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Comment on “Oxidation of alloys containing aluminum and diffusion in ” [
Issues
1 June 2005
ISSN 0021-8979
EISSN 1089-7550
In this Issue
APPLIED PHYSICS REVIEWS—FOCUSED REVIEW
LASERS, OPTICS, AND OPTOELECTRONICS
Optical detection of chemical warfare agents and toxic industrial chemicals: Simulation
J. Appl. Phys. 97, 113101 (2005)
https://doi.org/10.1063/1.1900931
Enhanced temporal resolution in femtosecond dynamic-grating experiments
J. Appl. Phys. 97, 113107 (2005)
https://doi.org/10.1063/1.1927277
The effects of photorefraction on electro-optic field sensors
J. Appl. Phys. 97, 113108 (2005)
https://doi.org/10.1063/1.1928313
PLASMAS AND ELECTRICAL DISCHARGES
Experimental investigation of hybrid-evaporation-glow discharge plasma immersion ion implantation
J. Appl. Phys. 97, 113301 (2005)
https://doi.org/10.1063/1.1924880
Impact of reductive plasma on porous low-dielectric constant SiCOH thin films
J. Appl. Phys. 97, 113302 (2005)
https://doi.org/10.1063/1.1926392
Influence of dielectric barrier discharges on low Mach number shock waves at low to medium pressures
J. Appl. Phys. 97, 113303 (2005)
https://doi.org/10.1063/1.1922088
Parameters of the plasma produced at the surface of a ferroelectric cathode by different driving pulses
J. Appl. Phys. 97, 113307 (2005)
https://doi.org/10.1063/1.1927704
STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER
A physically based lifetime model for stress-induced voiding in interconnects
J. Appl. Phys. 97, 113503 (2005)
https://doi.org/10.1063/1.1922072
Atomic structure of metallic glass
J. Appl. Phys. 97, 113507 (2005)
https://doi.org/10.1063/1.1914955
High-temperature stability of ion-implanted zirconia and spinel
J. Appl. Phys. 97, 113509 (2005)
https://doi.org/10.1063/1.1924879
Optical characterization of porous alumina from vacuum ultraviolet to midinfrared
J. Appl. Phys. 97, 113511 (2005)
https://doi.org/10.1063/1.1921336
Patterning of active organic materials by direct transfer for organic electronic devices
J. Appl. Phys. 97, 113512 (2005)
https://doi.org/10.1063/1.1900285
Modeling of twinning in epitaxial (001)-oriented thin films
J. Appl. Phys. 97, 113516 (2005)
https://doi.org/10.1063/1.1914950
Zirconia-germanium interface photoemission spectroscopy using synchrotron radiation
J. Appl. Phys. 97, 113518 (2005)
https://doi.org/10.1063/1.1922090
Heteroepitaxial growth of In-face InN on GaN (0001) by plasma-assisted molecular-beam epitaxy
J. Appl. Phys. 97, 113520 (2005)
https://doi.org/10.1063/1.1923166
Formation of stable titanium germanosilicide thin films on
J. Appl. Phys. 97, 113521 (2005)
https://doi.org/10.1063/1.1923164
In situ x-ray absorption spectroscopic study of the cathode material
J. Appl. Phys. 97, 113523 (2005)
https://doi.org/10.1063/1.1921328
Thickness-dependent optical properties of thin films
J. Appl. Phys. 97, 113528 (2005)
https://doi.org/10.1063/1.1927287
Control of crystalline orientation of germanium by lateral graphoepitaxy on microstructures
J. Appl. Phys. 97, 113530 (2005)
https://doi.org/10.1063/1.1927285
Phosphorescent-sensitized triplet-triplet annihilation in tris(8-hydroxyquinoline) aluminum
J. Appl. Phys. 97, 113532 (2005)
https://doi.org/10.1063/1.1925764
Oxidation-enhanced diffusion of boron in very low-energy -implanted silicon
J. Appl. Phys. 97, 113534 (2005)
https://doi.org/10.1063/1.1927687
Grooving of a grain boundary by evaporation–condensation below the roughening transition
J. Appl. Phys. 97, 113535 (2005)
https://doi.org/10.1063/1.1922583
