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APPLIED PHYSICS REVIEWS

Transient enhanced diffusion of boron in Si

S. C. Jain; W. Schoenmaker; R. Lindsay; P. A. Stolk; S. Decoutere; M. Willander; H. E. Maes

J. Appl. Phys. 91, 8919–8941 (2002) https://doi.org/10.1063/1.1471941

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LASERS, OPTICS, AND OPTOELECTRONICS (PACS 42)

Theoretical analysis of enhanced second-harmonic generation based on a self-formed antiguide structure

Takafumi Sassa; Shinsuke Umegaki

J. Appl. Phys. 91, 8942–8949 (2002) https://doi.org/10.1063/1.1474616

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Measurement of reflective liquid crystal displays

S. T. Tang; H. S. Kwok

J. Appl. Phys. 91, 8950–8954 (2002) https://doi.org/10.1063/1.1473698

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PLASMAS AND ELECTRICAL DISCHARGES (PACS 51-52)

Neutral gas temperature estimates in an inductively coupled ${CF}_{4}$ plasma by fitting diatomic emission spectra

Brett A. Cruden; M. V. V. S. Rao; Surendra P. Sharma; M. Meyyappan

J. Appl. Phys. 91, 8955–8964 (2002) https://doi.org/10.1063/1.1474614

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STRUCTURAL, MECHANICAL THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER (PACS 61-68, 78)

Density of states in the gap of amorphous semiconductors determined from modulated photocurrent measurements in the recombination regime

R. R. Koropecki; J. A. Schmidt; R. Arce

J. Appl. Phys. 91, 8965–8969 (2002) https://doi.org/10.1063/1.1469695

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Temperature dependent structural and transport properties of the type II clathrates $A_{8} {Na}_{16} E_{136}$ $(A = Cs$ or Rb and $E = Ge$ or Si)

G. S. Nolas; D. G. Vanderveer; A. P. Wilkinson; J. L. Cohn

J. Appl. Phys. 91, 8970–8973 (2002) https://doi.org/10.1063/1.1471370

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Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies

T. Roch; M. Medun̆a; J. Stangl; A. Hesse; R. T. Lechner; G. Bauer; G. Dehlinger; L. Diehl; U. Gennser; E. Müller; D. Grützmacher

J. Appl. Phys. 91, 8974–8978 (2002) https://doi.org/10.1063/1.1473674

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Composition fluctuation in InGaN quantum wells made from molecular beam or metalorganic vapor phase epitaxial layers

P. Ruterana; S. Kret; A. Vivet; G. Maciejewski; P. Dluzewski

J. Appl. Phys. 91, 8979–8985 (2002) https://doi.org/10.1063/1.1473666

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Photoemission and ab initio theoretical study of interface and film formation during epitaxial growth and annealing of praseodymium oxide on Si(001)

A. Fissel; J. Da̧browski; H. J. Osten

J. Appl. Phys. 91, 8986–8991 (2002) https://doi.org/10.1063/1.1471943

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Calorimetric investigation of the formation of metastable silicides in $Au /a- Si$ thin film multilayers

R. R. Chromik; L. Zavalij; M. D. Johnson; E. J. Cotts

J. Appl. Phys. 91, 8992–8998 (2002) https://doi.org/10.1063/1.1432774

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Photoluminescence study of interfaces between heavily doped ${Al}_{0.48} {In}_{0.52} As:Si$ layers and InP (Fe) substrates

L. C. Poças; J. L. Duarte; I. F. L. Dias; E. Laureto; S. A. Lourenço; D. O. Toginho Filho; E. A. Meneses; I. Mazzaro; J. C. Harmand

J. Appl. Phys. 91, 8999–9004 (2002) https://doi.org/10.1063/1.1475370

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Prediction of electromigration failure in passivated polycrystalline line

Kazuhiko Sasagawa; Masataka Hasegawa; Masumi Saka; Hiroyuki Abé

J. Appl. Phys. 91, 9005–9014 (2002) https://doi.org/10.1063/1.1475354

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Optical properties of SrSe thin films grown by molecular beam epitaxy

