We present reflectance anisotropy spectroscopy (RAS) data for aligned films of luminescent conjugated polymers. Ultrathin films (5–10 nm) spin-cast onto friction-deposited poly-tetrafluoroethylene (PTFE) show birefringence and dichroism indicating alignment of the polymer chains with the PTFE axis. The observed dichroism agrees very well with recently published polarized ultraviolet absorption spectra. In particular, the spectrum of a derivative of poly (para-phenylene) shows the onset of a perpendicular-polarized absorption feature at 5 eV, consistent with recent theoretical predictions. Thick films, prepared by gel-processing in polyethylene (PE), also show characteristic optical anisotropy, and the RAS results are interpreted in terms of the ellipsometric functions, Ψ and Δ.
Skip Nav Destination
Article navigation
8 July 2000
Research Article|
July 08 2000
Reflectance anisotropy spectroscopy of oriented films of semiconducting polymers
E. K. Miller;
E. K. Miller
Department of Physics and Institute for Polymers and Organic Solids, University of California, Santa Barbara, California 93106
Institut für Physikalische Chemie, Johannes Kepler University, Altenbergerstr. 69, 4040 Linz, Austria
Search for other works by this author on:
K. Hingerl;
K. Hingerl
Institut für Halbleiterphysik und Festkörperphysik, Johannes Kepler University, Altenbergerstr. 69, 4040 Linz, Austria
Search for other works by this author on:
C. J. Brabec;
C. J. Brabec
Institut für Physikalische Chemie, Johannes Kepler University, Altenbergerstr. 69, 4040 Linz, Austria
Search for other works by this author on:
A. J. Heeger;
A. J. Heeger
Department of Physics and Institute for Polymers and Organic Solids, University of California, Santa Barbara, California 93106
Search for other works by this author on:
N. S. Sariciftci
N. S. Sariciftci
Institut für Physikalische Chemie, Johannes Kepler University, Altenbergerstr. 69, 4040 Linz, Austria
Search for other works by this author on:
J. Chem. Phys. 113, 789–792 (2000)
Article history
Received:
January 18 2000
Accepted:
April 11 2000
Citation
E. K. Miller, K. Hingerl, C. J. Brabec, A. J. Heeger, N. S. Sariciftci; Reflectance anisotropy spectroscopy of oriented films of semiconducting polymers. J. Chem. Phys. 8 July 2000; 113 (2): 789–792. https://doi.org/10.1063/1.481853
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Pay-Per-View Access
$40.00
Citing articles via
DeePMD-kit v2: A software package for deep potential models
Jinzhe Zeng, Duo Zhang, et al.