Ion-beam-induced amorphization and order-disorder transition in the murataite structure
J. Appl. Phys. 97, 113536 (2005)
https://doi.org/10.1063/1.1926394
Effect of a cap layer on morphological stability of a strained epitaxial film
J. Appl. Phys. 97, 113537 (2005)
https://doi.org/10.1063/1.1928311
Near-infrared intersubband transitions in InGaAs–AlAs–InAlAs double quantum wells
J. Appl. Phys. 97, 113538 (2005)
https://doi.org/10.1063/1.1931037
Development of accelerator-based -ray-induced positron annihilation spectroscopy technique
J. Appl. Phys. 97, 113539 (2005)
https://doi.org/10.1063/1.1925769
High depth nondestructive stress measurements on thick steel alloys
J. Appl. Phys. 97, 113540 (2005)
https://doi.org/10.1063/1.1925770
ELECTRONIC STRUCTURE AND TRANSPORT
e-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer
J. Appl. Phys. 97, 113701 (2005)
https://doi.org/10.1063/1.1900296
Nonuniformities of electrical resistivity in undoped 6H-SiC wafers
Q. Li; A. Y. Polyakov; M. Skowronski; E. K. Sanchez; M. J. Loboda; M. A. Fanton; T. Bogart; R. D. Gamble
J. Appl. Phys. 97, 113705 (2005)
https://doi.org/10.1063/1.1921340
centers in intracenter Si:P lasers
J. Appl. Phys. 97, 113708 (2005)
https://doi.org/10.1063/1.1922091
Electrical conduction mechanism in silicon nitride and oxy-nitride-sputtered thin films
J. Appl. Phys. 97, 113710 (2005)
https://doi.org/10.1063/1.1915538
X-ray absorption and photoelectron spectroscopic study of plasma-nitrided film
J. Appl. Phys. 97, 113711 (2005)
https://doi.org/10.1063/1.1927283
Recombination activity of iron-gallium and iron-indium pairs in silicon
J. Appl. Phys. 97, 113712 (2005)
https://doi.org/10.1063/1.1929096
Electronic state characterization of thin films prepared by evaporation
J. Appl. Phys. 97, 113714 (2005)
https://doi.org/10.1063/1.1927278
Thermoelectric properties of Yb-filled Ge-compensated skutterudite materials
J. Appl. Phys. 97, 113715 (2005)
https://doi.org/10.1063/1.1927702
MAGNETISM AND SUPERCONDUCTIVITY
Spin transport in a -doped asymmetric tunnel structure
J. Appl. Phys. 97, 113901 (2005)
https://doi.org/10.1063/1.1861520
Effect of structural disorder on some physical properties of the Heusler alloy films
J. Appl. Phys. 97, 113903 (2005)
https://doi.org/10.1063/1.1921327
Magnetostriction and magnetomechanical coupling of grain-aligned /epoxy-filled composites
J. Appl. Phys. 97, 113905 (2005)
https://doi.org/10.1063/1.1925335
Suppression of left-handed properties in disordered metamaterials
J. Appl. Phys. 97, 113906 (2005)
https://doi.org/10.1063/1.1923591
Helimagnetic order in the re-entrant ferromagnet
J. Appl. Phys. 97, 113909 (2005)
https://doi.org/10.1063/1.1924877
DIELECTRICS AND FERROELECTRICITY
Piezoelectric properties of ceramics
J. Appl. Phys. 97, 114105 (2005)
https://doi.org/10.1063/1.1926396
Phase diagram of thin-film relaxor
J. Appl. Phys. 97, 114107 (2005)
https://doi.org/10.1063/1.1924874
Electrical damage induced by reactive ion-beam etching of lead-zirconate-titanate thin films
J. Appl. Phys. 97, 114110 (2005)
https://doi.org/10.1063/1.1923589
Real-time study of domain dynamics in ferroelectric
J. Appl. Phys. 97, 114111 (2005)
https://doi.org/10.1063/1.1925330
NANOSCALE SCIENCE AND DESIGN
On the diffusion-controlled growth of multiwalled carbon nanotubes
J. Appl. Phys. 97, 114301 (2005)
https://doi.org/10.1063/1.1922067
Comparison of the device physics principles of planar and radial junction nanorod solar cells
J. Appl. Phys. 97, 114302 (2005)
https://doi.org/10.1063/1.1901835
Effects of particle size and spacing on the optical properties of gold nanocrystals in alumina