L. F. Jiang; W. Z. Shen; H. Z. Wu

J. Appl. Phys. 91, 9015–9018 (2002) https://doi.org/10.1063/1.1474593

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Self-consistent scattering theory of transport and output characteristics of quantum cascade lasers

D. Indjin; P. Harrison; R. W. Kelsall; Z. Ikonić

J. Appl. Phys. 91, 9019–9026 (2002) https://doi.org/10.1063/1.1474613

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Growth mechanism of cavities in MeV helium implanted silicon

J. Grisolia; A. Claverie; G. Ben Assayag; S. Godey; E. Ntsoenzok; F. Labhom; A. Van Veen

J. Appl. Phys. 91, 9027–9030 (2002) https://doi.org/10.1063/1.1469207

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Elastic and anelastic properties of Fe-doped InP films on silicon cantilevers

F. B. Klose; U. Harms; H. Neuhäuser; A. Bakin; I. Behrens; E. Peiner; H.-H. Wehmann; A. Schlachetzki; J. Rösler

J. Appl. Phys. 91, 9031–9038 (2002) https://doi.org/10.1063/1.1471921

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Determination of the order parameter of CuPt-B ordered ${GaInP}_{2}$ films by x-ray diffraction

J. H. Li; R. L. Forrest; S. C. Moss; Y. Zhang; A. Mascarenhas; J. Bai

J. Appl. Phys. 91, 9039–9042 (2002) https://doi.org/10.1063/1.1476971

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Reflection–absorption infrared investigation of hydrogenated silicon oxide generated by the thermal decomposition of $H_{8} {Si}_{8} O_{12}$ clusters

K. T. Nicholson; K. Z. Zhang; M. M. Banaszak Holl; F. R. McFeely

J. Appl. Phys. 91, 9043–9048 (2002) https://doi.org/10.1063/1.1469662

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Morphological transitions of elastic domain structures in constrained layers

J. Slutsker; A. Artemev; A. L. Roytburd

J. Appl. Phys. 91, 9049–9058 (2002) https://doi.org/10.1063/1.1476969

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Nonlocal response in $CdTe$ photovoltaics

Diana Shvydka; A. D. Compaan; V. G. Karpov

J. Appl. Phys. 91, 9059–9065 (2002) https://doi.org/10.1063/1.1473696

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Neutron reflection study on soluble and insoluble poly[2-(2’-ethylhexyloxy)-5-methoxy-1,4-phenylenevinylene) films

Graham R. Webster; William J. Mitchell; Paul L. Burn; Robert K. Thomas; Giovanna Fragneto; Jonathan P. J. Markham; Ifor D. W. Samuel

J. Appl. Phys. 91, 9066–9071 (2002) https://doi.org/10.1063/1.1468902

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Energy transfer between ${Er}^{3+}$ and $\Pr^{3+}$ in chalcogenide glasses for dual-wavelength fiber-optic amplifiers

Se Ho Park; Dong Chin Lee; Jong Heo; Dong Wook Shin

J. Appl. Phys. 91, 9072–9077 (2002) https://doi.org/10.1063/1.1476965

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Relaxation of cathodoluminescent characteristics of phosphors at low-energy electron excitation

Sergei A. Bukesov; Jin Y. Kim; Duk Y. Jeon; Anton V. Strel’tsov

J. Appl. Phys. 91, 9078–9082 (2002) https://doi.org/10.1063/1.1476973

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Dynamic steady state during cyclic diffusional phase transformations

Christopher A. Schuh

J. Appl. Phys. 91, 9083–9090 (2002) https://doi.org/10.1063/1.1476081

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Thermodynamic model of low temperature metalorganic chemical vapor deposition of GaN

V. A. Elyukhin; G. Garcı́a-Salgado; R. Peña-Sierra

J. Appl. Phys. 91, 9091–9094 (2002) https://doi.org/10.1063/1.1457536

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Orbital alignment at p-sexiphenyl and coronene/layered materials interfaces measured with photoemission spectroscopy

P. G. Schroeder; C. B. France; B. A. Parkinson; R. Schlaf

J. Appl. Phys. 91, 9095–9107 (2002) https://doi.org/10.1063/1.1473217

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Plasticity of electromigration-induced hillocking and its effect on the critical length

