X-ray free electron laser (XFEL) interaction with solids has been simulated to resolve simultaneously variable XFEL photon energy and x-ray spectral distribution of the target emission (2D-maps). It is discovered that the highly transient charge state distribution exhibits a characteristic target response due to the action of the sharply rising radiation field. Finally, we identify advantageous features for studies of dense plasma effects of two K-shell vacancy hollow ion x-ray emission excited via resonance excitation. These features and characteristics permit the global study of dense plasma effects via the simulation of the time-integrated joint distribution of pumped and fluorescence energies. It is shown that the simulation of these specific 2D-maps offers a global vision of the complex interplay between different processes or phenomena such as photoionization, resonance excitation, or ionization potential depression.
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Simulation of XFEL induced fluorescence spectra of hollow ions and studies of dense plasma effects
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June 2020
Research Article|
June 24 2020
Simulation of XFEL induced fluorescence spectra of hollow ions and studies of dense plasma effects
B. Deschaud;
B. Deschaud
1
Univ. Bordeaux, CEA, CNRS, CELIA (Centre Lasers Intenses et Applications)
, UMR 5107, F-33400 Talence, France
2
Sorbonne University, Faculty of Science and Engineering, UMR 7605, LULI
, case 128, 4 place Jussieu, F-75252 Paris Cedex 05, France
3
LULI, Ecole Polytechnique, CEA, CNRS, Laboratoire pour l'Utilisation des Lasers Intenses, Physique Atomique dans les Plasmas Denses
, F-91128 Palaiseau, France
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O. Peyrusse;
O. Peyrusse
4
Aix Marseille Université, CNRS, PIIM, UMR 7345
, F-13397 Marseille, France
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F. B. Rosmej
F. B. Rosmej
a)
2
Sorbonne University, Faculty of Science and Engineering, UMR 7605, LULI
, case 128, 4 place Jussieu, F-75252 Paris Cedex 05, France
3
LULI, Ecole Polytechnique, CEA, CNRS, Laboratoire pour l'Utilisation des Lasers Intenses, Physique Atomique dans les Plasmas Denses
, F-91128 Palaiseau, France
5
Moscow Institute of Physics and Technology—MIPT
, Institutskii per. 9, Dolgoprudnyi 141700, Russia
6
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
, Kashirskoe sh. 31, 115409 Moscow, Russia
a)Author to whom correspondence should be addressed: [email protected]
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a)Author to whom correspondence should be addressed: [email protected]
Phys. Plasmas 27, 063303 (2020)
Article history
Received:
April 20 2020
Accepted:
May 25 2020
Citation
B. Deschaud, O. Peyrusse, F. B. Rosmej; Simulation of XFEL induced fluorescence spectra of hollow ions and studies of dense plasma effects. Phys. Plasmas 1 June 2020; 27 (6): 063303. https://doi.org/10.1063/5.0011193
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