We study here the curious particle dynamics resulting from electro-osmotic flow around a microchannel junction corner whose dielectric walls are weakly polarizable. The hydrodynamic velocity field is obtained via superposition of a linear irrotational term associated with the equilibrium zeta potentials of both the microchannel and particle surfaces and the nonlinear induced-charge electro-osmotic flow which originates from the interaction of the externally applied electric field on the charge cloud it induces at the solid-liquid interface. The particle dynamics are analyzed by considering dielectrophoretic forces via the addition of a mobility term to the flow field in the limit of Stokes drag law. The former, non-divergence free term is responsible for migration of particles towards the sharp microchannel junction corner, where they can potentially accumulate. Experimental observations of particle trapping for various applied electric fields and microparticle size are rationalized in terms of the growing relative importance of the dielectrophoretic force and induced-charge contributions to the global velocity field with increasing intensity of the externally applied electric field.
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August 2014
Research Article|
August 06 2014
Particle dynamics and rapid trapping in electro-osmotic flow around a sharp microchannel corner
Matan Zehavi;
Matan Zehavi
Faculty of Mechanical Engineering, Micro and Nanofluidics Laboratory,
Technion–Israel Institute of Technology
, Technion City 32000, Israel
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Gilad Yossifon
Gilad Yossifon
a)
Faculty of Mechanical Engineering, Micro and Nanofluidics Laboratory,
Technion–Israel Institute of Technology
, Technion City 32000, Israel
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a)
Author to whom correspondence should be addressed. Electronic mail: [email protected]
Physics of Fluids 26, 082002 (2014)
Article history
Received:
July 15 2013
Accepted:
June 19 2014
Citation
Matan Zehavi, Gilad Yossifon; Particle dynamics and rapid trapping in electro-osmotic flow around a sharp microchannel corner. Physics of Fluids 1 August 2014; 26 (8): 082002. https://doi.org/10.1063/1.4891674
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