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LASERS, OPTICS, AND OPTOELECTRONICS (PACS 42)

Optimization of reflective bistable twisted nematic liquid crystal displays

Z. L. Xie; H. J. Gao; S. Y. Xu; H. S. Kwok

J. Appl. Phys. 86, 2373–2376 (1999) https://doi.org/10.1063/1.371062

Abstract

View articletitled, Optimization of reflective bistable twisted nematic liquid crystal displays

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Determination of the ${Ce}^{+3}$ bonding in the ${Ca}_{0.5} {Sr}_{0.5} {Ga}_{2} S_{4} :Ce$ phosphor via x-ray photoelectron spectroscopy

Philip D. Rack; Ted A. O’Brien; Michael C. Zerner; Paul H. Holloway

J. Appl. Phys. 86, 2377–2384 (1999) https://doi.org/10.1063/1.371063

Abstract

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Upconversion lasing of a thulium-ion-doped fluorozirconate glass microsphere

Hideki Fujiwara; Keiji Sasaki

J. Appl. Phys. 86, 2385–2388 (1999) https://doi.org/10.1063/1.371064

Abstract

View articletitled, Upconversion lasing of a thulium-ion-doped fluorozirconate glass microsphere

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Non-steady-state photoelectromotive force in reduced lithium niobate crystals

H. Veenhuis; K. Buse; E. Krätzig; N. Korneev; D. Mayorga

J. Appl. Phys. 86, 2389–2392 (1999) https://doi.org/10.1063/1.371065

Abstract

View articletitled, Non-steady-state photoelectromotive force in reduced lithium niobate crystals

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Electron-beam irradiation-induced nonlinearity in silicate glass films and fabrication of nonlinear optical gratings

Makoto Nakanishi; Okihiro Sugihara; Naomichi Okamoto; Hisashi Fujimura; Chikara Egami

J. Appl. Phys. 86, 2393–2396 (1999) https://doi.org/10.1063/1.371066

Abstract

View articletitled, Electron-beam irradiation-induced nonlinearity in silicate glass films and fabrication of nonlinear optical gratings

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Degradation of InGaAsP/InP-based multiquantum-well lasers

Thomas Kallstenius; Jakob Bäckström; Ulf Smith; Björn Stoltz

J. Appl. Phys. 86, 2397–2406 (1999) https://doi.org/10.1063/1.371067

Abstract

View articletitled, Degradation of InGaAsP/InP-based multiquantum-well lasers

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Microcavity organic light-emitting diodes for strongly directed pure red, green, and blue emissions

Shizuo Tokito; Tetsuo Tsutsui; Yasunori Taga

J. Appl. Phys. 86, 2407–2411 (1999) https://doi.org/10.1063/1.371068

Abstract

View articletitled, Microcavity organic light-emitting diodes for strongly directed pure red, green, and blue emissions

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PLASMAS AND ELECTRICAL DISCHARGES (PACS 51-52)

Electrohydrodynamic flow associated with unipolar charge current due to corona discharge from a wire enclosed in a rectangular shield

James Q. Feng

J. Appl. Phys. 86, 2412–2418 (1999) https://doi.org/10.1063/1.371069

Abstract

View articletitled, Electrohydrodynamic flow associated with unipolar charge current due to corona discharge from a wire enclosed in a rectangular shield

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Stripping and cleaning of photoresist using low energy neutrals

Xianmin Tang; C. A. Nichols; D. M. Manos

J. Appl. Phys. 86, 2419–2424 (1999) https://doi.org/10.1063/1.371070

Abstract

View articletitled, Stripping and cleaning of photoresist using low energy neutrals

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Standing surface waves in a dust-contaminated large-area planar plasma source

K. N. Ostrikov; M. Y. Yu; H. Sugai

J. Appl. Phys. 86, 2425–2430 (1999) https://doi.org/10.1063/1.371071

Abstract

View articletitled, Standing surface waves in a dust-contaminated large-area planar plasma source

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Global modeling of a dielectric barrier discharge in Ne–Xe mixtures for an alternating current plasma display panel

Y. Ikeda; J. P. Verboncoeur; P. J. Christenson; C. K. Birdsall

J. Appl. Phys. 86, 2431–2441 (1999) https://doi.org/10.1063/1.371072

Abstract

View articletitled, Global modeling of a dielectric barrier discharge in Ne–Xe mixtures for an alternating current plasma display panel

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STRUCTURAL, MECHANICAL THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER (PACS 61-68, 78)

Effects of point defect distribution on arsenic precipitation in low-temperature grown III–V arsenides

M. N. Chang; K. C. Hsieh; T.-E. Nee; J.-I. Chyi

J. Appl. Phys. 86, 2442–2447 (1999) https://doi.org/10.1063/1.371073

Abstract

View articletitled, Effects of point defect distribution on arsenic precipitation in low-temperature grown III–V arsenides

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Oxygen precipitation and secondary defects in silicon by high energy ion implantation and two-step annealing

Sahng-Hyun Yoon; Kae-Dal Kwack; Bong-Gyun Ko; Jea-Gun Park; Jun-Yup Kim; Hyun Ruh