J. Appl. Phys. 97, 114303 (2005)
https://doi.org/10.1063/1.1868052
Physical models for coupled electromechanical analysis of silicon nanoelectromechanical systems
J. Appl. Phys. 97, 114304 (2005)
https://doi.org/10.1063/1.1897483
Thickness dependence of properties of excimer laser crystallized nano-polycrystalline silicon
J. Appl. Phys. 97, 114305 (2005)
https://doi.org/10.1063/1.1898444
Effect of nanoscale surface morphology on the phase stability of 3C-AlN films on Si(111)
J. Appl. Phys. 97, 114306 (2005)
https://doi.org/10.1063/1.1915535
Effects of physical properties of components on reactive nanolayer joining
J. Appl. Phys. 97, 114307 (2005)
https://doi.org/10.1063/1.1915540
Growth and field emission properties of vertically aligned carbon nanofibers
J. Appl. Phys. 97, 114308 (2005)
https://doi.org/10.1063/1.1899225
Spark plasma sintering and thermal conductivity of carbon nanotube bulk materials
J. Appl. Phys. 97, 114310 (2005)
https://doi.org/10.1063/1.1927286
Influence of thickness and cap layer on the switching behavior of single Co nanowires
J. Appl. Phys. 97, 114311 (2005)
https://doi.org/10.1063/1.1921343
Structural trends interpretation of the metal-to-semiconductor transition in deformed carbon nanotubes
J. Appl. Phys. 97, 114314 (2005)
https://doi.org/10.1063/1.1923160
Phase states of nanocrystalline ferroelectric ceramics and their dielectric properties
J. Appl. Phys. 97, 114315 (2005)
https://doi.org/10.1063/1.1924875
Gas-induced variation in the dielectric properties of carbon nanotube bundles for selective sensing
J. Appl. Phys. 97, 114316 (2005)
https://doi.org/10.1063/1.1906289
Structural characterization of carbon nanosheets via x-ray scattering
J. Appl. Phys. 97, 114317 (2005)
https://doi.org/10.1063/1.1927284
Buckling analysis of triple-walled carbon nanotubes embedded in an elastic matrix
J. Appl. Phys. 97, 114318 (2005)
https://doi.org/10.1063/1.1925334
Ensemble Monte Carlo transport simulations for semiconducting carbon nanotubes
J. Appl. Phys. 97, 114319 (2005)
https://doi.org/10.1063/1.1925763
Current-driven magnetization reversal in exchange-biased spin-valve nanopillars
J. Hayakawa; H. Takahashi; K. Ito; M. Fujimori; S. Heike; T. Hashizume; M. Ichimura; S. Ikeda; H. Ohno
J. Appl. Phys. 97, 114321 (2005)
https://doi.org/10.1063/1.1927707
Critical size effects on the magnetic resonance in nanoparticles
J. Appl. Phys. 97, 114322 (2005)
https://doi.org/10.1063/1.1927280
Desorption dynamics of oxide nanostructures fabricated by local anodic oxidation nanolithography
J. Appl. Phys. 97, 114324 (2005)
https://doi.org/10.1063/1.1923165
Equilibrium limits of coherency in strained nanowire heterostructures
J. Appl. Phys. 97, 114325 (2005)
https://doi.org/10.1063/1.1903106
Strain relaxation, band-structure deformation, and optical absorption in free-hanging quantum-well microstructures
T. H. Stievater; W. S. Rabinovich; D. Park; Peter G. Goetz; J. B. Boos; D. S. Katzer; M. L. Biermann; S. Kanakaraju; L. C. Calhoun
J. Appl. Phys. 97, 114326 (2005)
https://doi.org/10.1063/1.1906287
Nanostructure formation during deposition of nanomultilayer films by reactive dual magnetron sputtering
J. Appl. Phys. 97, 114327 (2005)
https://doi.org/10.1063/1.1935135
DEVICE PHYSICS
Bright white organic light-emitting diodes based on two blue emitters with similar molecular structures
J. Appl. Phys. 97, 114503 (2005)
https://doi.org/10.1063/1.1922586
Study of strain relaxation in Si/SiGe metal-oxide-semiconductor field-effect transistors
J. Appl. Phys. 97, 114504 (2005)
https://doi.org/10.1063/1.1922582
