Skip Nav Destination
Issues
1 November 1998
ISSN 0021-8979
EISSN 1089-7550
In this Issue
GENERAL PHYSICS: NUCLEAR, ATOMIC, AND MOLECULAR (PACS 01-39)
Comparison of fluorescence-based temperature sensor schemes: Theoretical analysis and experimental validation
J. Appl. Phys. 84, 4649–4654 (1998)
https://doi.org/10.1063/1.368705
Characterization and optimization of the detection sensitivity of an atomic force microscope for small cantilevers
J. Appl. Phys. 84, 4661–4666 (1998)
https://doi.org/10.1063/1.368707
CLASSICAL PHENOMENOLOGY: ELECTRICITY, MAGNETISM, OPTICS, ACOUSTICS, HEAT, MECHANICS (PACS 41-52)
Some effects of conduction band nonparabolicity on electron reflection spectrum of multiquantum barriers
J. Appl. Phys. 84, 4667–4672 (1998)
https://doi.org/10.1063/1.368708
Comparison between the Monte Carlo method and the drift-diffusion approximation in quantum-well laser simulation
J. Appl. Phys. 84, 4673–4676 (1998)
https://doi.org/10.1063/1.368709
Giant sonic stop bands in two-dimensional periodic system of fluids
J. Appl. Phys. 84, 4677–4683 (1998)
https://doi.org/10.1063/1.368710
Statistical–mechanical calculations of thermal properties of diatomic gases
J. Appl. Phys. 84, 4693–4703 (1998)
https://doi.org/10.1063/1.368712
Reactions in the afterglow of time modulated inductive discharges of Xe and mixtures
J. Appl. Phys. 84, 4727–4730 (1998)
https://doi.org/10.1063/1.368799
Information from probe characteristics in negative ion containing plasma
J. Appl. Phys. 84, 4731–4735 (1998)
https://doi.org/10.1063/1.368715
Surface interactions of radicals during deposition of amorphous fluorocarbon films from plasmas
J. Appl. Phys. 84, 4736–4743 (1998)
https://doi.org/10.1063/1.368716
Electromagnetic surface wave modes in nonrelativistic electron–positron plasmas
J. Appl. Phys. 84, 4744–4748 (1998)
https://doi.org/10.1063/1.368717
CONDENSED MATTER: STRUCTURE, MECHANICAL, AND THERMAL PROPERTIES (PACS 61-68)
Electrical signatures and thermal stability of interstitial clusters in ion implanted Si
J. Appl. Phys. 84, 4749–4756 (1998)
https://doi.org/10.1063/1.368800
Electrical isolation of n-type GaAs layers by proton bombardment: Effects of the irradiation temperature
J. Appl. Phys. 84, 4757–4760 (1998)
https://doi.org/10.1063/1.368817
Influence of the inhomogeneous surface pretilt on zig-zag defects
J. Appl. Phys. 84, 4761–4768 (1998)
https://doi.org/10.1063/1.368718
Annealing and recrystallization of amorphous silicon carbide produced by ion implantation
J. Appl. Phys. 84, 4769–4774 (1998)
https://doi.org/10.1063/1.368801
Simulation of clustering and transient enhanced diffusion of boron in silicon
J. Appl. Phys. 84, 4781–4787 (1998)
https://doi.org/10.1063/1.368720
Abnormal electrical behavior and phase changes in implanted - and channels under high current densities
J. Appl. Phys. 84, 4788–4796 (1998)
https://doi.org/10.1063/1.368802
Laser ablation induced surface modification of single crystal target in pulsed laser deposition
J. Appl. Phys. 84, 4797–4801 (1998)
https://doi.org/10.1063/1.368721
High-dose helium-implanted single-crystal silicon: Annealing behavior
J. Appl. Phys. 84, 4802–4808 (1998)
https://doi.org/10.1063/1.368803
Evidence for the influence of thermal spikes on ion induced mixing in Si at energies between 3 and 300 keV
J. Appl. Phys. 84, 4809–4814 (1998)
https://doi.org/10.1063/1.368722
X-ray phase-amplitude contrast mapping of single-crystal alloys near the absorption edge of the alloy impurity
J. Appl. Phys. 84, 4815–4821 (1998)
https://doi.org/10.1063/1.368723
Elastic-strain tensor by Rietveld refinement of diffraction measurements
J. Appl. Phys. 84, 4822–4833 (1998)
https://doi.org/10.1063/1.368724
Particle-induced conductivity and photoconductivity of silicon under 17 MeV proton irradiation
J. Appl. Phys. 84, 4834–4841 (1998)
https://doi.org/10.1063/1.368725
Structure and bond length distribution in and intermetallic compounds
J. Appl. Phys. 84, 4842–4846 (1998)
https://doi.org/10.1063/1.368726
Stress-induced alignment and reorientation of hydrogen-associated donors in silicon
J. Appl. Phys. 84, 4847–4850 (1998)
https://doi.org/10.1063/1.368804
Spallation model for the high strain rates range
J. Appl. Phys. 84, 4851–4858 (1998)
https://doi.org/10.1063/1.368727
Direct visualization of the dynamic behavior of a water meniscus by scanning electron microscopy
