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Issues
15 February 2002
ISSN 0021-8979
EISSN 1089-7550
In this Issue
APPLIED PHYSICS REVIEWS
LASERS, OPTICS, AND OPTOELECTRONICS (PACS 42)
Stimulated emission, excited state absorption, and laser modeling of the laser system
J. Appl. Phys. 91, 1754–1760 (2002)
https://doi.org/10.1063/1.1428795
PLASMAS AND ELECTRICAL DISCHARGES (PACS 51-52)
Feasibility study of a low pressure barium discharge lamp
J. Appl. Phys. 91, 1772–1779 (2002)
https://doi.org/10.1063/1.1429789
Fiber optic diagnostic techniques applied to electrical discharge machining sparks
J. Appl. Phys. 91, 1780–1786 (2002)
https://doi.org/10.1063/1.1425449
Characterization of inductively coupled plasma in the ionized physical vapor deposition system
J. Appl. Phys. 91, 1797–1803 (2002)
https://doi.org/10.1063/1.1430897
Inductively coupled plasmas sustained by an internal oscillating current
J. Appl. Phys. 91, 1804–1813 (2002)
https://doi.org/10.1063/1.1430893
Numerical investigation of thermophoretic effects on cluster transport during thermal plasma deposition process
J. Appl. Phys. 91, 1814–1818 (2002)
https://doi.org/10.1063/1.1433182
STRUCTURAL, MECHANICAL THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER (PACS 61-68, 78)
formed by Si implantation into p-GaN
J. Appl. Phys. 91, 1845–1848 (2002)
https://doi.org/10.1063/1.1432118
Acoustic study of dislocation rearrangement at later stages of fatigue: Noncontact prediction of remaining life
J. Appl. Phys. 91, 1849–1854 (2002)
https://doi.org/10.1063/1.1433178
Quantum mechanical behavior of an H atom on Cu(111) and Pt(111)
J. Appl. Phys. 91, 1855–1859 (2002)
https://doi.org/10.1063/1.1432480
Evidence of the influence of phonon density on upconversion luminescence in tellurite and germanate glasses
J. Appl. Phys. 91, 1871–1874 (2002)
https://doi.org/10.1063/1.1429762
Terahertz photomixing in quantum well structures using resonant excitation of plasma oscillations
J. Appl. Phys. 91, 1875–1881 (2002)
https://doi.org/10.1063/1.1431436
Governing parameter for electromigration damage in the polycrystalline line covered with a passivation layer
J. Appl. Phys. 91, 1882–1890 (2002)
https://doi.org/10.1063/1.1432120
Violet/blue emission from hydrogenated amorphous carbon films deposited from energetic ions and ion bombardment
J. Appl. Phys. 91, 1891–1893 (2002)
https://doi.org/10.1063/1.1428086
Physical integrated diffusion-oxidation model for implanted nitrogen in silicon
J. Appl. Phys. 91, 1894–1900 (2002)
https://doi.org/10.1063/1.1430537
Mechanism of the structural phase transformations in epitaxial switchable mirrors
J. Appl. Phys. 91, 1901–1909 (2002)
https://doi.org/10.1063/1.1431427
High energy ion beam studies of ion exchange in a glass
V. Shutthanandan; D. R. Baer; S. Thevuthasan; E. M. Adams; S. Maheswaran; M. H. Engelhard; J. P. Icenhower; B. P. McGrail
J. Appl. Phys. 91, 1910–1920 (2002)
https://doi.org/10.1063/1.1432119
Dynamic high-strain-rate mechanical behavior of microstructurally biased two-phase ceramics
J. Appl. Phys. 91, 1921–1927 (2002)
https://doi.org/10.1063/1.1429770
Modeling cross-hatch surface morphology in growing mismatched layers
J. Appl. Phys. 91, 1933–1943 (2002)
https://doi.org/10.1063/1.1428091
Structure, surface composition, and electronic properties of and
J. Appl. Phys. 91, 1952–1956 (2002)
https://doi.org/10.1063/1.1421210
High-temperature healing of interfacial voids in GaAs wafer bonding
J. Appl. Phys. 91, 1973–1977 (2002)
https://doi.org/10.1063/1.1430888
Epitaxial growth of on GaAs(110)
J. Appl. Phys. 91, 1978–1983 (2002)
https://doi.org/10.1063/1.1434549
