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Issues
1 November 2004
ISSN 0021-8979
EISSN 1089-7550
In this Issue
APPLIED PHYSICS REVIEWS - FOCUSED REVIEW
LASERS, OPTICS, AND OPTOELECTRONICS (PACS 42)
Ultrafast nonlinear tuning of the reflection properties of AlGaAs photonic crystal waveguides by two-photon absorption
A. D. Bristow; D. O. Kundys; A. Z. García-Déniz; J.-P. R. Wells; A. M. Fox; M. S. Skolnick; D. M. Whittaker; A. Tahraoui; T. F. Krauss; J. S. Roberts
J. Appl. Phys. 96, 4729–4734 (2004)
https://doi.org/10.1063/1.1790569
A comparison of the optical constants of aligned and unaligned thin polyfluorene films
J. Appl. Phys. 96, 4735–4741 (2004)
https://doi.org/10.1063/1.1790575
Absorption and photoluminescence properties of -doped and codoped soda-silicate laser glasses
J. Appl. Phys. 96, 4746–4750 (2004)
https://doi.org/10.1063/1.1792388
Resonantly pumped optical pumping injection cavity lasers
T. C. McAlpine; K. R. Greene; M. R. Santilli; L. J. Olafsen; W. W. Bewley; C. L. Felix; I. Vurgaftman; J. R. Meyer; H. Lee; R. U. Martinelli
J. Appl. Phys. 96, 4751–4754 (2004)
https://doi.org/10.1063/1.1801164
Effect of free-carrier absorption on the threshold current density of quantum-cascade lasers
J. Appl. Phys. 96, 4755–4761 (2004)
https://doi.org/10.1063/1.1803635
PLASMAS AND ELECTRICAL DISCHARGES (PACS 51-52)
Analytical fit of the characteristic for cylindrical and spherical probes in electronegative plasmas
J. Appl. Phys. 96, 4777–4783 (2004)
https://doi.org/10.1063/1.1796517
Bayesian analysis of the effective charge from spectroscopic bremsstrahlung measurement in fusion plasmas
J. Appl. Phys. 96, 4784–4792 (2004)
https://doi.org/10.1063/1.1787135
Charge state and time resolved plasma composition of a pulsed zirconium arc in a nitrogen environment
J. Appl. Phys. 96, 4793–4799 (2004)
https://doi.org/10.1063/1.1803627
Physical mechanisms for anisotropic plasma etching of cesium iodide
J. Appl. Phys. 96, 4800–4806 (2004)
https://doi.org/10.1063/1.1803607
STRUCTURAL, MECHANICAL THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER (PACS 61-68, 78)
Chemical and electrical characterization of interface improved by sulfur passivation
J. Appl. Phys. 96, 4811–4816 (2004)
https://doi.org/10.1063/1.1785851
Emission properties of Co-doped in glass
J. Appl. Phys. 96, 4827–4832 (2004)
https://doi.org/10.1063/1.1796519
X-ray diffraction on laterally modulated short-period superlattices
O. Caha; V. Křápek; V. Holý; S. C. Moss; J. H. Li; A. G. Norman; A. Mascarenhas; J. L. Reno; J. Stangl; M. Meduňa
J. Appl. Phys. 96, 4833–4838 (2004)
https://doi.org/10.1063/1.1781768
Large nonlinear optical properties of semiconductor quantum dot arrays embedded in an organic medium
J. Appl. Phys. 96, 4839–4842 (2004)
https://doi.org/10.1063/1.1797545
Modeling and regrowth mechanisms of flash lamp processing of SiC-on-silicon heterostructures
J. Appl. Phys. 96, 4843–4851 (2004)
https://doi.org/10.1063/1.1786650
Photorefractive effect and photochromism in the -doped relaxor ferroelectric crystal
J. Appl. Phys. 96, 4852–4855 (2004)
https://doi.org/10.1063/1.1782953
Heteroepitaxial selective growth of on -patterned GaAs(001) by molecular beam epitaxy
J. Appl. Phys. 96, 4856–4865 (2004)
https://doi.org/10.1063/1.1786677
A physically based model for the spatial and temporal evolution of self-interstitial agglomerates in ion-implanted silicon
Christophe J. Ortiz; Peter Pichler; Tim Fühner; Filadelfo Cristiano; Benjamin Colombeau; Nicholas E. B. Cowern; Alain Claverie
J. Appl. Phys. 96, 4866–4877 (2004)
https://doi.org/10.1063/1.1786678
Island growth in the atomic layer deposition of zirconium oxide and aluminum oxide on hydrogen-terminated silicon: Growth mode modeling and transmission electron microscopy
