The interaction of water with freshly cleaved surfaces has been studied using scanning force microscopy operated in different modes at room temperature and under controlled humidity. The Kelvin probe microscopy (KPM) mode has been used to study the evolution of the surface potential differences (SPDs). In the 20%–50% relative humidity (RH) range, adsorbed water forms two-dimensional solidlike bilayers (islands). The SPD between water islands and the bare substrate surface exhibits a sign crossover from negative at low RHs to positive at higher RHs, evidencing a cooperative and irreversible flipping of the preferential orientation of water dipoles, from pointing toward the surface evolving into the opposite direction. The KPM results suggest that the classical hexagonal bilayer configuration is not the most favorable structure.
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7 November 2008
Research Article|
November 05 2008
Thin water films grown at ambient conditions on studied by scanning polarization force microscopy Available to Purchase
A. Verdaguer;
A. Verdaguer
a)
Centre d’ Investigació en Nanociència i Nanotecnologia, CIN2 (CSIC-ICN),
Esfera UAB
, Campus de la UAB, Edifici CM-7, 08193-Bellaterra, Catalunya, Spain
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M. Cardellach;
M. Cardellach
Centre d’ Investigació en Nanociència i Nanotecnologia, CIN2 (CSIC-ICN),
Esfera UAB
, Campus de la UAB, Edifici CM-7, 08193-Bellaterra, Catalunya, Spain
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J. Fraxedas
J. Fraxedas
Centre d’ Investigació en Nanociència i Nanotecnologia, CIN2 (CSIC-ICN),
Esfera UAB
, Campus de la UAB, Edifici CM-7, 08193-Bellaterra, Catalunya, Spain
Search for other works by this author on:
A. Verdaguer
a)
Centre d’ Investigació en Nanociència i Nanotecnologia, CIN2 (CSIC-ICN),
Esfera UAB
, Campus de la UAB, Edifici CM-7, 08193-Bellaterra, Catalunya, Spain
M. Cardellach
Centre d’ Investigació en Nanociència i Nanotecnologia, CIN2 (CSIC-ICN),
Esfera UAB
, Campus de la UAB, Edifici CM-7, 08193-Bellaterra, Catalunya, Spain
J. Fraxedas
Centre d’ Investigació en Nanociència i Nanotecnologia, CIN2 (CSIC-ICN),
Esfera UAB
, Campus de la UAB, Edifici CM-7, 08193-Bellaterra, Catalunya, Spain
a)
Author to whom correspondence should be addressed. Electronic mail: [email protected].
J. Chem. Phys. 129, 174705 (2008)
Article history
Received:
July 17 2008
Accepted:
October 03 2008
Citation
A. Verdaguer, M. Cardellach, J. Fraxedas; Thin water films grown at ambient conditions on studied by scanning polarization force microscopy. J. Chem. Phys. 7 November 2008; 129 (17): 174705. https://doi.org/10.1063/1.3006098
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