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Issues
1 February 2003
ISSN 0021-8979
EISSN 1089-7550
In this Issue
APPLIED PHYSICS REVIEWS—FOCUSED REVIEW
LASERS, OPTICS, AND OPTOELECTRONICS (PACS 42)
Spatially resolved spectroscopic strain measurements on high-power laser diode bars
J. W. Tomm; A. Gerhardt; R. Müller; V. Malyarchuk; Y. Sainte-Marie; P. Galtier; J. Nagle; J.-P. Landesman
J. Appl. Phys. 93, 1354–1362 (2003)
https://doi.org/10.1063/1.1533091
AlN/AlGaInN superlattice light-emitting diodes at 280 nm
J. Appl. Phys. 93, 1363–1366 (2003)
https://doi.org/10.1063/1.1535255
Low-threshold lasing in a microcavity of fluorene-based liquid-crystalline polymer blends
J. Appl. Phys. 93, 1367–1370 (2003)
https://doi.org/10.1063/1.1536013
PLASMAS AND ELECTRICAL DISCHARGES (PACS 51-52)
Inductively coupled plasma etching of SiC in and etch-induced surface chemical bonding modifications
J. Appl. Phys. 93, 1376–1383 (2003)
https://doi.org/10.1063/1.1534908
Measurement of expanding plasma sheath from a target biased by a negative pulse with a fast rise time
J. Appl. Phys. 93, 1384–1388 (2003)
https://doi.org/10.1063/1.1536721
Macromolecule formation in low density plasmas: The influence of
J. Appl. Phys. 93, 1389–1402 (2003)
https://doi.org/10.1063/1.1535747
STRUCTURAL, MECHANICAL THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER (PACS 61-68, 78)
Effect of Tl content on the growth of TlGaAs films by low-temperature molecular-beam epitaxy
J. Appl. Phys. 93, 1409–1416 (2003)
https://doi.org/10.1063/1.1531210
Relationship between interfacial adhesion and electromigration in Cu metallization
J. Appl. Phys. 93, 1417–1421 (2003)
https://doi.org/10.1063/1.1532942
Indium segregation to dislocation loops induced by ion implantation damage in silicon
J. Appl. Phys. 93, 1428–1431 (2003)
https://doi.org/10.1063/1.1534629
Free volume coalescence and void formation in shear bands in metallic glass
J. Appl. Phys. 93, 1432–1437 (2003)
https://doi.org/10.1063/1.1531212
Effect of implant temperature on defects created using high fluence of helium in silicon
J. Appl. Phys. 93, 1438–1442 (2003)
https://doi.org/10.1063/1.1531814
Tensile failure by grain thinning in micromachined aluminum thin films
J. Appl. Phys. 93, 1443–1451 (2003)
https://doi.org/10.1063/1.1532933
Diffusion of Si and Ge dimers on Ge (001) surfaces
J. Appl. Phys. 93, 1452–1456 (2003)
https://doi.org/10.1063/1.1533107
Quantitative microdiffraction from deformed crystals with unpaired dislocations and dislocation walls
J. Appl. Phys. 93, 1457–1464 (2003)
https://doi.org/10.1063/1.1534378
Photoluminescence study of crosslinked reactive mesogens for organic light emitting devices
J. Appl. Phys. 93, 1465–1467 (2003)
https://doi.org/10.1063/1.1533830
Formation of light-emitting in Fe thin films on ion-implanted (111)Si
J. Appl. Phys. 93, 1468–1471 (2003)
https://doi.org/10.1063/1.1534379
Morphology and crystallization kinetics in thin films grown by atomic layer deposition
M.-Y. Ho; H. Gong; G. D. Wilk; B. W. Busch; M. L. Green; P. M. Voyles; D. A. Muller; M. Bude; W. H. Lin; A. See; M. E. Loomans; S. K. Lahiri; Petri I. Räisänen
J. Appl. Phys. 93, 1477–1481 (2003)
https://doi.org/10.1063/1.1534381
Effect of elastic anisotropy on the elastic fields and vertical alignment of quantum dots
J. Appl. Phys. 93, 1487–1492 (2003)
https://doi.org/10.1063/1.1535730
Interface stability during the growth of films on Si(001)
J. Appl. Phys. 93, 1498–1504 (2003)
https://doi.org/10.1063/1.1534909
Recalescence after bulk solidification in germanium films melted by ns laser pulses