Joris Proost; Luc Delaey; Jan D’Haen; Karen Maex

J. Appl. Phys. 91, 9108–9115 (2002) https://doi.org/10.1063/1.1476080

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Dopant profiling with the scanning electron microscope—A study of Si

S. L. Elliott; R. F. Broom; C. J. Humphreys

J. Appl. Phys. 91, 9116–9122 (2002) https://doi.org/10.1063/1.1476968

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Low temperature specific heat of a typical glass forming alloy

Hai Yang Bai; Jian Lin Luo; Jie Zhang; Zhao Jia Chen

J. Appl. Phys. 91, 9123–9127 (2002) https://doi.org/10.1063/1.1476077

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Stress in undoped and doped laser crystallized poly-Si

P. Lengsfeld; N. H. Nickel; Ch. Genzel; W. Fuhs

J. Appl. Phys. 91, 9128–9135 (2002) https://doi.org/10.1063/1.1476083

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Effect of phase change on shock wave attenuation in ${GeO}_{2}$

C. Liu; T. J. Ahrens; N. S. Brar

J. Appl. Phys. 91, 9136–9146 (2002) https://doi.org/10.1063/1.1469663

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ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73)

Influence of a space charge region on charge carrier kinetics in silicon wafers

S. von Aichberger; O. Abdallah; F. Wünsch; M. Kunst

J. Appl. Phys. 91, 9147–9150 (2002) https://doi.org/10.1063/1.1473214

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Chemical, electrical, and structural properties of Ni/Au contacts on chemical vapor cleaned p-type GaN

P. J. Hartlieb; A. Roskowski; R. F. Davis; R. J. Nemanich

J. Appl. Phys. 91, 9151–9160 (2002) https://doi.org/10.1063/1.1471578

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Permanent polarization and charge injection in thin anodic alumina layers studied by electrostatic force microscopy

J. Lambert; C. Guthmann; C. Ortega; M. Saint-Jean

J. Appl. Phys. 91, 9161–9169 (2002) https://doi.org/10.1063/1.1466529

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Stark effect modeling in strained n-type ${Si/Si}_{1−x} {Ge}_{x}$ resonant tunneling heterostructures

F. Ben Zid; A. Bhouri; H. Mejri; R. Tlili; M. Said; J.-L. Lazzari; F. Arnaud d’Avitaya; J. Derrien

J. Appl. Phys. 91, 9170–9176 (2002) https://doi.org/10.1063/1.1473213

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Electrical conductivity control in transparent $p$ -type (LaO)CuS thin films prepared by rf sputtering

Hidenori Hiramatsu; Masahiro Orita; Masahiro Hirano; Kazushige Ueda; Hideo Hosono

J. Appl. Phys. 91, 9177–9181 (2002) https://doi.org/10.1063/1.1473667

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Electrical activation of implanted phosphorus ions in [0001]- and [11–20]-oriented $4H- SiC$

F. Schmid; M. Laube; G. Pensl; G. Wagner; M. Maier

J. Appl. Phys. 91, 9182–9186 (2002) https://doi.org/10.1063/1.1470241

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Raman study of ${Zn}_{1−x} {Be}_{x} Se/GaAs$ systems with low Be content $(x⩽0.20)$

O. Pagès; M. Ajjoun; D. Bormann; C. Chauvet; E. Tournié; J. P. Faurie; O. Gorochov

J. Appl. Phys. 91, 9187–9197 (2002) https://doi.org/10.1063/1.1471927

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Gamma-ray-irradiation effects on the leakage current and reliability of sputtered ${TiO}_{2}$ gate oxide in metal–oxide–semiconductor capacitors

Ching-Wu Wang; Shih-Fang Chen; Guan-Ting Chen

J. Appl. Phys. 91, 9198–9203 (2002) https://doi.org/10.1063/1.1473668

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Generation of positive and negative charges under Fowler–Nordheim injection and breakdown

Hironori Ushizaka

J. Appl. Phys. 91, 9204–9213 (2002) https://doi.org/10.1063/1.1473212

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Mechanism for Ohmic contact formation of Ti on n-type GaN investigated using synchrotron radiation photoemission spectroscopy