Stress hysteresis during thermal cycling of plasma-enhanced chemical vapor deposited silicon oxide films
J. Appl. Phys. 91, 1988–1992 (2002)
https://doi.org/10.1063/1.1432773
Enhancement of exciton binding energies in ZnO/ZnMgO multiquantum wells
J. Appl. Phys. 91, 1993–1997 (2002)
https://doi.org/10.1063/1.1445280
Positron-annihilation study of compensation defects in InP
J. Appl. Phys. 91, 1998–2001 (2002)
https://doi.org/10.1063/1.1428796
Effects of absorption and desorption on the chemical stress field
J. Appl. Phys. 91, 2002–2008 (2002)
https://doi.org/10.1063/1.1433177
Excitation spectra of nitrogen bound excitons in 4H- and 6H-SiC
J. Appl. Phys. 91, 2028–2032 (2002)
https://doi.org/10.1063/1.1431437
Development of texture in TiN films by use of in situ synchrotron x-ray scattering
J. Appl. Phys. 91, 2037–2044 (2002)
https://doi.org/10.1063/1.1436558
Effect of temperature on nonlinear optical properties of composite media with shape distribution
J. Appl. Phys. 91, 2045–2050 (2002)
https://doi.org/10.1063/1.1436555
Improving diamond–metal adhesion with graded TiCN interlayers
J. Appl. Phys. 91, 2051–2054 (2002)
https://doi.org/10.1063/1.1434546
ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73)
Lifetime spectroscopy for defect characterization: Systematic analysis of the possibilities and restrictions
J. Appl. Phys. 91, 2059–2070 (2002)
https://doi.org/10.1063/1.1428095
Optical properties of 4H–SiC
R. Ahuja; A. Ferreira da Silva; C. Persson; J. M. Osorio-Guillén; I. Pepe; K. Järrendahl; O. P. A. Lindquist; N. V. Edwards; Q. Wahab; B. Johansson
J. Appl. Phys. 91, 2099–2103 (2002)
https://doi.org/10.1063/1.1429766
Theory of magnetic-field enhancement of surface-field terahertz emission
J. Appl. Phys. 91, 2104–2106 (2002)
https://doi.org/10.1063/1.1433187
Simulated current response in avalanche photodiodes
J. Appl. Phys. 91, 2107–2111 (2002)
https://doi.org/10.1063/1.1432122
Carrier doping into epitaxial thin films by proton implantation
J. Appl. Phys. 91, 2112–2117 (2002)
https://doi.org/10.1063/1.1418425
Si δ-doped GaAs structure with different dopant distribution models
J. Appl. Phys. 91, 2118–2122 (2002)
https://doi.org/10.1063/1.1424051
Low voltage stress induced leakage currents and surface states in ultrathin (1.2–2.5 nm) oxides
J. Appl. Phys. 91, 2123–2132 (2002)
https://doi.org/10.1063/1.1430536
Electrical, structural and microstructural characteristics of as-deposited and annealed Pt and Au contacts on chemical-vapor-cleaned GaN thin films
E. A. Preble; K. M. Tracy; S. Kiesel; H. McLean; P. Q. Miraglia; R. J. Nemanich; R. F. Davis; M. Albrecht; David J. Smith
J. Appl. Phys. 91, 2133–2137 (2002)
https://doi.org/10.1063/1.1432127
Effects of P doping on the thermoelectric properties of
J. Appl. Phys. 91, 2138–2142 (2002)
https://doi.org/10.1063/1.1436302
Noise characteristics and modeling of silicon-on-insulator insulated-gate pn-junction devices
J. Appl. Phys. 91, 2143–2148 (2002)
https://doi.org/10.1063/1.1433930
Electrical transport properties in and or Ga) around room temperature
J. Appl. Phys. 91, 2149–2154 (2002)
https://doi.org/10.1063/1.1432123
Origin of substrate hole current after gate oxide breakdown
J. Appl. Phys. 91, 2155–2160 (2002)
https://doi.org/10.1063/1.1434550
MAGNETISM AND SUPERCONDUCTIVITY (PACS 74-76)
Structural and magnetic properties of compounds
J. L. Wang; N. Tang; Y. P. Shen; D. Yang; B. Fuquan; G. H. Wu; F. M. Yang; F. R. de Boer; E. Brück; K. H. J. Buschow
J. Appl. Phys. 91, 2165–2171 (2002)
https://doi.org/10.1063/1.1425441
Thermal stability of spin valve sensors using artificial CoFe/Ir based ferrimagnets