J. Appl. Phys. 86, 2448–2452 (1999) https://doi.org/10.1063/1.371074

Abstract

View articletitled, Oxygen precipitation and secondary defects in silicon by high energy ion implantation and two-step annealing

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Modeling of gettering of precipitated impurities from Si for carrier lifetime improvement in solar cell applications

P. S. Plekhanov; R. Gafiteanu; U. M. Gösele; T. Y. Tan

J. Appl. Phys. 86, 2453–2458 (1999) https://doi.org/10.1063/1.371075

Abstract

View articletitled, Modeling of gettering of precipitated impurities from Si for carrier lifetime improvement in solar cell applications

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Effect of annealing on Y/Mo multilayers

Xiaofeng Gu; T. C. Hufnagel

J. Appl. Phys. 86, 2459–2463 (1999) https://doi.org/10.1063/1.371076

Abstract

View articletitled, Effect of annealing on Y/Mo multilayers

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Formation, characterization, and properties of a new boron-carbon-nitrogen crystal

B. Yao; L. Liu; W. H. Su

J. Appl. Phys. 86, 2464–2467 (1999) https://doi.org/10.1063/1.371077

Abstract

View articletitled, Formation, characterization, and properties of a new boron-carbon-nitrogen crystal

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Effect of sputtering with hydrogen dilution on fluorine concentration of low hydrogen content fluorinated amorphous carbon thin films with low dielectric constant

Haruo Yokomichi; Atsushi Masuda

J. Appl. Phys. 86, 2468–2472 (1999) https://doi.org/10.1063/1.371078

Abstract

View articletitled, Effect of sputtering with hydrogen dilution on fluorine concentration of low hydrogen content fluorinated amorphous carbon thin films with low dielectric constant

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Influence of a surface electric field on the anchoring characteristics of nematic phases at rubbed polyimides

Roland Meister; Blandine Jérôme

J. Appl. Phys. 86, 2473–2478 (1999) https://doi.org/10.1063/1.371079

Abstract

View articletitled, Influence of a surface electric field on the anchoring characteristics of nematic phases at rubbed polyimides

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Electroplastic effect under the simultaneous superposition of electric and magnetic fields

A. I. Pinchook; V. S. Savenko

J. Appl. Phys. 86, 2479–2482 (1999) https://doi.org/10.1063/1.371080

Abstract

View articletitled, Electroplastic effect under the simultaneous superposition of electric and magnetic fields

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Acoustic quality factor of copper alloys from 50 mK to 300 K

William Duffy, Jr.

J. Appl. Phys. 86, 2483–2489 (1999) https://doi.org/10.1063/1.371081

Abstract

View articletitled, Acoustic quality factor of copper alloys from 50 mK to 300 K

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Influence of natural and initial acoustoelastic coefficients on residual stress evaluation: Theory and experiment

Marc Duquennoy; Mohammadi Ouaftouh; Mohamed Ourak; Wei-Jiang Xu

J. Appl. Phys. 86, 2490–2498 (1999) https://doi.org/10.1063/1.371082

Abstract

View articletitled, Influence of natural and initial acoustoelastic coefficients on residual stress evaluation: Theory and experiment

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Electron energy loss spectroscopy studies of the amorphous to crystalline transition in ${FeF}_{3}$

M. S. M. Saifullah; G. A. Botton; C. B. Boothroyd; C. J. Humphreys

J. Appl. Phys. 86, 2499–2504 (1999) https://doi.org/10.1063/1.371083

Abstract

View articletitled, Electron energy loss spectroscopy studies of the amorphous to crystalline transition in <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">FeF</mi><mrow><mn>3</mn></mrow></msub></math>

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Secondary ion mass spectroscopy study of Al diffusion in sandwich-ZnSTe structures grown by molecular beam epitaxy

Z. H. Ma; T. Smith; I. K. Sou

J. Appl. Phys. 86, 2505–2508 (1999) https://doi.org/10.1063/1.371084

Abstract

View articletitled, Secondary ion mass spectroscopy study of Al diffusion in sandwich-ZnSTe structures grown by molecular beam epitaxy

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Structural defects in 3C–SiC grown on Si by supersonic jet epitaxy

C. Long; S. A. Ustin; W. Ho

J. Appl. Phys. 86, 2509–2515 (1999) https://doi.org/10.1063/1.371085

Abstract

View articletitled, Structural defects in 3C–SiC grown on Si by supersonic jet epitaxy

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Mechanisms for microstructure evolution in electroplated copper thin films near room temperature

J. M. E. Harper; C. Cabral, Jr.; P. C. Andricacos; L. Gignac; I. C. Noyan; K. P. Rodbell; C. K. Hu

J. Appl. Phys. 86, 2516–2525 (1999) https://doi.org/10.1063/1.371086

Abstract

View articletitled, Mechanisms for microstructure evolution in electroplated copper thin films near room temperature

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Fractal-based description for the three-dimensional surface of materials