Riikka L. Puurunen; Wilfried Vandervorst; Wim F. A. Besling; Olivier Richard; Hugo Bender; Thierry Conard; Chao Zhao; Annelies Delabie; Matty Caymax; Stefan De Gendt; Marc Heyns; Minna M. Viitanen; Marco de Ridder; Hidde H. Brongersma; Yde Tamminga; Thuy Dao; Toon de Win; Marcel Verheijen; Monja Kaiser; Marko Tuominen
J. Appl. Phys. 96, 4878–4889 (2004)
https://doi.org/10.1063/1.1787624
Raman study of outgassing and damage induced by ion implantation in -doped
J. Appl. Phys. 96, 4890–4893 (2004)
https://doi.org/10.1063/1.1803615
The channel effect: Coupling of the detonation and the precursor shock wave by precompression of the explosive
J. Appl. Phys. 96, 4894–4902 (2004)
https://doi.org/10.1063/1.1787913
Structural study of under pressure
J. Appl. Phys. 96, 4903–4908 (2004)
https://doi.org/10.1063/1.1778481
Deep levels created by low energy electron irradiation in
J. Appl. Phys. 96, 4909–4915 (2004)
https://doi.org/10.1063/1.1778819
Electrical activation of high-concentration aluminum implanted in 4H-SiC
J. Appl. Phys. 96, 4916–4922 (2004)
https://doi.org/10.1063/1.1796518
Excited state dynamics of in crystals
J. Appl. Phys. 96, 4923–4929 (2004)
https://doi.org/10.1063/1.1797551
Raman scattering and photoluminescence studies of -implanted and coimplanted
J. Appl. Phys. 96, 4930–4934 (2004)
https://doi.org/10.1063/1.1792387
Low-energy nitrogen ion implantation of
J. Appl. Phys. 96, 4935–4938 (2004)
https://doi.org/10.1063/1.1792390
Brillouin scattering and x-ray photoelectron studies of germanium nanoclusters synthesized in by ion implantation
J. Appl. Phys. 96, 4952–4959 (2004)
https://doi.org/10.1063/1.1794891
Diffusion of boron in 6H and 4H SiC coimplanted with boron and nitrogen ions
J. Appl. Phys. 96, 4960–4964 (2004)
https://doi.org/10.1063/1.1803923
ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73)
The influence of doping on the charge-ordering state in bilayered
J. Appl. Phys. 96, 4965–4969 (2004)
https://doi.org/10.1063/1.1794907
Evidence for capture of holes into resonant states in boron-doped silicon
J. Appl. Phys. 96, 4970–4975 (2004)
https://doi.org/10.1063/1.1795985
Electrical properties and microstructure of ternary ohmic contacts to -type 4H–SiC
J. Appl. Phys. 96, 4976–4981 (2004)
https://doi.org/10.1063/1.1797546
Growth of crack-free GaN films on Si(111) substrate by using Al-rich AlN buffer layer
Yuan Lu; Guangwei Cong; Xianglin Liu; Da-Cheng Lu; Qinsheng Zhu; Xiaohui Wang; Jiejun Wu; Zhanguo Wang
J. Appl. Phys. 96, 4982–4988 (2004)
https://doi.org/10.1063/1.1787588
Analytic band Monte Carlo model for electron transport in including acoustic and optical phonon dispersion
J. Appl. Phys. 96, 4998–5005 (2004)
https://doi.org/10.1063/1.1788838
Resonant tunneling through defects in an insulator: Modeling and solar cell applications
J. Appl. Phys. 96, 5006–5012 (2004)
https://doi.org/10.1063/1.1797542
Study of photoelectron spectroscopy from extremely uniform nanoislands on substrate
J. Appl. Phys. 96, 5013–5016 (2004)
https://doi.org/10.1063/1.1801156
Temperature dependence of breakdown voltage in
J. Appl. Phys. 96, 5017–5019 (2004)
https://doi.org/10.1063/1.1803944
Vibrational properties of hydrogen atom adsorbed on Cu(111) and on Ir(111) surfaces
J. Appl. Phys. 96, 5020–5025 (2004)
https://doi.org/10.1063/1.1794905
Highly resolved quantized double-layer charging of relatively larger dodecanethiol-passivated gold quantum dots
Nirmalya K. Chaki; Bhalchandra Kakade; Jadab Sharma; Subhramannia Mahima; Kunjukrishna P. Vijayamohanan; Santosh K. Haram
J. Appl. Phys. 96, 5032–5036 (2004)
https://doi.org/10.1063/1.1781763
Hole effective mass in strained alloys
J. Appl. Phys. 96, 5037–5041 (2004)
https://doi.org/10.1063/1.1796516
MAGNETISM AND SUPERCONDUCTIVITY (PACS 74-76)