J. Appl. Phys. 93, 1505–1510 (2003)
https://doi.org/10.1063/1.1534374
Preparation of different BeTe surface reconstructions by decapping and thermal treatment
J. Appl. Phys. 93, 1511–1514 (2003)
https://doi.org/10.1063/1.1532932
Hardness and Young’s modulus of high-quality cubic boron nitride films grown by chemical vapor deposition
J. Appl. Phys. 93, 1515–1519 (2003)
https://doi.org/10.1063/1.1534625
Formation of face-centered-cubic titanium by mechanical attrition
J. Appl. Phys. 93, 1520–1524 (2003)
https://doi.org/10.1063/1.1530718
Loss rate of a plasticizer in a nylon matrix calculated using macroscopic reaction–diffusion kinetics
J. Appl. Phys. 93, 1525–1532 (2003)
https://doi.org/10.1063/1.1535230
Strong enhancement of the photoluminescence efficiency from InAs quantum dots
J. Appl. Phys. 93, 1533–1536 (2003)
https://doi.org/10.1063/1.1527706
Diluted magnetic semiconductor of p-type GaN epilayers implanted with ions
J. Appl. Phys. 93, 1546–1549 (2003)
https://doi.org/10.1063/1.1536735
Surfactant effect of In for AlGaN growth by plasma-assisted molecular beam epitaxy
E. Monroy; B. Daudin; E. Bellet-Amalric; N. Gogneau; D. Jalabert; F. Enjalbert; J. Brault; J. Barjon; Le Si Dang
J. Appl. Phys. 93, 1550–1556 (2003)
https://doi.org/10.1063/1.1535734
Cohesive failure of thin layers of soft model adhesives under tension
J. Appl. Phys. 93, 1557–1566 (2003)
https://doi.org/10.1063/1.1533095
ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73)
Reassessment of the intrinsic carrier density in crystalline silicon in view of band-gap narrowing
J. Appl. Phys. 93, 1598–1604 (2003)
https://doi.org/10.1063/1.1529297
Transparent thin film transistors using ZnO as an active channel layer and their electrical properties
J. Appl. Phys. 93, 1624–1630 (2003)
https://doi.org/10.1063/1.1534627
The influence of mechanical rubbing on the field-effect mobility in polyhexylthiophene
J. Appl. Phys. 93, 1636–1641 (2003)
https://doi.org/10.1063/1.1530720
Multisubband transport of the two-dimensional electron gas in heterostructures
Z. W. Zheng; B. Shen; C. P. Jiang; Y. S. Gui; T. Someya; R. Zhang; Y. Shi; Y. D. Zheng; S. L. Guo; J. H. Chu; Y. Arakawa
J. Appl. Phys. 93, 1651–1655 (2003)
https://doi.org/10.1063/1.1536720
MAGNETISM AND SUPERCONDUCTIVITY (PACS 74-76)
Effect of Pt buffer layer on structural and magnetic properties of FePt thin films
J. Appl. Phys. 93, 1661–1665 (2003)
https://doi.org/10.1063/1.1531817
Microstructural evolutions in converting epitaxial thin films to epitaxial thin films
J. Appl. Phys. 93, 1666–1671 (2003)
https://doi.org/10.1063/1.1529305
DIELECTRICS AND FERROELECTRICITY (PACS 77)
Dielectric permittivity of thin films in dependence on the ambient hydrogen pressure
J. Appl. Phys. 93, 1684–1690 (2003)
https://doi.org/10.1063/1.1532939
Properties of La-silicate high-K dielectric films formed by oxidation of La on silicon
J. Appl. Phys. 93, 1691–1696 (2003)
https://doi.org/10.1063/1.1531818
Dielectric properties of single crystals grown by the Czochralski method
J. Appl. Phys. 93, 1697–1700 (2003)
https://doi.org/10.1063/1.1530363
Features of diffuse phase transition in lead barium niobate ferroelectric ceramics
J. Appl. Phys. 93, 1701–1706 (2003)
https://doi.org/10.1063/1.1530366
Preparation of thin films by metalorganic chemical vapor deposition for low voltage ferroelectric memory
S. R. Gilbert; S. Hunter; D. Ritchey; C. Chi; D. V. Taylor; J. Amano; S. Aggarwal; T. S. Moise; T. Sakoda; S. R. Summerfelt; K. K. Singh; C. Kazemi; D. Carl; B. Bierman
J. Appl. Phys. 93, 1713–1717 (2003)