J. Appl. Phys. 91, 2172–2175 (2002)
https://doi.org/10.1063/1.1432483
Use of a permanent magnet in the synthetic antiferromagnet of a spin-valve
J. Appl. Phys. 91, 2176–2179 (2002)
https://doi.org/10.1063/1.1433937
Ferromagnetic resonance and exchange anisotropy in ferromagnetic/antiferromagnetic bilayers
J. Appl. Phys. 91, 2180–2185 (2002)
https://doi.org/10.1063/1.1433927
Microstructure and magnetization reversal in nanocomposite magnets
J. Appl. Phys. 91, 2192–2196 (2002)
https://doi.org/10.1063/1.1433940
A directional magnetization potential based model of magnetoelastic hysteresis
J. Appl. Phys. 91, 2202–2210 (2002)
https://doi.org/10.1063/1.1431433
Current-assisted annealing effect in
J. Appl. Phys. 91, 2216–2219 (2002)
https://doi.org/10.1063/1.1433939
Observation of in plane magnetization reversal using polarization dependent magneto-optic Kerr effect
J. Appl. Phys. 91, 2228–2231 (2002)
https://doi.org/10.1063/1.1427412
The thickness dependence of the effect of pressures on magnetic and electronic properties of thin films of
J. Appl. Phys. 91, 2232–2235 (2002)
https://doi.org/10.1063/1.1432770
Micromagnetic study of subnanosecond magnetic switching in perpendicular multilayers
J. Appl. Phys. 91, 2236–2242 (2002)
https://doi.org/10.1063/1.1432481
DIELECTRICS AND FERROELECTRICITY (PACS 77)
Stacking faults and their effects on ferroelectric properties in strontium bismuth tantalate
J. Appl. Phys. 91, 2255–2261 (2002)
https://doi.org/10.1063/1.1431428
Brillouin and dielectric studies of the phase transition in the relaxor ferroelectric
J. Appl. Phys. 91, 2262–2266 (2002)
https://doi.org/10.1063/1.1433183
Low-frequency and microwave performances of laser-ablated epitaxial films on high-resistivity substrates
J. Appl. Phys. 91, 2267–2276 (2002)
https://doi.org/10.1063/1.1430545
Dielectric and optical properties of and superlattices
J. Appl. Phys. 91, 2284–2289 (2002)
https://doi.org/10.1063/1.1433180
Enhancement of remanent polarization in epitaxial superlattices with “asymmetric” structure
J. Appl. Phys. 91, 2290–2294 (2002)
https://doi.org/10.1063/1.1434547
Effect of thermal expansion mismatch on the dielectric peak temperature of thin film relaxors
J. Appl. Phys. 91, 2295–2301 (2002)
https://doi.org/10.1063/1.1429761
NANOSCALE SCIENCE AND DESIGN
Theory of local optical spectroscopy of quantum wires with interface fluctuations
J. Appl. Phys. 91, 2302–2307 (2002)
https://doi.org/10.1063/1.1424049
Optical properties of undoped and Gd-doped nanocrystalline thin films
J. Appl. Phys. 91, 2308–2314 (2002)
https://doi.org/10.1063/1.1430890
Band-gap tuning of PbS nanoparticles by in-flight sintering of size classified aerosols
J. Appl. Phys. 91, 2315–2321 (2002)
https://doi.org/10.1063/1.1431429
Structural and optical properties of silicon–germanium alloy nanoparticles
J. Appl. Phys. 91, 2322–2325 (2002)
https://doi.org/10.1063/1.1433185
Characterization of nanometer As-clusters in low-temperature grown GaAs by transient reflectivity measurements
J. Appl. Phys. 91, 2333–2336 (2002)
https://doi.org/10.1063/1.1430886
Crystallographic and magnetic properties of nanocrystalline alloys
J. Appl. Phys. 91, 2337–2342 (2002)
https://doi.org/10.1063/1.1433932
DEVICE PHYSICS (PACS 85)
Two-dimensional quantum mechanical modeling of nanotransistors
J. Appl. Phys. 91, 2343–2354 (2002)
https://doi.org/10.1063/1.1432117
A method of noncontact suspension of rotating bodies using electromagnetic forces
J. Appl. Phys. 91, 2355–2371 (2002)
https://doi.org/10.1063/1.1430894
Characterization of heterojunction diodes with hydride vapor phase epitaxy grown AlGaN on 4H–SiC
