Rubrene is one of the leading organic semiconductors in scientific and industrial research, showing good conductivities and utilities in devices such as organic field-effect transistors. In these applications, the rubrene crystals often contact ionic liquids and other materials. Consequently, their surface properties and interfacial interactions influence the device’s performance. Although rubrene has been extensively studied with multiple structure characterization techniques, a complete description of the structure of rubrene single-crystal surfaces at the molecular level remains elusive. This study elucidates the molecular orientation and arrangement on the surface of rubrene single crystals with sum frequency generation (SFG) spectroscopy and reflection high-energy electron diffraction, respectively. The results confirm the near-surface unit cells with in-plane lattice parameters of a = 7.24 Å and b = 14.3 Å and an out-of-plane constant of c = 26.9 Å. Furthermore, the SFG analysis yields the tilt and rotation angles of θ = 15° and φ = 43° with respect to the crystalline c and a axes, respectively, and an in-plane twist of ψ = 3° for the surface phenyl rings.
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7 January 2025
Research Article|
January 02 2025
Surface structure characterization of rubrene(001) single crystal with sum frequency generation spectroscopy and reflection high-energy electron diffraction Available to Purchase
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Festschrift in honor of Yuen-Ron Shen
S. A. Shah
;
S. A. Shah
(Conceptualization, Data curation, Formal analysis, Investigation, Supervision, Writing – original draft, Writing – review & editing)
1
Department of Chemistry, University of Houston
, Houston, Texas 77204, USA
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H. Vali
;
H. Vali
(Conceptualization, Data curation, Formal analysis, Investigation, Supervision, Writing – original draft, Writing – review & editing)
1
Department of Chemistry, University of Houston
, Houston, Texas 77204, USA
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Daijiro Okaue;
Daijiro Okaue
(Data curation, Formal analysis, Investigation, Resources, Writing – original draft, Writing – review & editing)
2
Department of Materials Engineering Science, Graduate School of Engineering Science, Osaka University
, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
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Ken-ichi Fukui
;
Ken-ichi Fukui
(Conceptualization, Data curation, Investigation, Methodology, Project administration, Resources, Supervision)
2
Department of Materials Engineering Science, Graduate School of Engineering Science, Osaka University
, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
3
Department of Photomolecular Science, Institute of Molecular Science
, Myodaiji, Okazaki, Aichi 444-8585, Japan
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D.-S. Yang
;
D.-S. Yang
(Conceptualization, Formal analysis, Investigation, Methodology, Project administration, Supervision, Writing – review & editing)
1
Department of Chemistry, University of Houston
, Houston, Texas 77204, USA
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S. Baldelli
S. Baldelli
a)
(Conceptualization, Data curation, Formal analysis, Investigation, Supervision, Writing – original draft, Writing – review & editing)
1
Department of Chemistry, University of Houston
, Houston, Texas 77204, USA
a)Author to whom correspondence should be addressed: [email protected]
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S. A. Shah
1
H. Vali
1
Daijiro Okaue
2
Ken-ichi Fukui
2,3
D.-S. Yang
1
S. Baldelli
1,a)
1
Department of Chemistry, University of Houston
, Houston, Texas 77204, USA
2
Department of Materials Engineering Science, Graduate School of Engineering Science, Osaka University
, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
3
Department of Photomolecular Science, Institute of Molecular Science
, Myodaiji, Okazaki, Aichi 444-8585, Japan
a)Author to whom correspondence should be addressed: [email protected]
J. Chem. Phys. 162, 014701 (2025)
Article history
Received:
August 31 2024
Accepted:
December 16 2024
Citation
S. A. Shah, H. Vali, Daijiro Okaue, Ken-ichi Fukui, D.-S. Yang, S. Baldelli; Surface structure characterization of rubrene(001) single crystal with sum frequency generation spectroscopy and reflection high-energy electron diffraction. J. Chem. Phys. 7 January 2025; 162 (1): 014701. https://doi.org/10.1063/5.0236513
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