Jianming Li; Li Lu; Ying Su; Man On Lai

J. Appl. Phys. 86, 2526–2532 (1999) https://doi.org/10.1063/1.371087

Abstract

View articletitled, Fractal-based description for the three-dimensional surface of materials

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Bond length variation in ${In}_{0.25} {Ga}_{0.75} As/InP$ epitaxial layers thicker than the critical thickness

M. Tormen; D. De Salvador; M. Natali; A. Drigo; F. Romanato; G. Rossetto; F. Boscherini; S. Mobilio

J. Appl. Phys. 86, 2533–2539 (1999) https://doi.org/10.1063/1.371088

Abstract

View articletitled, Bond length variation in <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">In</mi><mrow><mi mathvariant="normal">0.25</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">Ga</mi><mrow><mi mathvariant="normal">0.75</mi></mrow></msub><mi mathvariant="normal" xmlns="">As/InP</mi></math> epitaxial layers thicker than the critical thickness

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High-resolution transmission electron microscopy of some ${Ti}_{n+1} {AX}_{n}$ compounds (⁠ $n=1,$ 2; $A=Al$ or Si; $X=C$ or N)

L. Farber; I. Levin; M. W. Barsoum; T. El-Raghy; T. Tzenov

J. Appl. Phys. 86, 2540–2543 (1999) https://doi.org/10.1063/1.371089

Abstract

View articletitled, High-resolution transmission electron microscopy of some <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">Ti</mi><mrow><mtext>n+1</mtext></mrow></msub><msub xmlns=""><mi mathvariant="normal">AX</mi><mrow><mi>n</mi></mrow></msub></math> compounds (⁠<math xmlns="http://www.w3.org/1998/Math/MathML"><mtext xmlns="">n=1,</mtext></math> 2; <math xmlns="http://www.w3.org/1998/Math/MathML"><mi mathvariant="normal" xmlns="">A=Al</mi></math> or Si; <math xmlns="http://www.w3.org/1998/Math/MathML"><mi mathvariant="normal" xmlns="">X=C</mi></math> or N)

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Tantalum–ruthenium dioxide as a diffusion barrier between Pt bottom electrode and ${TiSi}_{2}$ ohmic contact layer for high density capacitors

Dong-Soo Yoon; Hong Koo Baik; Sung-Man Lee; Sang-In Lee

J. Appl. Phys. 86, 2544–2549 (1999) https://doi.org/10.1063/1.371090

Abstract

View articletitled, Tantalum–ruthenium dioxide as a diffusion barrier between Pt bottom electrode and <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">TiSi</mi><mrow><mi mathvariant="normal">2</mi></mrow></msub></math> ohmic contact layer for high density capacitors

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Aggregation and out diffusion of iron atoms for Fe ion implanted silica films

Xing-zhao Ding; M. F. Chiah; W. Y. Cheung; S. P. Wong; J. B. Xu; I. H. Wilson; Hui-min Wang; Li-zhi Chen; Xiang-huai Liu

J. Appl. Phys. 86, 2550–2554 (1999) https://doi.org/10.1063/1.371091

Abstract

View articletitled, Aggregation and out diffusion of iron atoms for Fe ion implanted silica films

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Photoluminescence decay time measurements from self-organized InAs/GaAs quantum dots

P. D. Buckle; P. Dawson; S. A. Hall; X. Chen; M. J. Steer; D. J. Mowbray; M. S. Skolnick; M. Hopkinson

J. Appl. Phys. 86, 2555–2561 (1999) https://doi.org/10.1063/1.371092

Abstract

View articletitled, Photoluminescence decay time measurements from self-organized InAs/GaAs quantum dots

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The effects of KrF pulsed laser and thermal annealing on the crystallinity and surface morphology of radiofrequency magnetron sputtered ZnS:Mn thin films deposited on Si

E. A. Mastio; M. R. Craven; W. M. Cranton; C. B. Thomas; M. Robino; E. Fogarassy

J. Appl. Phys. 86, 2562–2570 (1999) https://doi.org/10.1063/1.371093

Abstract

View articletitled, The effects of KrF pulsed laser and thermal annealing on the crystallinity and surface morphology of radiofrequency magnetron sputtered ZnS:Mn thin films deposited on Si

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Effect of Mo doping on accelerated growth of C-54 ${TiSi}_{2} :$ Evidence for template mechanism

M. A. Gribelyuk; J. A. Kittl; S. B. Samavedam

J. Appl. Phys. 86, 2571–2575 (1999) https://doi.org/10.1063/1.371094

Abstract

View articletitled, Effect of Mo doping on accelerated growth of C-54 <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">TiSi</mi><mrow><mi mathvariant="normal">2</mi></mrow></msub><mi xmlns="">:</mi></math> Evidence for template mechanism

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Near-field optical properties of localized plasmons around lithographically designed nanostructures

Jean-Claude Weeber; Christian Girard; Joachim R. Krenn; Alain Dereux; Jean-Pierre Goudonnet

J. Appl. Phys. 86, 2576–2583 (1999) https://doi.org/10.1063/1.371095

Abstract

View articletitled, Near-field optical properties of localized plasmons around lithographically designed nanostructures