Thickness dependence of the magnetic properties of films on and : Role of a natural array of ferromagnetic stripes
J. Appl. Phys. 96, 5056–5062 (2004)
https://doi.org/10.1063/1.1790576
Effect of the substrate temperature on the properties of thin film magnets
J. Appl. Phys. 96, 5063–5068 (2004)
https://doi.org/10.1063/1.1775044
Magnetism and nuclear magnetic resonance of hectorite and montmorillonite layered silicates
J. Appl. Phys. 96, 5085–5092 (2004)
https://doi.org/10.1063/1.1794364
Structural and magnetic properties of insulating thin films
J. Appl. Phys. 96, 5093–5096 (2004)
https://doi.org/10.1063/1.1756212
Epitaxial growth and physical properties of a room temperature ferromagnetic semiconductor: Anatase phase
Y. Yamada; H. Toyosaki; A. Tsukazaki; T. Fukumura; K. Tamura; Y. Segawa; K. Nakajima; T. Aoyama; T. Chikyow; T. Hasegawa; H. Koinuma; M. Kawasaki
J. Appl. Phys. 96, 5097–5102 (2004)
https://doi.org/10.1063/1.1758310
DIELECTRICS AND FERROELECTRICITY (PACS 77)
The morphotropic phase boundary and dielectric properties of the perovskite solid solution
J. Appl. Phys. 96, 5103–5109 (2004)
https://doi.org/10.1063/1.1796511
Polarized Raman scattering of highly [111]-oriented thin films in the rhombohedral-phase field
J. Appl. Phys. 96, 5110–5116 (2004)
https://doi.org/10.1063/1.1790573
Monitoring of cement hydration by broadband time-domain-reflectometry dielectric spectroscopy
J. Appl. Phys. 96, 5117–5128 (2004)
https://doi.org/10.1063/1.1797549
Are microbubbles necessary for the breakdown of liquid water subjected to a submicrosecond pulse?
J. Appl. Phys. 96, 5129–5139 (2004)
https://doi.org/10.1063/1.1792391
NANOSCALE SCIENCE AND DESIGN
Parametric investigation of laser nanoimprinting of hemispherical cavity arrays
J. Appl. Phys. 96, 5144–5151 (2004)
https://doi.org/10.1063/1.1796515
In situ synthesis of carbon nanotubes decorated with palladium nanoparticles using arc-discharge in solution method
J. Appl. Phys. 96, 5152–5157 (2004)
https://doi.org/10.1063/1.1786347
Effect of residual catalyst on the vibrational modes of single-walled carbon nanotubes
J. Appl. Phys. 96, 5158–5162 (2004)
https://doi.org/10.1063/1.1792805
Optical response of mixed nanocrystals produced by pulsed laser deposition
J. Appl. Phys. 96, 5163–5168 (2004)
https://doi.org/10.1063/1.1792810
Influence of composition on the piezoelectric effect and on the conduction band energy levels of quantum dots
M. A. Migliorato; D. Powell; S. L. Liew; A. G. Cullis; P. Navaretti; M. J. Steer; M. Hopkinson; M. Fearn; J. H. Jefferson
J. Appl. Phys. 96, 5169–5172 (2004)
https://doi.org/10.1063/1.1793333
Reversal mechanisms and metastable states in magnetic nanoelements
J. Appl. Phys. 96, 5173–5179 (2004)
https://doi.org/10.1063/1.1803102
Nanoscale GaN whiskers fabricated by photoelectrochemical etching
J. Appl. Phys. 96, 5185–5188 (2004)
https://doi.org/10.1063/1.1788841
Deposition of palladium nanoparticles on the pore walls of anodic alumina using sequential electroless deposition
J. Appl. Phys. 96, 5189–5194 (2004)
https://doi.org/10.1063/1.1788843
Deposition and structure of chemically vapor deposited nanoscale Ti-Si islands on Si
J. Appl. Phys. 96, 5195–5201 (2004)
https://doi.org/10.1063/1.1789626
Ion-beam-induced embedded nanostructures and nanoscale mixing
J. Appl. Phys. 96, 5212–5216 (2004)
https://doi.org/10.1063/1.1794899
Assembly of nanoparticles grown on with self-organized groove structure
J. Appl. Phys. 96, 5217–5221 (2004)
https://doi.org/10.1063/1.1794903
Microcavity-like leaky mode emission from a planar optical waveguide made of luminescent silicon nanocrystals
J. Appl. Phys. 96, 5222–5225 (2004)
https://doi.org/10.1063/1.1795984
Dynamic optical probing of the magnetic anisotropy of nickel-ferrite nanoparticles