Jong Kyu Kim; Ho Won Jang; Jong-Lam Lee

J. Appl. Phys. 91, 9214–9217 (2002) https://doi.org/10.1063/1.1476085

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Temperature and doping-dependent resistivity of Ti/Au/Pd/Au multilayer ohmic contact to n-GaN

Changzhi Lu; Hongnai Chen; Xiaoliang Lv; Xuesong Xie; S. Noor Mohammad

J. Appl. Phys. 91, 9218–9224 (2002) https://doi.org/10.1063/1.1471390

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Temperature dependence of the space–charge distribution in injection limited conjugated polymer structures

F. Feller; C. Rothe; M. Tammer; D. Geschke; A. P. Monkman

J. Appl. Phys. 91, 9225–9231 (2002) https://doi.org/10.1063/1.1474612

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Low frequency noise of reverse biased rectifier diodes in the avalanche breakdown regime

Ognian Marinov; M. Jamal Deen; V. Loukanov; V. Velikov

J. Appl. Phys. 91, 9232–9240 (2002) https://doi.org/10.1063/1.1470252

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MAGNETISM AND SUPERCONDUCTIVITY (PACS 74-76)

Magnetization reversal in antiferromagnetically coupled magnetic layers

Y. J. Wang; J. P. Wang; Catherine Y. C. Wong

J. Appl. Phys. 91, 9241–9245 (2002) https://doi.org/10.1063/1.1474595

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Structure, magnetic properties, and magnetostriction of ${Sm}_{0.5} R_{0.5} ({Fe}_{1−x} {Co}_{x})_{2}$ compounds $(R = Nd, \Pr)$

B. W. Wang; W. J. Lee; J. S. Song; B. K. Min; Y. M. Hao

J. Appl. Phys. 91, 9246–9250 (2002) https://doi.org/10.1063/1.1473227

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Microstructure and magnesium diffusion in ${YBa}_{2} {Cu}_{3} O_{7−δ}$ films on bicrystal MgO substrates

Z. Hao; Y. Wu; Y. Enomoto; K. Tanabe; N. Koshizuka

J. Appl. Phys. 91, 9251–9254 (2002) https://doi.org/10.1063/1.1475371

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Ferromagnetic resonance and microstructural studies of Ag/Fe–GaAs waveguide structures

Chin C. Lee; W. Wu; Chen S. Tsai

J. Appl. Phys. 91, 9255–9260 (2002) https://doi.org/10.1063/1.1467400

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Micromechanics approach for effective magnetostriction of composite materials

Jin H. Huang; Ce Wen Nan; Rui-Mu Li

J. Appl. Phys. 91, 9261–9266 (2002) https://doi.org/10.1063/1.1475357

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Magnetic properties of ${Nd}_{60−x} Y_{x} {Fe}_{30} {Al}_{10}$ $(x=0,10,30)$ melt-spun ribbons containing two amorphous magnetic phases

Z. G. Sun; W. Löser; J. Eckert; K.-H. Müller; L. Schultz

J. Appl. Phys. 91, 9267–9271 (2002) https://doi.org/10.1063/1.1475356

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DIELECTRICS AND FERROELECTRICITY (PACS 77)

Domain structures in ${KNbO}_{3}$ crystals and their piezoelectric properties

Kiyoshi Nakamura; Tsuyoshi Tokiwa; Yoshiko Kawamura

J. Appl. Phys. 91, 9272–9276 (2002) https://doi.org/10.1063/1.1476078

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Relaxor and normal ferroelectric behavior in ordered thin films of ${PbSc}_{0.5} {Nb}_{0.5} O_{3}$

M. Tyunina; J. Levoska; S. Leppävuori

J. Appl. Phys. 91, 9277–9287 (2002) https://doi.org/10.1063/1.1473672

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Phase diagrams and dielectric response of epitaxial barium strontium titanate films: A theoretical analysis

Z.-G. Ban; S. P. Alpay

J. Appl. Phys. 91, 9288–9296 (2002) https://doi.org/10.1063/1.1473675

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Study of ferroelectric-thin-film thickness effects on metal-ferroelectric- ${SiO}_{2} - Si$ transistors