https://doi.org/10.1063/1.1534380
Radio frequency magnetron sputtering deposition of hetero-epitaxial strontium barium niobate thin films
J. Appl. Phys. 93, 1718–1724 (2003)
https://doi.org/10.1063/1.1535749
Thickness dependence of leakage current behavior in epitaxial film capacitors
J. Appl. Phys. 93, 1725–1730 (2003)
https://doi.org/10.1063/1.1535750
Phase transitional studies of polycrystalline films using Raman scattering
J. Appl. Phys. 93, 1731–1734 (2003)
https://doi.org/10.1063/1.1534626
Reversible and irreversible polarization processes in ferroelectric ceramics and thin films
J. Appl. Phys. 93, 1735–1742 (2003)
https://doi.org/10.1063/1.1535748
Polarization recovery of fatigued thin films: Switching current studies
J. Appl. Phys. 93, 1743–1747 (2003)
https://doi.org/10.1063/1.1536019
NANOSCALE SCIENCE AND DESIGN
Crystallization behavior of amorphous Fe–P strengthened with embedded carbon nanotubes
J. Appl. Phys. 93, 1748–1752 (2003)
https://doi.org/10.1063/1.1535239
Influence of surface states on the photoluminescence from silicon nanostructures
J. Appl. Phys. 93, 1753–1759 (2003)
https://doi.org/10.1063/1.1535254
Micro-Raman and infrared properties of nanobelts synthesized from Sn and powders
J. Appl. Phys. 93, 1760–1763 (2003)
https://doi.org/10.1063/1.1534903
High open-circuit voltage photovoltaic devices from carbon-nanotube-polymer composites
J. Appl. Phys. 93, 1764–1768 (2003)
https://doi.org/10.1063/1.1535231
Orientation of single-walled carbon nanotubes by uniaxial pressure
J. Appl. Phys. 93, 1769–1773 (2003)
https://doi.org/10.1063/1.1534905
Effect of structural parameter on field emission properties of semiconducting copper sulphide nanowire films
J. Appl. Phys. 93, 1774–1777 (2003)
https://doi.org/10.1063/1.1536739
DEVICE PHYSICS (PACS 85)
Role of halogens in the mechanism of sensitization of uncooled PbSe infrared photodetectors
M. C. Torquemada; M. T. Rodrigo; G. Vergara; F. J. Sánchez; R. Almazán; M. Verdú; P. Rodrı́guez; V. Villamayor; L. J. Gómez; M. T. Montojo; A. Muñoz
J. Appl. Phys. 93, 1778–1784 (2003)
https://doi.org/10.1063/1.1534907
Plasma enhanced chemical vapor deposited SiCOH dielectrics: from low-k to extreme low-k interconnect materials
J. Appl. Phys. 93, 1785–1790 (2003)
https://doi.org/10.1063/1.1534628
INTERDISCIPLINARY AND GENERAL PHYSICS (PACS 1-41, 43-47, 79, 81-84, 89-99)
Laser shadowgraph measurements of electromagnetically-driven cylindrical shock-wave implosions in water
J. Appl. Phys. 93, 1791–1797 (2003)
https://doi.org/10.1063/1.1535253
Emission of neutral Mg from single crystal MgO during abrasion with diamond
J. Appl. Phys. 93, 1819–1825 (2003)
https://doi.org/10.1063/1.1532937
Molecular dynamics simulations of sticking on carbon surfaces
J. Appl. Phys. 93, 1826–1831 (2003)
https://doi.org/10.1063/1.1536012
Near-ground detection of atmospheric γ rays associated with lightning
J. Appl. Phys. 93, 1839–1844 (2003)
https://doi.org/10.1063/1.1536731
COMMUNICATIONS
Magnetic-field effects in defect-controlled ferromagnetic semiconductors
J. Appl. Phys. 93, 1845–1847 (2003)
https://doi.org/10.1063/1.1534622
Facet temperature reduction by a current blocking layer at the front facets of high-power InGaAs/AlGaAs lasers
J. Appl. Phys. 93, 1848–1850 (2003)
https://doi.org/10.1063/1.1531839
Giant Hall effect in granular alloy films
J. Appl. Phys. 93, 1851–1853 (2003)
https://doi.org/10.1063/1.1536719
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Scaling effects on the microstructure and thermomechanical response of through silicon vias (TSVs)
Shuhang Lyu, Thomas Beechem, et al.