J. Appl. Phys. 96, 5226–5233 (2004)
https://doi.org/10.1063/1.1790574
Formation, structure, and phonon confinement effect of nanocrystalline in cosputtered films
J. Appl. Phys. 96, 5239–5242 (2004)
https://doi.org/10.1063/1.1772888
DEVICE PHYSICS (PACS 85)
Optimized light-emitting diodes and high efficiency wafer-fused optical up-conversion devices
J. Appl. Phys. 96, 5243–5248 (2004)
https://doi.org/10.1063/1.1785867
An experimental study on the /sapphire layered surface acoustic wave device
J. Appl. Phys. 96, 5249–5253 (2004)
https://doi.org/10.1063/1.1785842
Error mechanisms and rates in tunable-barrier single-electron turnstiles and charge-coupled devices
J. Appl. Phys. 96, 5254–5266 (2004)
https://doi.org/10.1063/1.1791758
Generation and behavior of pure-edge threading misfit dislocations in multiple quantum wells
J. Appl. Phys. 96, 5267–5270 (2004)
https://doi.org/10.1063/1.1803633
Electronic transport in field-effect transistors of sexithiophene
J. Appl. Phys. 96, 5277–5283 (2004)
https://doi.org/10.1063/1.1789279
INTERDISCIPLINARY AND GENERAL PHYSICS (PACS 1-41, 43-47, 79, 81-84, 89-99)
Residual gas analysis of a dc plasma for carbon nanofiber growth
J. Appl. Phys. 96, 5284–5292 (2004)
https://doi.org/10.1063/1.1779975
Effect of impurity incorporation on crystallization in sublimation epitaxy
J. Appl. Phys. 96, 5293–5297 (2004)
https://doi.org/10.1063/1.1785840
Effect of selected atomic layer deposition parameters on the structure and dielectric properties of hafnium oxide films
Kaupo Kukli; Jaan Aarik; Mikko Ritala; Teet Uustare; Timo Sajavaara; Jun Lu; Jonas Sundqvist; Aleks Aidla; Lembit Pung; Anders Hårsta; Markku Leskelä
J. Appl. Phys. 96, 5298–5307 (2004)
https://doi.org/10.1063/1.1796513
Production of high-quality films by the two-step annealing method
J. D. Ye; S. L. Gu; S. M. Zhu; F. Qin; S. M. Liu; W. Liu; X. Zhou; L. Q. Hu; R. Zhang; Y. Shi; Y. D. Zheng
J. Appl. Phys. 96, 5308–5310 (2004)
https://doi.org/10.1063/1.1791755
Spectral self-interference fluorescence microscopy
J. Appl. Phys. 96, 5311–5315 (2004)
https://doi.org/10.1063/1.1786665
Nearly strain-free heteroepitaxial system for fundamental studies of pulsed laser deposition: on
J. Appl. Phys. 96, 5324–5328 (2004)
https://doi.org/10.1063/1.1794362
Improved three-dimensional optical model for thin-film silicon solar cells
J. Appl. Phys. 96, 5329–5337 (2004)
https://doi.org/10.1063/1.1784555
Nonlocal electrostatics in heterogeneous suspensions using a point-dipole model
J. Appl. Phys. 96, 5341–5348 (2004)
https://doi.org/10.1063/1.1778483
Burstein-Moss shift in impurity-compensated bulk substrates
J. Appl. Phys. 96, 5349–5352 (2004)
https://doi.org/10.1063/1.1796538
Growth of pinhole-free epitaxial and silicide thin films on atomically clean
J. Appl. Phys. 96, 5353–5356 (2004)
https://doi.org/10.1063/1.1769604
Demagnetizing factors for completely shielded rectangular prisms
J. Appl. Phys. 96, 5365–5369 (2004)
https://doi.org/10.1063/1.1787134
COMMUNICATIONS
Inverted hysteresis in exchange biased coated particles
J. Appl. Phys. 96, 5370–5372 (2004)
https://doi.org/10.1063/1.1795983
The dynamic characteristics of sulfur sensitization centers in T-grain microcrystals
J. Appl. Phys. 96, 5373–5375 (2004)
https://doi.org/10.1063/1.1801154
Analytic, graphical, and geometric solutions for the band edges of one-dimensional photonic band gap materials
J. Appl. Phys. 96, 5376–5378 (2004)
https://doi.org/10.1063/1.1803626
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
GaN-based power devices: Physics, reliability, and perspectives
Matteo Meneghini, Carlo De Santi, et al.
Celebrating notable advances in compound semiconductors: A tribute to Dr. Wladyslaw Walukiewicz
Kirstin Alberi, Junqiao Wu, et al.