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Issues
15 March 2002
ISSN 0021-8979
EISSN 1089-7550
In this Issue
LASERS, OPTICS, AND OPTOELECTRONICS (PACS 42)
Large absolute and polarization-independent photonic band gaps for various lattice structures and rod shapes
J. Appl. Phys. 91, 3501–3510 (2002)
https://doi.org/10.1063/1.1450022
Raman spectra of fluorine-doped silica glasses with various fictive temperatures
J. Appl. Phys. 91, 3522–3525 (2002)
https://doi.org/10.1063/1.1452779
PLASMAS AND ELECTRICAL DISCHARGES (PACS 51-52)
Cross-section set and chemistry model for the simulation of plasma discharges
J. Appl. Phys. 91, 3530–3538 (2002)
https://doi.org/10.1063/1.1448894
Modeling argon inductively coupled plasmas: The electron energy distribution function and metastable kinetics
J. Appl. Phys. 91, 3539–3546 (2002)
https://doi.org/10.1063/1.1452772
STRUCTURAL, MECHANICAL THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER (PACS 61-68, 78)
Surface morphology and crystal quality of low resistive indium tin oxide grown on yittria-stabilized zirconia
J. Appl. Phys. 91, 3547–3550 (2002)
https://doi.org/10.1063/1.1448873
Low-temperature dependence of midinfrared optical constants of lead–germanium–telluride thin film
J. Appl. Phys. 91, 3556–3561 (2002)
https://doi.org/10.1063/1.1448866
Amorphization and annealing of single crystal irradiated with ions at 77 K
J. Appl. Phys. 91, 3562–3568 (2002)
https://doi.org/10.1063/1.1450023
Study of argon characteristics in ion physical vapor deposition using molecular dynamics simulation
J. Appl. Phys. 91, 3569–3578 (2002)
https://doi.org/10.1063/1.1450032
Hydrogen-mediated quenching of strain-induced surface roughening during gas-source molecular beam epitaxy of fully-coherent layers on Si(001)
T. Spila; P. Desjardins; A. Vailionis; H. Kim; N. Taylor; D. G. Cahill; J. E. Greene; S. Guillon; R. A. Masut
J. Appl. Phys. 91, 3579–3588 (2002)
https://doi.org/10.1063/1.1448680
Epitaxial growth and characterization of crystallographic polytypes
B. J. Stanbery; S. Kincal; S. Kim; C. H. Chang; S. P. Ahrenkiel; G. Lippold; H. Neumann; T. J. Anderson; O. D. Crisalle
J. Appl. Phys. 91, 3598–3604 (2002)
https://doi.org/10.1063/1.1446234
X-ray beam induced current—a synchrotron radiation based technique for the in situ analysis of recombination properties and chemical nature of metal clusters in silicon
O. F. Vyvenko; T. Buonassisi; A. A. Istratov; H. Hieslmair; A. C. Thompson; R. Schindler; E. R. Weber
J. Appl. Phys. 91, 3614–3617 (2002)
https://doi.org/10.1063/1.1450026
Anisotropic thermal expansion of
Bing Teng; Zhengping Wang; Huaidong Jiang; Xiufeng Cheng; Hong Liu; Xiaobo Hu; Shengming Dong; Jiyang Wang; Zongshu Shao
J. Appl. Phys. 91, 3618–3620 (2002)
https://doi.org/10.1063/1.1450256
Excitonic line broadening in PbSrSe thin films grown by molecular beam epitaxy
J. Appl. Phys. 91, 3621–3625 (2002)
https://doi.org/10.1063/1.1448897
Effect of low-energy ion beam bombardment on silicate glass thin films studied by x-ray photoelectron spectroscopy
J. Appl. Phys. 91, 3626–3631 (2002)
https://doi.org/10.1063/1.1450027
Model for the phase transition in phthalocyanine thin films
J. Appl. Phys. 91, 3632–3636 (2002)
https://doi.org/10.1063/1.1446218
Observation of oscillating behavior in the reflectance difference spectra of oxidized Si(001) surfaces
