
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L. Diaz
;
L. Diaz
2
Department of Physics and Astronomy, Texas Tech University
, Lubbock, Texas 79409, USA
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M. Sanati
;
M. Sanati
2
Department of Physics and Astronomy, Texas Tech University
, Lubbock, Texas 79409, USA
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J. Mankowski
;
J. Mankowski
1
Department of Electrical and Computer Engineering, Texas Tech University
, Lubbock, Texas 79409, USA
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J. Dickens;
J. Dickens
1
Department of Electrical and Computer Engineering, Texas Tech University
, Lubbock, Texas 79409, USA
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A. Neuber
;
A. Neuber
1
Department of Electrical and Computer Engineering, Texas Tech University
, Lubbock, Texas 79409, USA
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R. P. Joshi
R. P. Joshi
a)
1
Department of Electrical and Computer Engineering, Texas Tech University
, Lubbock, Texas 79409, USA
a)Author to whom correspondence should be addressed: [email protected]
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,
,
,
,
,
,
L. Diaz
2
M. Sanati
2
J. Mankowski
1
J. Dickens
1
A. Neuber
1
R. P. Joshi
1,a)
1
Department of Electrical and Computer Engineering, Texas Tech University
, Lubbock, Texas 79409, USA
2
Department of Physics and Astronomy, Texas Tech University
, Lubbock, Texas 79409, USA
a)Author to whom correspondence should be addressed: [email protected]
Phys. Plasmas 27, 093511 (2020)
Article history
Received:
April 09 2020
Accepted:
August 17 2020
Citation
X. Qiu, L. Diaz, M. Sanati, J. Mankowski, J. Dickens, A. Neuber, R. P. Joshi; Coupled analysis to probe the effect of angular assignments on the secondary electron yield (SEY) from copper electrodes. Phys. Plasmas 1 September 2020; 27 (9): 093511. https://doi.org/10.1063/5.0010389
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