Characteristics of a micromachined floating-gate high-electron-mobility transistor at
J. Appl. Phys. 97, 114507 (2005)
https://doi.org/10.1063/1.1924872
Correlation between morphology and ambipolar transport in organic field-effect transistors
J. Appl. Phys. 97, 114508 (2005)
https://doi.org/10.1063/1.1929850
X-ray and neutron reflectivity measurements of moisture transport through model multilayered barrier films for flexible displays
Bryan D. Vogt; Hae-Jeong Lee; Vivek M. Prabhu; Dean M. DeLongchamp; Eric K. Lin; Wen-li Wu; Sushil K. Satija
J. Appl. Phys. 97, 114509 (2005)
https://doi.org/10.1063/1.1923590
APPLIED BIOPHYSICS
On the thickness uniformity of micropatterns of hyaluronic acid in a soft lithographic molding method
J. Appl. Phys. 97, 114701 (2005)
https://doi.org/10.1063/1.1929095
INTERDISCIPLINARY AND GENERAL PHYSICS
Thermoelectric performance of films in the bismuth-tellurium and antimony-tellurium systems
J. Appl. Phys. 97, 114903 (2005)
https://doi.org/10.1063/1.1914948
Effect of ozone treatment on the electrical properties of thin films
J. Appl. Phys. 97, 114904 (2005)
https://doi.org/10.1063/1.1927289
Modeling of crossflow jet-type singlet oxygen generator
J. Appl. Phys. 97, 114905 (2005)
https://doi.org/10.1063/1.1922089
Hydrogen content in doped and undoped and by cold neutron prompt-gamma activation analysis
J. Appl. Phys. 97, 114908 (2005)
https://doi.org/10.1063/1.1922590
Single beam determination of porosity and etch rate in situ during etching of porous silicon
J. Appl. Phys. 97, 114909 (2005)
https://doi.org/10.1063/1.1925762
The distribution of impurities in the interfaces and window layers of thin-film solar cells
J. Appl. Phys. 97, 114910 (2005)
https://doi.org/10.1063/1.1921344
Thermal decomposition mechanisms of hafnium and zirconium silicates at the atomic scale
J. Appl. Phys. 97, 114911 (2005)
https://doi.org/10.1063/1.1926399
Raman spectroscopy as a tool to study TiC formation during controlled ball milling
J. Appl. Phys. 97, 114912 (2005)
https://doi.org/10.1063/1.1927282
Microcrystalline silicon solar cells deposited at high rates
J. Appl. Phys. 97, 114913 (2005)
https://doi.org/10.1063/1.1927689
Stress development kinetics in plasma-enhanced chemical-vapor-deposited silicon nitride films
J. Appl. Phys. 97, 114914 (2005)
https://doi.org/10.1063/1.1927708
Effect of grain boundaries on hydrocarbon sensing in Fe-doped -type semiconducting perovskite films
J. Appl. Phys. 97, 114916 (2005)
https://doi.org/10.1063/1.1922584
COMMUNICATIONS
Negative thermal expansion and spontaneous magnetostriction of compound
J. Appl. Phys. 97, 116102 (2005)
https://doi.org/10.1063/1.1921334
A self-consistent theoretical model for macropore growth in -type silicon
J. Appl. Phys. 97, 116105 (2005)
https://doi.org/10.1063/1.1915534
Coulomb blockade oscillations in ultrathin gate oxide silicon single-electron transistors
J. Appl. Phys. 97, 116106 (2005)
https://doi.org/10.1063/1.1921335
Polarization charge effects on ion-dust grain collisions in presence of ion drift
J. Appl. Phys. 97, 116107 (2005)
https://doi.org/10.1063/1.1929883
Mechanical stability of ultrathin film on : The effect of interface
J. Appl. Phys. 97, 116108 (2005)
https://doi.org/10.1063/1.1926421
Comment on “Oxidation of alloys containing aluminum and diffusion in ” [J. Appl. Phys. 95, 3217 (2004)]
J. Appl. Phys. 97, 116109 (2005)
https://doi.org/10.1063/1.1923608
Comment on “Oxidation of alloys containing aluminum and diffusion in ” [J. Appl. Phys. 95, 3217 (2004)]
J. Appl. Phys. 97, 116111 (2005)
https://doi.org/10.1063/1.1923610
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.