Precision Determination of Lattice Constants

In Part I the theoretical and experimental conditions which must be satisfied in order to determine lattice constants with a precision of a few parts per hundred thousand are discussed with particular application to the symmetrical focusing type of camera. Cohen's method of calculation of lattice constants for the elimination of ``drift'' and experimental errors is applied. Methods are developed for the evaluation of standard errors and fiduciary limits of results from a single film and from a set of films. The usefulness of x‐ray targets made of alloys rather than pure elements for the purpose of securing a larger number and better distribution of lines is indicated. The influence of the number and Miller indices of diffraction lines on the values of lattice constants in noncubic systems is shown. The importance of the methods of sample preparation for precision work is emphasized. In Part II, precision measurements on Al, Ni, Ag, Au, Si, Fe, Mo, W, Mg, Zn, Cd, Sb, Bi and Sn are reported for materials of a high degree of purity. The fiduciary limits of these lattice constants vary between 2 and 7 parts per hundred thousand and are so chosen that the probability of the correct value lying between the stated limits is 19 out of 20.