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Issues
1 March 2006
ISSN 0021-8979
EISSN 1089-7550
In this Issue
LASERS, OPTICS, AND OPTOELECTRONICS
Reliability screening of diode lasers by multispectral infrared imaging
J. Appl. Phys. 99, 053101 (2006)
https://doi.org/10.1063/1.2178390
Spectrophotometric determination of reflective liquid crystal cell parameters
J. Appl. Phys. 99, 053102 (2006)
https://doi.org/10.1063/1.2177376
Dopant partitioning influence on the near-infrared emissions of in oxyfluoride glass ceramics
J. Appl. Phys. 99, 053103 (2006)
https://doi.org/10.1063/1.2177384
Influence of short-term low current dc aging on the electrical and optical properties of InGaN blue light-emitting diodes
Francesca Rossi; Maura Pavesi; Matteo Meneghini; Giancarlo Salviati; Manfredo Manfredi; Gaudenzio Meneghesso; Antonio Castaldini; Anna Cavallini; Lorenzo Rigutti; Uwe Strass; Ulrich Zehnder; Enrico Zanoni
J. Appl. Phys. 99, 053104 (2006)
https://doi.org/10.1063/1.2178856
High-peak-power pulsed operation of (AlGaIn)(AsSb) quantum-well ridge waveguide diode lasers
J. Appl. Phys. 99, 053105 (2006)
https://doi.org/10.1063/1.2179121
PLASMAS AND ELECTRICAL DISCHARGES
STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER
Spectroscopic analysis of defects in chlorine doped polycrystalline
J. Appl. Phys. 99, 053502 (2006)
https://doi.org/10.1063/1.2174117
Giant enhancement of optical nonlinearity in multilayer metallic films
J. Appl. Phys. 99, 053503 (2006)
https://doi.org/10.1063/1.2175477
Monte Carlo simulation of damage and amorphization induced by swift-ion irradiation in
J. Appl. Phys. 99, 053504 (2006)
https://doi.org/10.1063/1.2175464
Structural transition from phase to phase in FePt films caused by ion irradiation
T. Hasegawa; G. Q. Li; W. Pei; H. Saito; S. Ishio; K. Taguchi; K. Yamakawa; N. Honda; K. Ouchi; T. Aoyama; I. Sato
J. Appl. Phys. 99, 053505 (2006)
https://doi.org/10.1063/1.2177382
Theoretical model for the optical gain coefficient of indirect-band-gap semiconductors
J. Appl. Phys. 99, 053506 (2006)
https://doi.org/10.1063/1.2177386
Structural and mechanical properties of TaZrN films: Experimental and ab initio studies
J. Appl. Phys. 99, 053507 (2006)
https://doi.org/10.1063/1.2178394
Influence of GaNAs strain-compensation layers on the optical properties of quantum wells upon annealing
J. Appl. Phys. 99, 053508 (2006)
https://doi.org/10.1063/1.2178399
Ab initio study of the chemical bonding and mechanical properties of
J. Appl. Phys. 99, 053509 (2006)
https://doi.org/10.1063/1.2176145
Optical phonon modes and crystal structure of single crystals
J. Appl. Phys. 99, 053510 (2006)
https://doi.org/10.1063/1.2177380
Short-ranged structural rearrangement and enhancement of mechanical properties of organosilicate glasses induced by ultraviolet radiation
F. Iacopi; Y. Travaly; B. Eyckens; C. Waldfried; T. Abell; E. P. Guyer; D. M. Gage; R. H. Dauskardt; T. Sajavaara; K. Houthoofd; P. Grobet; P. Jacobs; K. Maex
J. Appl. Phys. 99, 053511 (2006)
https://doi.org/10.1063/1.2178393
Applicability range of Stoney’s formula and modified formulas for a film/substrate bilayer