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Optical properties of InAlGaAs quantum wells: Influence of segregation and band bowing

J. R. Jensen; J. M. Hvam; W. Langbein

J. Appl. Phys. 86, 2584–2589 (1999) https://doi.org/10.1063/1.371096

Abstract

View articletitled, Optical properties of InAlGaAs quantum wells: Influence of segregation and band bowing

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Infrared optical properties of ${Mn}_{1.56} {Co}_{0.96} {Ni}_{0.48} O_{4}$ spinel films sputter deposited in an oxygen partial pressure series

Rand Dannenberg; S. Baliga; R. J. Gambino; A. H. King; A. P. Doctor

J. Appl. Phys. 86, 2590–2601 (1999) https://doi.org/10.1063/1.371097

Abstract

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Reflectivity investigations as a method for characterizing group III nitride films

S. Shokhovets; R. Goldhahn; G. Gobsch; T. S. Cheng; C. T. Foxon; G. D. Kipshidze; Wo. Richter

J. Appl. Phys. 86, 2602–2610 (1999) https://doi.org/10.1063/1.371098

Abstract

View articletitled, Reflectivity investigations as a method for characterizing group III nitride films

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Spectroscopic ellipsometry study of ${Pb}_{1−x} {Eu}_{x} Se (0⩽x⩽0.45)$

Hideyuki Kanazawa; Sadao Adachi; Tsutomu Yamaguchi; Shinichi Murashige; Kensuke Murakami

J. Appl. Phys. 86, 2611–2615 (1999) https://doi.org/10.1063/1.371099

Abstract

View articletitled, Spectroscopic ellipsometry study of <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">Pb</mi><mrow><mtext>1−x</mtext></mrow></msub><msub xmlns=""><mi mathvariant="normal">Eu</mi><mrow><mi>x</mi></mrow></msub><mi mathvariant="normal" xmlns="">Se</mi><mtext xmlns="">(0⩽x⩽0.45)</mtext></math>

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Magnetic properties of chromium doped rare earth manganites ${Ln}_{0.5} {Ca}_{0.5} {Mn}_{1−x} {Cr}_{x} O_{3}$ $(Ln=Pr,$ Nd, Sm and $0.05⩽x⩽0.10$ ⁠) by soft x-ray magnetic circular dichroism

O. Toulemonde; F. Studer; A. Barnabé; B. Raveau; J. B. Goedkoop

J. Appl. Phys. 86, 2616–2621 (1999) https://doi.org/10.1063/1.371100

Abstract

View articletitled, Magnetic properties of chromium doped rare earth manganites <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">Ln</mi><mrow><mi mathvariant="normal">0.5</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">Ca</mi><mrow><mi mathvariant="normal">0.5</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">Mn</mi><mrow><mtext>1−x</mtext></mrow></msub><msub xmlns=""><mi mathvariant="normal">Cr</mi><mrow><mi>x</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">O</mi><mrow><mi mathvariant="normal">3</mi></mrow></msub></math> <math xmlns="http://www.w3.org/1998/Math/MathML"><mi xmlns="">(</mi><mi mathvariant="normal" xmlns="">Ln=Pr</mi><mi xmlns="">,</mi></math> Nd, Sm and <math xmlns="http://www.w3.org/1998/Math/MathML"><mtext xmlns="">0.05⩽x⩽0.10</mtext></math>⁠) by soft x-ray magnetic circular dichroism

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Optical and structural properties of strained ${InAlAs/InAs}_{x} P_{1−x}$ multi-quantum wells grown by solid source molecular beam epitaxy

T.-H. Kim; A. S. Brown; R. A. Metzger

J. Appl. Phys. 86, 2622–2627 (1999) https://doi.org/10.1063/1.371101

Abstract

View articletitled, Optical and structural properties of strained <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">InAlAs/InAs</mi><mrow><mi>x</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">P</mi><mrow><mtext>1−x</mtext></mrow></msub></math> multi-quantum wells grown by solid source molecular beam epitaxy

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Characterization of the luminescence center in photo- and electroluminescent amorphous silicon oxynitride films

K. J. Price; L. E. McNeil; A. Suvkanov; E. A. Irene; P. J. MacFarlane; M. E. Zvanut

J. Appl. Phys. 86, 2628–2637 (1999) https://doi.org/10.1063/1.371102

Abstract

View articletitled, Characterization of the luminescence center in photo- and electroluminescent amorphous silicon oxynitride films

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Electroluminescence in silicon oxynitride films

K. J. Price; L. R. Sharpe; L. E. McNeil; E. A. Irene

J. Appl. Phys. 86, 2638–2641 (1999) https://doi.org/10.1063/1.371103

Abstract

View articletitled, Electroluminescence in silicon oxynitride films

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Photoluminescence quantum yield of pure and molecularly doped organic solid films

Hedi Mattoussi; Hideyuki Murata; Charles D. Merritt; Yasuhiro Iizumi; Junji Kido; Zakya H. Kafafi