Tatsuo Matsudo; Tomohiro Ohta; Tetsuji Yasuda; Masayasu Nishizawa; Noriyuki Miyata; Satoshi Yamasaki; Alexander A. Shklyaev; Masakazu Ichikawa
J. Appl. Phys. 91, 3637–3643 (2002)
https://doi.org/10.1063/1.1452764
C lattice site distributions in metastable alloys grown on Ge(001) by molecular-beam epitaxy
J. Appl. Phys. 91, 3644–3652 (2002)
https://doi.org/10.1063/1.1448677
Stress-induced and electromigration voiding in aluminum interconnects passivated with silicon nitride
J. Appl. Phys. 91, 3653–3657 (2002)
https://doi.org/10.1063/1.1450034
Growth and electrical characterization of epilayers formed by channeled ion beam synthesis
J. Appl. Phys. 91, 3664–3668 (2002)
https://doi.org/10.1063/1.1448408
Imaging of neutron incoherent scattering from hydrogen in metals
J. Appl. Phys. 91, 3669–3674 (2002)
https://doi.org/10.1063/1.1452769
ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73)
Influence of Sb, Bi, Tl, and B on the incorporation of N in GaAs
J. Appl. Phys. 91, 3687–3692 (2002)
https://doi.org/10.1063/1.1450053
Penetration of the electromagnetic waves through doped lanthanum manganites
J. Appl. Phys. 91, 3693–3697 (2002)
https://doi.org/10.1063/1.1448883
Thermoelectric properties of the n-type filled skutterudite doped with Ni
J. Appl. Phys. 91, 3698–3705 (2002)
https://doi.org/10.1063/1.1450036
Low-frequency noise in GaN thin films deposited by rf-plasma assisted molecular-beam epitaxy
J. Appl. Phys. 91, 3706–3710 (2002)
https://doi.org/10.1063/1.1436288
Environmental and thermal aging of Au/Ni/p-GaN ohmic contacts annealed in air
J. Appl. Phys. 91, 3711–3716 (2002)
https://doi.org/10.1063/1.1448885
Free electron distribution in AlGaN/GaN heterojunction field-effect transistors
J. Appl. Phys. 91, 3721–3729 (2002)
https://doi.org/10.1063/1.1452773
Monte Carlo calculation of two-dimensional electron dynamics in GaN–AlGaN heterostructures
J. Appl. Phys. 91, 3730–3736 (2002)
https://doi.org/10.1063/1.1448889
Interstitial boron and oxygen related defects as the origin of the deep energy level in Czochralski-grown silicon
J. Appl. Phys. 91, 3741–3744 (2002)
https://doi.org/10.1063/1.1445499
Direct imaging of a biased junction with conductance mapping
J. Appl. Phys. 91, 3745–3749 (2002)
https://doi.org/10.1063/1.1453507
MAGNETISM AND SUPERCONDUCTIVITY (PACS 74-76)
Influence of interstitial nitrogen on the structural and magnetic properties of multilayers
J. Appl. Phys. 91, 3750–3758 (2002)
https://doi.org/10.1063/1.1450259
Magnetic properties of Nd–Fe–Co(Cu)–Al–B amorphous alloys prepared by nonequilibrium techniques
J. Appl. Phys. 91, 3764–3768 (2002)
https://doi.org/10.1063/1.1448884
Effects of C content on the formation and magnetic properties of nanocomposite magnets
J. Appl. Phys. 91, 3769–3774 (2002)
https://doi.org/10.1063/1.1450037
Overcritical Meissner current densities in films in soft magnetic environments
J. Appl. Phys. 91, 3775–3778 (2002)
https://doi.org/10.1063/1.1454221
DIELECTRICS AND FERROELECTRICITY (PACS 77)
Microstructure and electric properties of lead lanthanum titanate thin film under transverse electric fields
J. Appl. Phys. 91, 3779–3784 (2002)
https://doi.org/10.1063/1.1448867
Elastic and piezoelectric fields around a quantum dot: Fully coupled or semicoupled model?