Yih-Yin Lin; Jasprit Singh

J. Appl. Phys. 91, 9297–9302 (2002) https://doi.org/10.1063/1.1470249

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Effects of coercive voltage and charge injection on memory windows of metal-ferroelectric-semiconductor and metal-ferroelectric-insulator-semiconductor gate structures

Sung Kyun Lee; Yong Tae Kim; Seong-Il Kim; Cheol Eui Lee

J. Appl. Phys. 91, 9303–9307 (2002) https://doi.org/10.1063/1.1467629

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NANOSCALE SCIENCE AND DESIGN

Effects of V and Si additions on the coercivity and microstructure of nanocomposite ${Fe}_{3} {B/Nd}_{2} {Fe}_{14} B$ magnets

X. Y. Xiong; K. Hono; S. Hirosawa; H. Kanekiyo

J. Appl. Phys. 91, 9308–9314 (2002) https://doi.org/10.1063/1.1474615

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Temperature dependence of the domain wall depinning in magnetic hard-soft composites

S. T. Chui; Yong-li Ma

J. Appl. Phys. 91, 9315–9318 (2002) https://doi.org/10.1063/1.1476074

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Evidence for a large enrichment of interstitial oxygen atoms in the nanometer-thick metal layer at the NbO/Nb (110) interface

I. Arfaoui; C. Guillot; J. Cousty; C. Antoine

J. Appl. Phys. 91, 9319–9323 (2002) https://doi.org/10.1063/1.1473699

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Polymerized carbon nitride nanobells

G. Y. Zhang; X. C. Ma; D. Y. Zhong; E. G. Wang

J. Appl. Phys. 91, 9324–9332 (2002) https://doi.org/10.1063/1.1476070

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High-yield synthesis and one-dimensional structure of $C_{60}$ encapsulated in single-wall carbon nanotubes

Brian W. Smith; Richard M. Russo; Satishkumar B. Chikkannanavar; David E. Luzzi

J. Appl. Phys. 91, 9333–9340 (2002) https://doi.org/10.1063/1.1464215

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Single crystal silver nanowires prepared by the metal amplification method

Mladen Barbic; Jack J. Mock; D. R. Smith; S. Schultz

J. Appl. Phys. 91, 9341–9345 (2002) https://doi.org/10.1063/1.1476071

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DEVICE PHYSICS (PACS 85)

Nonresonant detection of terahertz radiation in field effect transistors

W. Knap; V. Kachorovskii; Y. Deng; S. Rumyantsev; J.-Q. Lü; R. Gaska; M. S. Shur; G. Simin; X. Hu; M. Asif Khan; C. A. Saylor; L. C. Brunel

J. Appl. Phys. 91, 9346–9353 (2002) https://doi.org/10.1063/1.1468257

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INTERDISCIPLINARY AND GENERAL PHYSICS (PACS 1-41, 43-47, 79, 81-84, 89-99)

Surface stress induced deflections of cantilever plates with applications to the atomic force microscope: V-shaped plates

John Elie Sader

J. Appl. Phys. 91, 9354–9361 (2002) https://doi.org/10.1063/1.1470240

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Structure-sensitive oxidation of the indium phosphide (001) surface

G. Chen; S. B. Visbeck; D. C. Law; R. F. Hicks

J. Appl. Phys. 91, 9362–9367 (2002) https://doi.org/10.1063/1.1471577

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Using sequences of pulses to control coherence in an open quantum computing system

Bi Qiao; Harry E. Ruda; J. F. Chang

J. Appl. Phys. 91, 9368–9374 (2002) https://doi.org/10.1063/1.1473678

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Optical and structural studies of films grown thermally on zirconium surfaces

J. M. Morgan; J. S. McNatt; M. J. Shepard; N. Farkas; R. D. Ramsier

J. Appl. Phys. 91, 9375–9378 (2002) https://doi.org/10.1063/1.1476079

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An analytical solution for microtip field emission current and effective emission area

J. D. Zuber; K. L. Jensen; T. E. Sullivan

J. Appl. Phys. 91, 9379–9384 (2002) https://doi.org/10.1063/1.1474596

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High-current electron beam generation by a metal–ceramic cathode