J. Appl. Phys. 86, 2642–2650 (1999) https://doi.org/10.1063/1.371104

Abstract

View articletitled, Photoluminescence quantum yield of pure and molecularly doped organic solid films

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ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73)

X-ray photoemission and absorption spectroscopy of supported nanoscale iron clusters

K. W. Edmonds; S. H. Baker; S. C. Thornton; M. J. Maher; A. M. Keen; C. Binns

J. Appl. Phys. 86, 2651–2654 (1999) https://doi.org/10.1063/1.371105

Abstract

View articletitled, X-ray photoemission and absorption spectroscopy of supported nanoscale iron clusters

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Electrolytic conduction of silver metaphosphate glass until dielectric breakdown

A. Doi; H. Takano; H. Takaki

J. Appl. Phys. 86, 2655–2659 (1999) https://doi.org/10.1063/1.371106

Abstract

View articletitled, Electrolytic conduction of silver metaphosphate glass until dielectric breakdown

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Electronic transport in polycrystalline ${Pbl}_{2}$ films

R. A. Street; S. E. Ready; F. Lemmi; K. S. Shah; P. Bennett; Y. Dmitriyev

J. Appl. Phys. 86, 2660–2667 (1999) https://doi.org/10.1063/1.371107

Abstract

View articletitled, Electronic transport in polycrystalline <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">Pbl</mi><mrow><mi mathvariant="normal">2</mi></mrow></msub></math> films

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Low field electron mobility in GaN

Subhabrata Dhar; Subhasis Ghosh

J. Appl. Phys. 86, 2668–2676 (1999) https://doi.org/10.1063/1.371108

Abstract

View articletitled, Low field electron mobility in GaN

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Analytical treatment of wave packet tunneling through a resonant double barrier heterostructure

F. H. Stoica; D. Dragoman

J. Appl. Phys. 86, 2677–2683 (1999) https://doi.org/10.1063/1.371109

Abstract

View articletitled, Analytical treatment of wave packet tunneling through a resonant double barrier heterostructure

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Noise of a single electron transistor on a ${Si}_{3} N_{4}$ membrane

P. J. Hakonen; J. M. Ikonen; Ü. Parts; J. S. Penttilä; L. R. Roschier; M. A. Paalanen

J. Appl. Phys. 86, 2684–2686 (1999) https://doi.org/10.1063/1.371110

Abstract

View articletitled, Noise of a single electron transistor on a <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">Si</mi><mrow><mi mathvariant="normal">3</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">N</mi><mrow><mi mathvariant="normal">4</mi></mrow></msub></math> membrane

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Widely tunable intersubband energy spacing of self-assembled InAs/GaAs quantum dots due to interface intermixing

X. C. Wang; S. J. Xu; S. J. Chua; Z. H. Zhang; W. J. Fan; C. H. Wang; J. Jiang; X. G. Xie

J. Appl. Phys. 86, 2687–2690 (1999) https://doi.org/10.1063/1.371111

Abstract

View articletitled, Widely tunable intersubband energy spacing of self-assembled InAs/GaAs quantum dots due to interface intermixing

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Carrier concentration and mobility in GaN epilayers on sapphire substrate studied by infrared reflection spectroscopy

Z.-F. Li; W. Lu; H.-J. Ye; Z.-H. Chen; X.-Z. Yuan; H.-F. Dou; S.-C. Shen; G. Li; S. J. Chua

J. Appl. Phys. 86, 2691–2695 (1999) https://doi.org/10.1063/1.371112

Abstract

View articletitled, Carrier concentration and mobility in GaN epilayers on sapphire substrate studied by infrared reflection spectroscopy

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Measurement of the Al mole fraction of bulk AlGaN and AlGaN/GaN heterostructure by photoconductance method

L. S. Yu; D. Qiao; S. S. Lau; J. M. Redwing; J. Y. Lin; H. X. Jiang

J. Appl. Phys. 86, 2696–2699 (1999) https://doi.org/10.1063/1.371113

Abstract

View articletitled, Measurement of the Al mole fraction of bulk AlGaN and AlGaN/GaN heterostructure by photoconductance method

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Dielectric and ferroelectric response as a function of annealing temperature and film thickness of sol-gel deposited ${Pb(Zr}_{0.52} {Ti}_{0.48} {)O}_{3}$ thin film

Chae-Ryong Cho; Won-Jae Lee; Byoung-Gon Yu; Bo-Woo Kim

J. Appl. Phys. 86, 2700–2711 (1999) https://doi.org/10.1063/1.371114

Abstract

View articletitled, Dielectric and ferroelectric response as a function of annealing temperature and film thickness of sol-gel deposited <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">Pb(Zr</mi><mrow><mi mathvariant="normal">0.52</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">Ti</mi><mrow><mi mathvariant="normal">0.48</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">)O</mi><mrow><mi mathvariant="normal">3</mi></mrow></msub></math> thin film

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Polarization distribution in ceramic-polymer nanocomposites

Peter Bloss; Aimé S. DeReggi; Hans-Jürgen Gläsel; Eberhard Hartmann; Dietmar Hirsch; Hartmut Schäfer