J. Appl. Phys. 99, 053513 (2006)
https://doi.org/10.1063/1.2178400
Tight-binding study of thermal expansions for
J. Appl. Phys. 99, 053514 (2006)
https://doi.org/10.1063/1.2178401
Visible and infrared emissions from -axis oriented AlN:Er films grown by magnetron sputtering
J. Appl. Phys. 99, 053515 (2006)
https://doi.org/10.1063/1.2179142
Correlation between Zn vacancies and photoluminescence emission in ZnO films
J. Appl. Phys. 99, 053516 (2006)
https://doi.org/10.1063/1.2175476
Near infrared light emission quenching in organolanthanide complexes
F. Quochi; R. Orrù; F. Cordella; A. Mura; G. Bongiovanni; F. Artizzu; P. Deplano; M. L. Mercuri; L. Pilia; A. Serpe
J. Appl. Phys. 99, 053520 (2006)
https://doi.org/10.1063/1.2177431
Optical and site-selective spectral studies of -doped zinc oxyfluorotellurite glass
J. Appl. Phys. 99, 053522 (2006)
https://doi.org/10.1063/1.2177448
Cavity nucleation and delamination during adhesive transfer of a thin viscoelastic film
J. Appl. Phys. 99, 053523 (2006)
https://doi.org/10.1063/1.2171770
ELECTRONIC STRUCTURE AND TRANSPORT
Magnetic and electrical properties of amorphous CoFeB films
J. Appl. Phys. 99, 053701 (2006)
https://doi.org/10.1063/1.2174113
Positional disorder enhancement of exciton dissociation at donor∕acceptor interface
J. Appl. Phys. 99, 053702 (2006)
https://doi.org/10.1063/1.2174118
Electronic properties of the organic semiconductor interfaces and
J. Appl. Phys. 99, 053704 (2006)
https://doi.org/10.1063/1.2175468
Effect of nitrogen on the electronic properties of hafnium oxynitrides
J. Appl. Phys. 99, 053705 (2006)
https://doi.org/10.1063/1.2177385
Enhancement of Schottky barrier height on -type GaN by treatment
J. Appl. Phys. 99, 053706 (2006)
https://doi.org/10.1063/1.2175446
Local oxidation of Ga[Al]As heterostructures with modulated tip-sample voltages
J. Appl. Phys. 99, 053707 (2006)
https://doi.org/10.1063/1.2176162
Electrical transport behavior of at low temperatures
J. Appl. Phys. 99, 053709 (2006)
https://doi.org/10.1063/1.2177377
Synthesis and thermoelectric properties of Sr-filled skutterudite
J. Appl. Phys. 99, 053711 (2006)
https://doi.org/10.1063/1.2172705
MAGNETISM AND SUPERCONDUCTIVITY
Magnetization reversal and microstructure of films
J. Appl. Phys. 99, 053901 (2006)
https://doi.org/10.1063/1.2174114
Vortex rotation control in Permalloy disks with small circular voids
J. Appl. Phys. 99, 053902 (2006)
https://doi.org/10.1063/1.2174115
Irreversibility line and thermally activated flux flow in films
J. Appl. Phys. 99, 053903 (2006)
https://doi.org/10.1063/1.2174120
Structure, phase transformation, and magnetic properties of magnets
J. Appl. Phys. 99, 053905 (2006)
https://doi.org/10.1063/1.2178397
The origin of (001) texture evolution in FePt thin films on amorphous substrates
J. Appl. Phys. 99, 053906 (2006)
https://doi.org/10.1063/1.2176088
Grain-boundary magnetoresistance enhancement induced by network self-optimization
J. Appl. Phys. 99, 053907 (2006)
https://doi.org/10.1063/1.2176106
Structural and magnetic properties of thin films
J. Appl. Phys. 99, 053908 (2006)
https://doi.org/10.1063/1.2177379