J. Appl. Phys. 84, 4880–4884 (1998)
https://doi.org/10.1063/1.368731
Density functional theory for calculation of elastic properties of orthorhombic crystals: Application to
J. Appl. Phys. 84, 4891–4904 (1998)
https://doi.org/10.1063/1.368733
Grain refinement and growth instability in undercooled alloys at low undercooling
J. Appl. Phys. 84, 4905–4910 (1998)
https://doi.org/10.1063/1.368734
Characterization of three-dimensional grain boundary topography in a thin film bicrystal grown on a substrate
J. Appl. Phys. 84, 4921–4928 (1998)
https://doi.org/10.1063/1.368736
Carbon and group II acceptor coimplantation in GaAs
J. Appl. Phys. 84, 4929–4934 (1998)
https://doi.org/10.1063/1.368737
CONDENSED MATTER: ELECTRICAL AND MAGNETIC PROPERTIES (PACS 71-76)
First-principles study on electronic and elastic properties of BN, AlN, and GaN
J. Appl. Phys. 84, 4951–4958 (1998)
https://doi.org/10.1063/1.368739
Quasiballistic transport in GaAs-based heterojunction and homojunction bipolar transistors
J. Appl. Phys. 84, 4959–4965 (1998)
https://doi.org/10.1063/1.368740
Improved quantitative mobility spectrum analysis for Hall characterization
J. Appl. Phys. 84, 4966–4973 (1998)
https://doi.org/10.1063/1.368741
Energy considerations during the growth of a molten filament in metal-to-metal amorphous-silicon antifuses
J. Appl. Phys. 84, 4979–4983 (1998)
https://doi.org/10.1063/1.368743
Electrical conduction in exploded segmented wires
J. Appl. Phys. 84, 4992–5000 (1998)
https://doi.org/10.1063/1.368745
Microscopic analysis of the influence of strain and band-gap offsets on noise characteristics in heterojunctions
J. Appl. Phys. 84, 5012–5020 (1998)
https://doi.org/10.1063/1.368748
Operation and design of metal-oxide tunnel transistors
J. Appl. Phys. 84, 5021–5031 (1998)
https://doi.org/10.1063/1.368749
I–V characteristics of resonant tunneling devices: Difference equation method
J. Appl. Phys. 84, 5037–5045 (1998)
https://doi.org/10.1063/1.368751
Structural and electronic properties of boron nitride thin films containing silicon
C. Ronning; A. D. Banks; B. L. McCarson; R. Schlesser; Z. Sitar; R. F. Davis; B. L. Ward; R. J. Nemanich
J. Appl. Phys. 84, 5046–5051 (1998)
https://doi.org/10.1063/1.368752
Single electron tunneling and suppression of short-channel effects in submicron silicon transistors
J. Appl. Phys. 84, 5052–5056 (1998)
https://doi.org/10.1063/1.368753
Noise characteristics of radio frequency sputtered amorphous silicon carbide films
J. Appl. Phys. 84, 5057–5059 (1998)
https://doi.org/10.1063/1.368798
Self-consistent analysis of persistent photoconductivity data in Si δ-doped superlattices
J. Appl. Phys. 84, 5060–5063 (1998)
https://doi.org/10.1063/1.368806
Enhanced anticrossing in an asymmetric double-well GaAs/AlAs superlattice with two kinds of Stark-ladder states
J. Appl. Phys. 84, 5064–5069 (1998)
https://doi.org/10.1063/1.368754
Stress-induced leakage current reduction by a low field of opposite polarity to the stress field
J. Appl. Phys. 84, 5070–5079 (1998)
https://doi.org/10.1063/1.368755
High-rate deposition of films by hot cluster epitaxy
J. Appl. Phys. 84, 5084–5088 (1998)
https://doi.org/10.1063/1.368757
Exchange anisotropy in epitaxial and bilayers grown by pulsed laser deposition
J. Appl. Phys. 84, 5097–5104 (1998)
https://doi.org/10.1063/1.368759
Effect of the Si/B ratio on the magnetic anisotropy distribution of alloys along nanocrystallization
J. Appl. Phys. 84, 5108–5113 (1998)
https://doi.org/10.1063/1.368807
Quantum theory for the temperature dependences of magnetic configurations in magnetic ultrathin films
J. Appl. Phys. 84, 5123–5128 (1998)
https://doi.org/10.1063/1.368762
Low temperature irreversibilities in the magnetothermal behavior of
J. Appl. Phys. 84, 5129–5133 (1998)
https://doi.org/10.1063/1.368763
CONDENSED MATTER: DIELECTRIC AND OPTICAL PROPERTIES (PACS 77-79)
Amorphous ferroelectric thin films with enhanced induced interfacial polarization potential
J. Appl. Phys. 84, 5134–5139 (1998)
https://doi.org/10.1063/1.368764
Single crystal growth and ferroelectric properties of solid solutions
J. Appl. Phys. 84, 5140–5146 (1998)
https://doi.org/10.1063/1.368808
Phase development and electrical property analysis of pulsed laser deposited (70/30) epitaxial thin films
J. Appl. Phys. 84, 5147–5154 (1998)