J. Appl. Phys. 86, 2712–2718 (1999) https://doi.org/10.1063/1.371115

Abstract

View articletitled, Polarization distribution in ceramic-polymer nanocomposites

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Quantum wires under photoexcitation

H. Ruda; A. Shik

J. Appl. Phys. 86, 2719–2726 (1999) https://doi.org/10.1063/1.371116

Abstract

View articletitled, Quantum wires under photoexcitation

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MAGNETISM AND SUPERCONDUCTIVITY (PACS 74-76)

Microstructure, magnetic, and magneto-optical properties of chemical synthesized Co–RE $(RE=Ho, Er, Tm, Yb, Lu)$ ferrite nanocrystalline films

Fu-Xiang Cheng; Jiang-Tao Jia; Zhi-Gang Xu; Biao Zhou; Chun-Sheng Liao; Chun-Hua Yan; Liang-Yao Chen; Hai-Bin Zhao

J. Appl. Phys. 86, 2727–2732 (1999) https://doi.org/10.1063/1.371117

Abstract

View articletitled, Microstructure, magnetic, and magneto-optical properties of chemical synthesized Co–RE <math xmlns="http://www.w3.org/1998/Math/MathML"><mi xmlns="">(</mi><mi mathvariant="normal" xmlns="">RE=Ho, Er, Tm, Yb, Lu</mi><mi xmlns="">)</mi></math> ferrite nanocrystalline films

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Microstructural evolution and giant magnetoresistance in melt spun and annealed ${Cu}_{85} {(FeCo)}_{15}$ alloy

N. Ravishankar; J. Park; K. Aoki; T. Masumoto; K. Chattopadhyay

J. Appl. Phys. 86, 2733–2738 (1999) https://doi.org/10.1063/1.371118

Abstract

View articletitled, Microstructural evolution and giant magnetoresistance in melt spun and annealed <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">Cu</mi><mrow><mi mathvariant="normal">85</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">(FeCo)</mi><mrow><mi mathvariant="normal">15</mi></mrow></msub></math> alloy

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DIELECTRICS AND FERROELECTRICITY (PACS 77)

Plasma deposition of low-dielectric-constant fluorinated amorphous carbon

Kazuhiko Endo; Keisuke Shinoda; Toru Tatsumi

J. Appl. Phys. 86, 2739–2745 (1999) https://doi.org/10.1063/1.371119

Abstract

View articletitled, Plasma deposition of low-dielectric-constant fluorinated amorphous carbon

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Crystallographically engineered ${BaTiO}_{3}$ single crystals for high-performance piezoelectrics

Seung-Eek Park; Satoshi Wada; L. E. Cross; Thomas R. Shrout

J. Appl. Phys. 86, 2746–2750 (1999) https://doi.org/10.1063/1.371120

Abstract

View articletitled, Crystallographically engineered <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">BaTiO</mi><mrow><mi mathvariant="normal">3</mi></mrow></msub></math> single crystals for high-performance piezoelectrics

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Charge transport in thin interpoly nitride/oxide stacked films

B. De Salvo; G. Ghibaudo; G. Pananakakis; B. Guillaumot; G. Reimbold

J. Appl. Phys. 86, 2751–2758 (1999) https://doi.org/10.1063/1.371121

Abstract

View articletitled, Charge transport in thin interpoly nitride/oxide stacked films

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Incomplete structural phase transition and lattice destruction in ${Sr}_{1−x} {La}_{x} {TiO}_{3+δ}$

M. Arao; Y. Koyama; Y. Inoue

J. Appl. Phys. 86, 2759–2763 (1999) https://doi.org/10.1063/1.371122

Abstract

View articletitled, Incomplete structural phase transition and lattice destruction in <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">Sr</mi><mrow><mtext>1−x</mtext></mrow></msub><msub xmlns=""><mi mathvariant="normal">La</mi><mrow><mi>x</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">TiO</mi><mrow><mtext>3+δ</mtext></mrow></msub></math>

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DEVICE PHYSICS (PACS 85)

Modulation speed of an efficient porous silicon light emitting device

T. I. Cox; A. J. Simons; A. Loni; P. D. J. Calcott; L. T. Canham; M. J. Uren; K. J. Nash

J. Appl. Phys. 86, 2764–2773 (1999) https://doi.org/10.1063/1.371123

Abstract

View articletitled, Modulation speed of an efficient porous silicon light emitting device

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Surface energy and polarity of treated indium–tin–oxide anodes for polymer light-emitting diodes studied by contact-angle measurements

J. S. Kim; R. H. Friend; F. Cacialli

J. Appl. Phys. 86, 2774–2778 (1999) https://doi.org/10.1063/1.371124

Abstract

View articletitled, Surface energy and polarity of treated indium–tin–oxide anodes for polymer light-emitting diodes studied by contact-angle measurements

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INTERDISCIPLINARY AND GENERAL PHYSICS (PACS 1-41, 43-47, 79, 81-84, 89-99)