J. Appl. Phys. 91, 3785–3796 (2002)
https://doi.org/10.1063/1.1448869
Scanning force microscopy of domain structures in and
J. Appl. Phys. 91, 3797–3805 (2002)
https://doi.org/10.1063/1.1446655
Domain polarity and temperature induced potential inversion on the surface
J. Appl. Phys. 91, 3816–3823 (2002)
https://doi.org/10.1063/1.1446230
NANOSCALE SCIENCE AND DESIGN
Nanowear in scanning force microscopy: Information on deposits formed in and downstream of a hexane plasma
J. Appl. Phys. 91, 3841–3846 (2002)
https://doi.org/10.1063/1.1446220
Carbon nanotubes synthesized by Ni-assisted atmospheric pressure thermal chemical vapor deposition
J. Appl. Phys. 91, 3847–3854 (2002)
https://doi.org/10.1063/1.1448877
DEVICE PHYSICS (PACS 85)
Extraction of trap states in laser-crystallized polycrystalline-silicon thin-film transistors and analysis of degradation by self-heating
Mutsumi Kimura; Satoshi Inoue; Tatsuya Shimoda; Simon W.-B. Tam; O. K. Basil Lui; Piero Migliorato; Ryoichi Nozawa
J. Appl. Phys. 91, 3855–3858 (2002)
https://doi.org/10.1063/1.1446238
Origin of the bimodal distribution of low-pressure metal-organic-vapor-phase-epitaxy grown InGaAs/GaAs quantum dots
J. Appl. Phys. 91, 3859–3863 (2002)
https://doi.org/10.1063/1.1448887
Characterization of the hot electron distribution function using six moments
J. Appl. Phys. 91, 3869–3879 (2002)
https://doi.org/10.1063/1.1450257
Theoretical analysis of an anisotropic metal–semiconductor–metal optoelectronic mixer
J. Appl. Phys. 91, 3880–3890 (2002)
https://doi.org/10.1063/1.1448676
Improved interfaces and magnetic properties in spin valves using seed layer
J. Appl. Phys. 91, 3891–3895 (2002)
https://doi.org/10.1063/1.1448892
INTERDISCIPLINARY AND GENERAL PHYSICS (PACS 1-41, 43-47, 79, 81-84, 89-99)
Hydrogen detection on bare between metal gates
J. Appl. Phys. 91, 3896–3903 (2002)
https://doi.org/10.1063/1.1450025
Patterned heteroepitaxial processing applied to ZnSe and on GaAs (001)
J. Appl. Phys. 91, 3912–3917 (2002)
https://doi.org/10.1063/1.1446227
Electron field emission from diamond-like carbon films and a patterned array by using a Ti interfacial layer
J. Appl. Phys. 91, 3918–3921 (2002)
https://doi.org/10.1063/1.1448405
COMMUNICATIONS
Effects of intentionally introduced hydrogen on the electrical properties of ZnO layers grown by metalorganic chemical vapor deposition
Bertrand Theys; Vincent Sallet; François Jomard; Alain Lusson; Jean-François Rommeluère; Zéphyrin Teukam
J. Appl. Phys. 91, 3922–3924 (2002)
https://doi.org/10.1063/1.1452778
Self-assembled InAs quantum wires on InP(001)
J. Appl. Phys. 91, 3925–3927 (2002)
https://doi.org/10.1063/1.1448862
Application of positron annihilation lifetime technique to the study of deep level transients in semiconductors
J. Appl. Phys. 91, 3931–3933 (2002)
https://doi.org/10.1063/1.1436551
Study on bias-enhanced nucleation of diamonds by simulating the time dependence of bias current
J. Appl. Phys. 91, 3934–3936 (2002)
https://doi.org/10.1063/1.1452780
Near-field photocurrent measurements on boron-implanted silicon
J. Appl. Phys. 91, 3937–3939 (2002)
https://doi.org/10.1063/1.1446654
X-ray spectrometry investigation of electrical isolation in GaN
J. Appl. Phys. 91, 3940–3942 (2002)
https://doi.org/10.1063/1.1452759
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
GaN-based power devices: Physics, reliability, and perspectives
Matteo Meneghini, Carlo De Santi, et al.
Celebrating notable advances in compound semiconductors: A tribute to Dr. Wladyslaw Walukiewicz
Kirstin Alberi, Junqiao Wu, et al.