Near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy is an important tool for probing the structure of conjugated polymer films used in organic electronic devices. High-performance conjugated polymers are often donor-acceptor co-polymers which feature a repeat unit with multiple functional groups. To facilitate better application of NEXAFS spectroscopy to the study of such materials, improved understanding of the observed NEXAFS spectral features is required. In order to examine how the NEXAFS spectrum of a donor-acceptor co-polymer relates to the properties of the sub-units, a series of naphthalene diimide-thiophene-based co-polymers have been studied where the nature and length of the donor co-monomer has been systematically varied. The spectra of these materials are compared with that of a thiophene homopolymer and naphthalene diimide monomer enabling peak assignment and the influence of inter-unit electronic coupling to be assessed. We find that while it is possible to attribute peaks within the π* manifold as arising primarily due to the naphthalene diimide or thiophene sub-units, very similar dichroism of these peaks is observed indicating that it may not be possible to separately probe the molecular orientation of the separate sub-units with carbon K-edge NEXAFS spectroscopy.
Skip Nav Destination
Article navigation
28 April 2014
Research Article|
April 30 2014
Near-edge X-ray absorption fine-structure spectroscopy of naphthalene diimide-thiophene co-polymers
Eliot Gann;
Eliot Gann
1Department of Materials Engineering,
Monash University
, Wellington Road, Clayton, Victoria 3800, Australia
Search for other works by this author on:
Christopher R. McNeill;
Christopher R. McNeill
a)
1Department of Materials Engineering,
Monash University
, Wellington Road, Clayton, Victoria 3800, Australia
Search for other works by this author on:
Monika Szumilo;
Monika Szumilo
2Cavendish Laboratory,
University of Cambridge
, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
Search for other works by this author on:
Henning Sirringhaus;
Henning Sirringhaus
2Cavendish Laboratory,
University of Cambridge
, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
Search for other works by this author on:
Michael Sommer;
Michael Sommer
3Institute of Macromolecular Chemistry,
University of Freiburg
, Stefan-Meier-Str. 31, 79104 Freiburg, Germany
Search for other works by this author on:
Subashani Maniam;
Subashani Maniam
4School of Chemistry,
Monash University
, Wellington Road, Clayton, Victoria 3800, Australia
Search for other works by this author on:
Steven J. Langford;
Steven J. Langford
4School of Chemistry,
Monash University
, Wellington Road, Clayton, Victoria 3800, Australia
Search for other works by this author on:
Lars Thomsen
Lars Thomsen
5
Australian Synchrotron
, 800 Blackburn Road, Clayton, Victoria 3168, Australia
Search for other works by this author on:
a)
Author to whom correspondence should be addressed. Electronic mail: christopher.mcneill@monash.edu. Tel.: +61 3 9902 4896. Fax: +61 3 9905 4940.
J. Chem. Phys. 140, 164710 (2014)
Article history
Received:
February 24 2014
Accepted:
April 04 2014
Citation
Eliot Gann, Christopher R. McNeill, Monika Szumilo, Henning Sirringhaus, Michael Sommer, Subashani Maniam, Steven J. Langford, Lars Thomsen; Near-edge X-ray absorption fine-structure spectroscopy of naphthalene diimide-thiophene co-polymers. J. Chem. Phys. 28 April 2014; 140 (16): 164710. https://doi.org/10.1063/1.4871463
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Pay-Per-View Access
$40.00
Citing articles via
DeePMD-kit v2: A software package for deep potential models
Jinzhe Zeng, Duo Zhang, et al.