https://doi.org/10.1063/1.368809
Second harmonic generation capabilities of ion implanted waveguides
J. Appl. Phys. 84, 5180–5183 (1998)
https://doi.org/10.1063/1.368811
Exponential absorption edge and disorder in Column IV amorphous semiconductors
J. Appl. Phys. 84, 5184–5190 (1998)
https://doi.org/10.1063/1.368768
Influence of Zn/In codoping on the optical properties of lithium niobate
K. Kasemir; K. Betzler; B. Matzas; B. Tiegel; T. Wahlbrink; M. Wöhlecke; B. Gather; N. Rubinina; T. Volk
J. Appl. Phys. 84, 5191–5193 (1998)
https://doi.org/10.1063/1.368769
A prism coupler technique for characterizing thin film II–VI semiconductor systems
J. Appl. Phys. 84, 5194–5197 (1998)
https://doi.org/10.1063/1.368770
Micro-Raman and photoluminescence investigation of thin film under high pressure
J. Appl. Phys. 84, 5198–5201 (1998)
https://doi.org/10.1063/1.368771
Characterization of ion-implanted films and silica glasses
J. Appl. Phys. 84, 5210–5217 (1998)
https://doi.org/10.1063/1.368812
A study of the photothermal signal produced by a series of subsurface cylinders in opaque materials
J. Appl. Phys. 84, 5229–5237 (1998)
https://doi.org/10.1063/1.368774
CROSS-DISCIPLINARY PHYSICS (PACS 81-98)
Thermal dissociation process of hydrogen atoms in plasma-enhanced chemical vapor deposited silicon nitride films
J. Appl. Phys. 84, 5243–5247 (1998)
https://doi.org/10.1063/1.368813
Formation and size control of a Ni cluster by plasma gas condensation
J. Appl. Phys. 84, 5270–5276 (1998)
https://doi.org/10.1063/1.368776
The role of size effects on the crystallization of amorphous Ge in contact with Bi nanocrystals
J. Appl. Phys. 84, 5283–5290 (1998)
https://doi.org/10.1063/1.368777
Application of photoreflectance spectroscopy to the study of interface roughness in heterointerfaces
J. Appl. Phys. 84, 5291–5295 (1998)
https://doi.org/10.1063/1.368816
In situ ellipsometric characterization of films grown by laser ablation
J. Appl. Phys. 84, 5296–5305 (1998)
https://doi.org/10.1063/1.368778
A numerical study of operational characteristics of organic light-emitting diodes
J. Appl. Phys. 84, 5306–5314 (1998)
https://doi.org/10.1063/1.368779
Temperature dependence of the barrier height of Schottky diodes
J. Appl. Phys. 84, 5326–5330 (1998)
https://doi.org/10.1063/1.368781
Solar blind chemically vapor deposited diamond detectors for vacuum ultraviolet pulsed light-source characterization
F. Foulon; P. Bergonzo; C. Borel; R. D. Marshall; C. Jany; L. Besombes; A. Brambilla; D. Riedel; L. Museur; M. C. Castex; A. Gicquel
J. Appl. Phys. 84, 5331–5336 (1998)
https://doi.org/10.1063/1.368782
Minority carrier capture at DX centers in AlGaSb Schottky diodes
J. Appl. Phys. 84, 5337–5341 (1998)
https://doi.org/10.1063/1.368783
COMMUNICATIONS
A study of deep centers in crystals using deep-level transient spectroscopy
J. Appl. Phys. 84, 5345–5347 (1998)
https://doi.org/10.1063/1.368785
Spectroscopic assessment of as a potential diode-pumped laser near 1.9 μm
J. Appl. Phys. 84, 5348–5350 (1998)
https://doi.org/10.1063/1.368786
Alignment of two-valley resonance levels and characteristics of GaAs/AlAs resonant tunneling diodes
J. Appl. Phys. 84, 5354–5356 (1998)
https://doi.org/10.1063/1.368788
Theoretical investigation of mid-infrared interband cascade lasers based on type II quantum wells
J. Appl. Phys. 84, 5357–5359 (1998)
https://doi.org/10.1063/1.368789
Efficient directional spontaneous emission from an InGaAs/InP heterostructure with an integral parabolic reflector
J. Appl. Phys. 84, 5360–5362 (1998)
https://doi.org/10.1063/1.368790
Analysis of the Fiske modes in a short Josephson junction with nonuniform critical current density
J. Appl. Phys. 84, 5363–5365 (1998)
https://doi.org/10.1063/1.368791
Controlling magnetic and transport properties of granular alloys through Joule heating
J. Appl. Phys. 84, 5366–5368 (1998)
https://doi.org/10.1063/1.368792
Strong interface effects in graded quantum wells
J. Appl. Phys. 84, 5369–5371 (1998)
https://doi.org/10.1063/1.368818
ERRATA
Impulse coupling enhancement of aluminum targets under laser irradiation in a soft polymer confined geometry
C. Le Bras, E. Lescoute, et al.
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
GaN-based power devices: Physics, reliability, and perspectives
Matteo Meneghini, Carlo De Santi, et al.