Magnetic force microscopy observations of Co nanoparticles grown on annealing melt spun ribbons
J. Appl. Phys. 99, 053910 (2006)
https://doi.org/10.1063/1.2175445
DIELECTRICS AND FERROELECTRICITY
Ferroelastic domain switching behaviors of superionic conductor (, Rb, and ) single crystals
J. Appl. Phys. 99, 054102 (2006)
https://doi.org/10.1063/1.2177387
NANOSCALE SCIENCE AND DESIGN
Comparison of nanostructure characteristics of ZnO grown on GaN and sapphire
Wen-Yu Shiao; Chun-Yung Chi; Shu-Cheng Chin; Chi-Feng Huang; Tsung-Yi Tang; Yen-Cheng Lu; Yu-Li Lin; Lin Hong; Fang-Yi Jen; C. C. Yang; Bao-Ping Zhang; Yusaburo Segawa
J. Appl. Phys. 99, 054301 (2006)
https://doi.org/10.1063/1.2174121
Size effect ordering in nanoparticles
J. Appl. Phys. 99, 054304 (2006)
https://doi.org/10.1063/1.2175475
The formation of metallic nanoparticles in single crystal under excimer laser irradiation
J. Appl. Phys. 99, 054305 (2006)
https://doi.org/10.1063/1.2177931
Effect of interfacial stresses on the elastic behavior of nanocomposite materials
J. Appl. Phys. 99, 054306 (2006)
https://doi.org/10.1063/1.2179140
Au-catalyzed growth processes and luminescence properties of ZnO nanopillars on Si
Yujie Li; Martin Feneberg; Anton Reiser; Martin Schirra; Rainer Enchelmaier; Andreas Ladenburger; André Langlois; Rolf Sauer; Klaus Thonke; Jun Cai; Hubert Rauscher
J. Appl. Phys. 99, 054307 (2006)
https://doi.org/10.1063/1.2178395
Growth of Ge quantum dots on by pulsed laser deposition
J. Appl. Phys. 99, 054308 (2006)
https://doi.org/10.1063/1.2178679
Dielectric properties of hydrogen-terminated Si(111) ultrathin films
J. Appl. Phys. 99, 054309 (2006)
https://doi.org/10.1063/1.2178703
Electrostatics of nanowire transistors with triangular cross sections
J. Appl. Phys. 99, 054310 (2006)
https://doi.org/10.1063/1.2168229
Size and temperature induced phase transition behaviors of barium titanate nanoparticles
J. Appl. Phys. 99, 054311 (2006)
https://doi.org/10.1063/1.2179971
Theoretical and experimental studies for nano-oxidation of silicon wafer by ac atomic force microscopy
J. Appl. Phys. 99, 054312 (2006)
https://doi.org/10.1063/1.2174721
Characteristics of nucleation layer and epitaxy in GaN/sapphire heterostructures
J. Appl. Phys. 99, 054313 (2006)
https://doi.org/10.1063/1.2178660
DEVICE PHYSICS
Electroabsorption and electrorefraction in and quantum dots
J. Appl. Phys. 99, 054501 (2006)
https://doi.org/10.1063/1.2175469
Redistribution of Pb-rich phase during electromigration in eutectic SnPb solder stripes
J. Appl. Phys. 99, 054502 (2006)
https://doi.org/10.1063/1.2178392
Indium arsenide quantum wire trigate metal oxide semiconductor field effect transistor
J. Appl. Phys. 99, 054503 (2006)
https://doi.org/10.1063/1.2179135
Improving the light extraction efficiency of red-emitting conjugated polymer light emitting diodes
Ali M. Adawi; Liam G. Connolly; David M. Whittaker; David G. Lidzey; Euan Smith; Matthew Roberts; Faisal Qureshi; Clare Foden; Nicky Athanassopoulou
J. Appl. Phys. 99, 054505 (2006)
https://doi.org/10.1063/1.2179139