Ya. E. Krasik; A. Dunaevsky; J. Z. Gleizer; J. Felsteiner; Yu. A. Kotov; S. Yu. Sokovnin; M. E. Balezin

J. Appl. Phys. 91, 9385–9392 (2002) https://doi.org/10.1063/1.1476964

Abstract

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Calculation of the electrostatic-potential distribution in ohmic elliptical cylinders fed by a dipole source

R. Evrard; M. Schmeits; J. Troquet

J. Appl. Phys. 91, 9393–9400 (2002) https://doi.org/10.1063/1.1475355

Abstract

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Effects of substrate temperature on structural properties of undoped silicon thin films

Chandan Das; Arup Dasgupta; S. C. Saha; Swati Ray

J. Appl. Phys. 91, 9401–9407 (2002) https://doi.org/10.1063/1.1474611

Abstract

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Formation of porous grain boundaries in polycrystalline silicon thin films

Yasuyuki Kageyama; Yoshie Murase; Toshiyuki Tsuchiya; Hirofumi Funabashi; Jiro Sakata

J. Appl. Phys. 91, 9408–9413 (2002) https://doi.org/10.1063/1.1476088

Abstract

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Nonlinear evolution equation for the stress-driven morphological instability

Yang Xiang; Weinan E

J. Appl. Phys. 91, 9414–9422 (2002) https://doi.org/10.1063/1.1477259

Abstract

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COMMUNICATIONS

Digitally graded active region for optically pumped intersubband lasers and nonlinear wavelength convertors

Stanko Tomić; Dragan Indjin; Zoran Ikonić; Vitomir Milanović

J. Appl. Phys. 91, 9423–9425 (2002) https://doi.org/10.1063/1.1476067

Abstract

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Suppression of spontaneous emission in incomplete opaline photonic crystal

S. G. Romanov; T. Maka; C. M. Sotomayor Torres; M. Müller; R. Zentel

J. Appl. Phys. 91, 9426–9428 (2002) https://doi.org/10.1063/1.1469688

Abstract

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Resonant Raman scattering measurements of strains in ZnS epilayers grown on GaP

Young-Moon Yu; M.-H. Hyun; S. Nam; D. Lee; Byungsung O; K.-S. Lee; Pyeong Yeol Yu; Yong Dae Choi

J. Appl. Phys. 91, 9429–9431 (2002) https://doi.org/10.1063/1.1477282

Abstract

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Transient photovoltage and dielectric relaxation time in porous silicon

V. Duzhko; F. Koch; Th. Dittrich

J. Appl. Phys. 91, 9432–9434 (2002) https://doi.org/10.1063/1.1471383

Abstract

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ADDENDA

Addendum: “Effective-mass enhancement and nonparabolicity in thin GaAs quantum wells” [J. Appl. Phys. 88, 6945 (2000)]

M. Städele; K. Hess; T. Ruf; M. Cardona

J. Appl. Phys. 91, 9435–9436 (2002) https://doi.org/10.1063/1.1467969

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ERRATA

Erratum: “Effects of thermal annealing on the performance of polymer light emitting diodes” [J. Appl. Phys. 91, 1595 (2002)]

Jie Liu; Tzung-Fang Guo; Yang Yang

J. Appl. Phys. 91, 9437 (2002) https://doi.org/10.1063/1.1476390

Abstract

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Issues

APPLIED PHYSICS REVIEWS

LASERS, OPTICS, AND OPTOELECTRONICS (PACS 42)

PLASMAS AND ELECTRICAL DISCHARGES (PACS 51-52)

STRUCTURAL, MECHANICAL THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER (PACS 61-68, 78)

ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73)

MAGNETISM AND SUPERCONDUCTIVITY (PACS 74-76)

DIELECTRICS AND FERROELECTRICITY (PACS 77)

NANOSCALE SCIENCE AND DESIGN

DEVICE PHYSICS (PACS 85)

INTERDISCIPLINARY AND GENERAL PHYSICS (PACS 1-41, 43-47, 79, 81-84, 89-99)

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ERRATA

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