Highly sensitive quantum well infrared photodetectors

Tom Cwik; C. Yeh

J. Appl. Phys. 86, 2779–2784 (1999) https://doi.org/10.1063/1.371125

Abstract

View articletitled, Highly sensitive quantum well infrared photodetectors

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Removing optical artifacts in near-field scanning optical microscopy by using a three-dimensional scanning mode

Claire E. Jordan; Stephan J. Stranick; Lee J. Richter; Richard R. Cavanagh

J. Appl. Phys. 86, 2785–2789 (1999) https://doi.org/10.1063/1.371126

Abstract

View articletitled, Removing optical artifacts in near-field scanning optical microscopy by using a three-dimensional scanning mode

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Electron microprobe quantification: A new model based on electrons rather than on mass

Nicholas E. Pingitore, Jr.; John J. Donovan; Raymond Jeanloz

J. Appl. Phys. 86, 2790–2794 (1999) https://doi.org/10.1063/1.371149

Abstract

View articletitled, Electron microprobe quantification: A new model based on electrons rather than on mass

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Transmission near-field scanning microscope for infrared chemical imaging

Bogdan Dragnea; Jan Preusser; Wolfgang Schade; Stephen R. Leone; William D. Hinsberg

J. Appl. Phys. 86, 2795–2799 (1999) https://doi.org/10.1063/1.371127

Abstract

View articletitled, Transmission near-field scanning microscope for infrared chemical imaging

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Perturbative analytical solutions of the electric forward problem for realistic volume conductors

Guido Nolte; Gabriel Curio

J. Appl. Phys. 86, 2800–2811 (1999) https://doi.org/10.1063/1.371128

Abstract

View articletitled, Perturbative analytical solutions of the electric forward problem for realistic volume conductors

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Electric signal detection at the early stage of laser ablation in air

Y. F. Lu; M. H. Hong

J. Appl. Phys. 86, 2812–2817 (1999) https://doi.org/10.1063/1.371129

Abstract

View articletitled, Electric signal detection at the early stage of laser ablation in air

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Surface acoustic modes in thin films on anisotropic substrates

A. A. Maznev; Ariya Akthakul; Keith A. Nelson

J. Appl. Phys. 86, 2818–2824 (1999) https://doi.org/10.1063/1.371130

Abstract

View articletitled, Surface acoustic modes in thin films on anisotropic substrates

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Theoretical and experimental responses for a large-aperture broadband spherical transducer probing a liquid–solid boundary

J. Zhang; P. Guy; J. C. Baboux; Y. Jayet

J. Appl. Phys. 86, 2825–2835 (1999) https://doi.org/10.1063/1.371131

Abstract

View articletitled, Theoretical and experimental responses for a large-aperture broadband spherical transducer probing a liquid–solid boundary

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An analytical modeling of time dependent pulsed laser melting

Vladimir N. Tokarev; Alexander F. H. Kaplan

J. Appl. Phys. 86, 2836–2846 (1999) https://doi.org/10.1063/1.371132

Abstract

View articletitled, An analytical modeling of time dependent pulsed laser melting

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Excimer laser sputtering of mica surfaces: Mechanisms and applications

K. Rubahn; J. Ihlemann; H.-G. Rubahn

J. Appl. Phys. 86, 2847–2855 (1999) https://doi.org/10.1063/1.371133

Abstract

View articletitled, Excimer laser sputtering of mica surfaces: Mechanisms and applications

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Comprehensive study of the film surface temperature and plasma thermokinetics during ${La}_{1.85} {Sr}_{0.15} {CuO}_{4}$ deposition by laser ablation

Cristina Buzea; Huabing Wang; Kensuke Nakajima; Sang-Jae Kim; Tsutomu Yamashita

J. Appl. Phys. 86, 2856–2864 (1999) https://doi.org/10.1063/1.371134

Abstract

View articletitled, Comprehensive study of the film surface temperature and plasma thermokinetics during <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">La</mi><mrow><mi mathvariant="normal">1.85</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">Sr</mi><mrow><mi mathvariant="normal">0.15</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">CuO</mi><mrow><mi mathvariant="normal">4</mi></mrow></msub></math> deposition by laser ablation

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Electrostatic measurement of plasma plume characteristics in pulsed laser evaporated carbon

R. M. Mayo; J. W. Newman; A. Sharma; Y. Yamagata; J. Narayan

J. Appl. Phys. 86, 2865–2871 (1999) https://doi.org/10.1063/1.371135

Abstract

View articletitled, Electrostatic measurement of plasma plume characteristics in pulsed laser evaporated carbon

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Atomistic simulation study of the interactions of ${SiH}_{3}$ radicals with silicon surfaces

Shyam Ramalingam; Dimitrios Maroudas; Eray S. Aydil

J. Appl. Phys. 86, 2872–2888 (1999) https://doi.org/10.1063/1.371136

Abstract

View articletitled, Atomistic simulation study of the interactions of <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">SiH</mi><mrow><mi mathvariant="normal">3</mi></mrow></msub></math> radicals with silicon surfaces

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The species dependence of inert gas ion incorporation in the ion-induced deposition of tungsten