Symmetrical threshold voltage in complementary metal-oxide-semiconductor field-effect transistors with achieved by adjusting compositional ratio
Masaru Kadoshima; Arito Ogawa; Hiroyuki Ota; Kunihiko Iwamoto; Masashi Takahashi; Nobuyuki Mise; Shinji Migita; Minoru Ikeda; Hideki Satake; Toshihide Nabatame; Akira Toriumi
J. Appl. Phys. 99, 054506 (2006)
https://doi.org/10.1063/1.2178654
Characterization of HfSiON gate dielectrics using monoenergetic positron beams
A. Uedono; K. Ikeuchi; T. Otsuka; K. Shiraishi; K. Yamabe; S. Miyazaki; N. Umezawa; A. Hamid; T. Chikyow; T. Ohdaira M. Muramatsu; R. Suzuki; S. Inumiya; S. Kamiyama; Y. Akasaka; Y. Nara; K. Yamada
J. Appl. Phys. 99, 054507 (2006)
https://doi.org/10.1063/1.2178657
APPLIED BIOPHYSICS
INTERDISCIPLINARY AND GENERAL PHYSICS
Influence of single and double deposition temperatures on the interface quality of atomic layer deposited dielectric thin films on silicon
S. Dueñas; H. Castán; H. García; A. de Castro; L. Bailón; K. Kukli; A. Aidla; J. Aarik; H. Mändar; T. Uustare; J. Lu; A. Hårsta
J. Appl. Phys. 99, 054902 (2006)
https://doi.org/10.1063/1.2177383
Optimization criteria for an irreversible quantum Brayton engine with an ideal Bose gas
J. Appl. Phys. 99, 054904 (2006)
https://doi.org/10.1063/1.2176083
Electrokinetic flow in a free surface-guided microchannel
J. Appl. Phys. 99, 054905 (2006)
https://doi.org/10.1063/1.2177428
Theoretical analysis of damping effects of guided elastic waves at solid∕fluid interfaces
J. Appl. Phys. 99, 054907 (2006)
https://doi.org/10.1063/1.2168242
Analytic model of electron pulse propagation in ultrafast electron diffraction experiments
J. Appl. Phys. 99, 054908 (2006)
https://doi.org/10.1063/1.2178855
COMMUNICATIONS
Exoelectron emission from silicon nanocrystals
Gil Rosenman; Daniel Aronov; Michael Molotskii; Yakov Roizin; Alexey Heiman; Wan Yuet Mei; Rene de Blank
J. Appl. Phys. 99, 056101 (2006)
https://doi.org/10.1063/1.2177375
Hugoniot evaluation of the preheated metal from its principal Hugoniot
J. Appl. Phys. 99, 056102 (2006)
https://doi.org/10.1063/1.2178388
Valence-band splitting in InGaPN: Effects of epitaxial strain and atomic ordering
J. Appl. Phys. 99, 056103 (2006)
https://doi.org/10.1063/1.2176182
Nonuniform charging effects on ion drag force in drifting dusty plasmas
J. Appl. Phys. 99, 056104 (2006)
https://doi.org/10.1063/1.2177429
Properties of a dielectric probe for scanning near-field millimeter-wave microscopy
J. Appl. Phys. 99, 056105 (2006)
https://doi.org/10.1063/1.2174110
Nonlinear characteristics of pseudo-Y-junction single-walled carbon nanotubes
J. Appl. Phys. 99, 056106 (2006)
https://doi.org/10.1063/1.2179134
Electric and magnetic behaviors of Li and Co codoped ZnO thin film on Si (100) substrate
J. Appl. Phys. 99, 056107 (2006)
https://doi.org/10.1063/1.2179119
Electron injection and trapping in a laser wakefield by field ionization to high-charge states of gases
J. Appl. Phys. 99, 056109 (2006)
https://doi.org/10.1063/1.2179194
ERRATA
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Scaling effects on the microstructure and thermomechanical response of through silicon vias (TSVs)
Shuhang Lyu, Thomas Beechem, et al.