The temperature dependence of the resistance of chromium films obtained by the thermal deposition on a substrate at room temperature was studied. It is shown that the most probable crystallite size in as-deposited films is 9 nm and increases by about 15% after the first annealing. According to the results of resistive studies, the structure formed after the first heating is stable and changes slightly during thermal cycling. It has been found that up to a temperature of approximately 200 °C, the temperature coefficient of resistance of the samples is negative and amounts to approximately −2 · 10−4 K−1. With a further increase in temperature, the temperature coefficient of resistance becomes positive, but remains significantly lower than the value corresponding to chromium in the bulk state. The observed effects are explained by the nanocrystalline structure of the samples.
REFERENCES
1.
B.
Li
, T.
Godfrey
, D.
Cox
, T.
Li
, J.
Gallop
, S.
Galer
, and L.
Hao
, “Investigation of properties of nanobridge josephson junctions and superconducting tracks fabricated by FIB
,” J. Phys.: Conf. Ser.
964
, 012004
(2018
). 2.
S. V.
Dukarov
, S. I.
Petrushenko
, and V. N.
Sukhov
, “Supercooling during crystallization of a fusible component in Cu/(Bi-Sn) multilayer films
,” Mater. Res. Expr.
6
(1
), 016403
(2018
). 3.
S. V.
Dukarov
, S. I.
Petrushenko
, and V. N.
Sukhov
, “Supercooling during crystallisation and thermal dispergation of thin In-Pb films located between molybdenum layers
,” Thin Solid Films
734
, 138867
(2021
). 4.
S.
Bogatyrenko
, A.
Kryshtal
, A.
Minenkov
, and A.
Kruk
, “Miscibility gap narrowing on the phase diagram of AuNi nanoparticles
,” Scr. Mater.
170
, 57
(2019
). 5.
S. I.
Bogatyrenko
, “Formation of the solid solutions in the Au-Ni film system: In situ TEM study
,” Techn. Phys.
59
, 1374
(2014
). 6.
S. I.
Petrushenko
, S. V.
Dukarov
, and V. N.
Sukhov
, “Growth of through pores and thermal dispersion of continuous polycrystalline films of copper
,” Metallofiz. Noveishie Tekhnol.
38
, 1351
(2016
). 7.
S. V.
Dukarov
, S. I.
Petrushenko
, and V. N.
Sukhov
, “Inner size effect of temperature coefficient of resistance in Cu, Ag, V and Mo films
,” Vacuum
202
, 111148
(2022
). 8.
P. H.
Schmidt
, R. N.
Castellano
, H.
Barz
, B. T.
Matthias
, J. G.
Huber
, and W. A.
Fertig
, “Superconducting ion beam sputtered chromium metal thin films
,” Phys. Lett. A
41
, 367
(1972
). 9.
M.
Ohashi
, K.
Ohashi
, M.
Sawabu
, M.
Miyagawa
, T.
Kubota
, and K.
Takanashi
, “Unconventional drop in the electrical resistance of chromium metal thin films at low temperature
,” Phys. Lett. A
380
(38
), 3133
(2016
). 10.
M.
Ohashi
, M.
Sawabu
, K.
Ohashi
, M.
Miyagawa
, T.
Kubota
, and K.
Takanashi
, “The electrical resistance of gold-capped chromium thin films
,” J. Phys.: Conf. Ser.
969
, 012029
(2018
). 11.
P. J.
Edwards
, M.
Khojasteh
, A.
Halder
, and V. V.
Kresin
, “High-temperature superconductivity in size-selected metal nanoclusters: Gas-phase spectroscopy and prototype devices for deposition studies
,” J. Supercond. Novel Magn.
35
, 997
–1004
(2022
). 12.
M.
ElMassalami
and M. S.
Neto
, “Superconductivity, Fermi-liquid transport, and universal kinematic scaling relation for metallic thin films with stabilized defect complexes
,” Phys. Rev. B
104
, 014520
(2021
). 13.
I. S.
Burmistrov
, I. V.
Gornyi
, and A. D.