J. Appl. Phys. 91, 2372–2379 (2002)
https://doi.org/10.1063/1.1430892
Numerical simulations of stress induced void evolution and growth in interconnects
J. Appl. Phys. 91, 2380–2390 (2002)
https://doi.org/10.1063/1.1428097
Thermal annealing study of 1 MeV electron-irradiation-induced defects in InGaP diodes and solar cells
J. Appl. Phys. 91, 2391–2397 (2002)
https://doi.org/10.1063/1.1433936
High frequency characterization of a GaInAs/InP electronic waveguide T-branch switch
J. Appl. Phys. 91, 2398–2402 (2002)
https://doi.org/10.1063/1.1429801
Improvement of the discharge efficiency in plasma displays
J. Appl. Phys. 91, 2403–2408 (2002)
https://doi.org/10.1063/1.1430896
Using computer modeling analysis in single junction a-SiGe:H solar cells
J. Appl. Phys. 91, 2409–2416 (2002)
https://doi.org/10.1063/1.1435416
Fast pulsed electroluminescence from polymer light-emitting diodes
J. Appl. Phys. 91, 2417–2422 (2002)
https://doi.org/10.1063/1.1434545
Polymorphous hydrogenated silicon Schottky diodes: Properties under illumination
J. Appl. Phys. 91, 2423–2428 (2002)
https://doi.org/10.1063/1.1433934
Memory device applications of a conjugated polymer: Role of space charges
J. Appl. Phys. 91, 2433–2437 (2002)
https://doi.org/10.1063/1.1445281
INTERDISCIPLINARY AND GENERAL PHYSICS (PACS 1-41, 43-47, 79, 81-84, 89-99)
elastic scattering near the Coulomb barrier and optical model parameters
J. Appl. Phys. 91, 2438–2442 (2002)
https://doi.org/10.1063/1.1427434
Rapid thermal oxidation of radio frequency sputtered polycrystalline silicon germanium films
J. Appl. Phys. 91, 2443–2448 (2002)
https://doi.org/10.1063/1.1431435
Production of carbon clusters by laser ablation of polymers in vacuum
J. Appl. Phys. 91, 2449–2454 (2002)
https://doi.org/10.1063/1.1434548
Analysis of residual stress in diamond films by x-ray diffraction and micro-Raman spectroscopy
J. Appl. Phys. 91, 2466–2472 (2002)
https://doi.org/10.1063/1.1431431
General parameterization of Auger recombination in crystalline silicon
J. Appl. Phys. 91, 2473–2480 (2002)
https://doi.org/10.1063/1.1432476
Theory of the lifetime of the MgO protecting layer in ac plasma display panels
J. Appl. Phys. 91, 2487–2492 (2002)
https://doi.org/10.1063/1.1433928
Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques
J. Appl. Phys. 91, 2493–2498 (2002)
https://doi.org/10.1063/1.1429800
Rapid, reversible, sensitive porous silicon gas sensor
J. Appl. Phys. 91, 2519–2523 (2002)
https://doi.org/10.1063/1.1436556
Multiqubit computing and error-avoiding codes in subspace using quantum dots
J. Appl. Phys. 91, 2524–2529 (2002)
https://doi.org/10.1063/1.1436289
Breakdown threshold and localized electron density in water induced by ultrashort laser pulses
J. Appl. Phys. 91, 2530–2536 (2002)
https://doi.org/10.1063/1.1433929
Stability of an oscillating tip in noncontact atomic force microscopy: Theoretical and numerical investigations
J. Appl. Phys. 91, 2537–2543 (2002)
https://doi.org/10.1063/1.1428084
COMMUNICATIONS
Two-dimensional lateral superlattices of nanostructures: Nonlithographic formation by anodic membrane template
J. Appl. Phys. 91, 2544–2546 (2002)
https://doi.org/10.1063/1.1433173
Largely tunable midinfrared (8–12 μm) difference frequency generation in isotropic semiconductors
J. Appl. Phys. 91, 2550–2552 (2002)
https://doi.org/10.1063/1.1435412
ERRATA
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Selecting alternative metals for advanced interconnects
Jean-Philippe Soulié, Kiroubanand Sankaran, et al.
Defects in semiconductors
Cyrus E. Dreyer, Anderson Janotti, et al.