M. G. McLaren; G. Carter

J. Appl. Phys. 86, 2889–2895 (1999) https://doi.org/10.1063/1.371137

Abstract

View articletitled, The species dependence of inert gas ion incorporation in the ion-induced deposition of tungsten

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Patterned growth on GaAs (311)A substrates: Engineering of growth selectivity for lateral semiconductor nanostructures

Jörg Fricke; Richard Nötzel; Uwe Jahn; Zhichuan Niu; Hans-Peter Schönherr; Manfred Ramsteiner; Klaus H. Ploog

J. Appl. Phys. 86, 2896–2900 (1999) https://doi.org/10.1063/1.371138

Abstract

View articletitled, Patterned growth on GaAs (311)A substrates: Engineering of growth selectivity for lateral semiconductor nanostructures

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Sorption in pulsed laser deposition of multicomponent materials: Experiment versus modeling

M. Tyunina; J. Levoska; S. Leppävuori

J. Appl. Phys. 86, 2901–2908 (1999) https://doi.org/10.1063/1.371139

Abstract

View articletitled, Sorption in pulsed laser deposition of multicomponent materials: Experiment versus modeling

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Grain boundary electrical barriers in positive temperature coefficient thermistors

Katsuro Hayashi; Takahisa Yamamoto; Yuichi Ikuhara; Taketo Sakuma

J. Appl. Phys. 86, 2909–2913 (1999) https://doi.org/10.1063/1.371140

Abstract

View articletitled, Grain boundary electrical barriers in positive temperature coefficient thermistors

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COMMUNICATIONS

The Burstein-Moss effect in ${Cu}_{2} {GeSe}_{3} {:Co}^{2+}$ single crystals

Jeoung Ju Lee; Chang Soo Yang; Young Sin Park; Kun Ho Kim; Wha Tek Kim

J. Appl. Phys. 86, 2914–2916 (1999) https://doi.org/10.1063/1.371141

Abstract

View articletitled, The Burstein-Moss effect in <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">Cu</mi><mrow><mn>2</mn></mrow></msub><msub xmlns=""><mi mathvariant="normal">GeSe</mi><mrow><mn>3</mn></mrow></msub><msup xmlns=""><mi mathvariant="normal">:Co</mi><mrow><mtext>2+</mtext></mrow></msup></math> single crystals

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Interaction between surface acoustic waves and resonant tunneling structures in GaAs

V. I. Talyanskii; A. B. Hutchinson; I. E. Batov; D. A. Ritchie; E. H. Linfield

J. Appl. Phys. 86, 2917–2919 (1999) https://doi.org/10.1063/1.371142

Abstract

View articletitled, Interaction between surface acoustic waves and resonant tunneling structures in GaAs

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Determination of contact angles: Consistency between experiment and theory

A. El Ghzaoui

J. Appl. Phys. 86, 2920–2922 (1999) https://doi.org/10.1063/1.371143

Abstract

View articletitled, Determination of contact angles: Consistency between experiment and theory

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Magnetic field enhancement of water vaporization

Jun Nakagawa; Noriyuki Hirota; Koichi Kitazawa; Makoto Shoda

J. Appl. Phys. 86, 2923–2925 (1999) https://doi.org/10.1063/1.371144

Abstract

View articletitled, Magnetic field enhancement of water vaporization

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ERRATA

Erratum: “A frequency response and transient current study of ${β–Ta}_{2} O_{5} :$ Methods of estimating the dielectric constant, direct current conductivity, and ion mobility” [J. Appl. Phys. 85, 2185 (1999)]

M. Stro/mme Mattsson; G. A. Niklasson; K. Forsgren; A. Hårsta

J. Appl. Phys. 86, 2926 (1999) https://doi.org/10.1063/1.371432

Abstract

View articletitled, Erratum: “A frequency response and transient current study of <math xmlns="http://www.w3.org/1998/Math/MathML"><msub xmlns=""><mi mathvariant="normal">β–Ta</mi><mrow><mi mathvariant="normal">2</mi></mrow></msub><msub xmlns=""><mi mathvariant="normal">O</mi><mrow><mi mathvariant="normal">5</mi></mrow></msub><mi mathvariant="normal" xmlns="">:</mi></math> Methods of estimating the dielectric constant, direct current conductivity, and ion mobility” [J. Appl. Phys. 85, 2185 (1999)]

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Issues

LASERS, OPTICS, AND OPTOELECTRONICS (PACS 42)

PLASMAS AND ELECTRICAL DISCHARGES (PACS 51-52)

STRUCTURAL, MECHANICAL THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER (PACS 61-68, 78)

ELECTRONIC STRUCTURE AND TRANSPORT (PACS 71-73)

MAGNETISM AND SUPERCONDUCTIVITY (PACS 74-76)

DIELECTRICS AND FERROELECTRICITY (PACS 77)

DEVICE PHYSICS (PACS 85)

INTERDISCIPLINARY AND GENERAL PHYSICS (PACS 1-41, 43-47, 79, 81-84, 89-99)

COMMUNICATIONS

ERRATA

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