Mirlin
, “Multifractally-enhanced superconductivity in thin films
,” Ann. Phys.
435
, 168499
(2021
). 14.
M.
Stosiek
, F.
Evers
, and I. S.
Burmistrov
, “Multifractal correlations of the local density of states in dirty superconducting films
,” Phys. Rev. Res.
3
, L042016
(2021
). 15.
D. P.
Lozano
, S.
Couet
, C.
Petermann
, G.
Hamoir
, J. K.
Jochum
, T.
Picot
, and M. J.
Van Bael
, “Experimental observation of electron-phonon coupling enhancement in Sn nanowires caused by phonon confinement effects
,” Phys. Rev. B
99
, 064512
(2019
). 16.
D.
Sun
, V. S.
Minkov
, S.
Mozaffari
, Y.
Sun
, Y.
Ma
, S.
Chariton
, and F. F.
Balakirev
, “High-temperature superconductivity on the verge of a structural instability in lanthanum superhydride
,” Nature Commun.
12
, 1
(2021
). 17.
G. Y.
Khadzhai
, S. N.
Kamchatnaya
, M. V.
Korobkov
, Y. V.
Necheporenko
, R. V.
Vovk
, and O. V.
Dobrovolskiy
, “High- pressure effects on basal-plane conductivity of YPrBCO single crystals, current appl
,” Curr. Appl. Phys.
39
, 311
(2022
). 18.
P. T.
Yang
, Q. X.
Dong
, P. F.
Shan
, Z. Y.
Liu
, J. P.
Sun
, Z. L.
Dun
, and J. G.
Cheng
, “Emergence of superconductivity on the border of antiferromagnetic order in RbMn6Bi5 under high pressure: A new family of Mn-based superconductors
,” Chin. Phys. Lett.
39
, 067401
(2022
). 19.
Z. Y.
Liu
, Q. X.
Dong
, P. T.
Yang
, P. F.
Shan
, B. S.
Wang
, J. P.
Sun
, and J. G.
Cheng
, “Pressure-induced superconductivity up to 9 K in the quasi-one-dimensional KMn6Bi5
,” Phys. Rev. Lett.
128
, 187001
(2022
). 20.
S. I.
Petrushenko
, S. V.
Dukarov
, and V. N.
Sukhov
, “Supercooling during crystallization of fusible metal particles in multilayer ‘carbon-metal-carbon' films
,” Problems of Atomic Science and Technology
104
, 118
(2016
), http://dspace.univer.kharkov.ua/handle/123456789/12061.21.
M.
Ohashi
, M.
Sawabu
, H.
Nakanishi
, K.
Ohashi
, and K.
Maeta
, “Electrical and structural properties of epitaxially deposited chromium thin films
,” Physica B: Condens. Matter
536
, 790
(2018
). 22.
M.
Sawabu
, M.
Ohashi
, K.
Ohashi
, M.
Miyagawa
, T.
Kubota
, and K.
Takanashi
, “The electrical resistivity of epitaxially deposited chromium films
,” J. Phys.: Conf. Ser.
871
, 012002
(2017
). 23.
A. A.
Minenkov
, S. I.
Bogatyrenko
, R. V.
Sukhov
, and A. P.
Kryshtal
, “Size dependence of the activation energy of diffusion in multilayer Cu-Ni films
,” Phys. Solid State
56
, 823
(2014
). 24.
Y. V.
Sharvin
, “A possible method for studying Fermi surfaces
,” Sov. Phys. JETP
21
, 655
(1965
).25.
A.
Bietsch
and B.
Michel
, “Size and grain-boundary effects of a gold nanowire measured by conducting atomic force microscopy
,” Appl. Phys. Lett.
80
, 3346
(2002
). 26.
G.
Reiss
, J.
Vancea
, and H.
Hoffmann
, “Grain-boundary resistance in polycrystalline metals
,” Phys. Rev. Lett.
56
, 2100
(1986
). © 2023 Author(s). Published under an exclusive license by AIP Publishing.
2023
Author(s)
You do not currently have access to this content.
