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Issues
1 October 1998
ISSN 0021-8979
EISSN 1089-7550
In this Issue
GENERAL PHYSICS: NUCLEAR, ATOMIC, AND MOLECULAR (PACS 01-39)
Electron attachment to photofragments and Rydberg states in laser-irradiated
J. Appl. Phys. 84, 3442–3450 (1998)
https://doi.org/10.1063/1.368518
CLASSICAL PHENOMENOLOGY: ELECTRICITY, MAGNETISM, OPTICS, ACOUSTICS, HEAT, MECHANICS (PACS 41-52)
Theory of third harmonic generation in random composites of nonlinear dielectrics
J. Appl. Phys. 84, 3451–3458 (1998)
https://doi.org/10.1063/1.368519
Hot-optical-phonon effects on electron relaxation in an AlGaAs/GaAs quantum cascade laser structure
J. Appl. Phys. 84, 3459–3466 (1998)
https://doi.org/10.1063/1.368520
Optically pumped mid-infrared vibrational hydrogen chloride laser
J. Appl. Phys. 84, 3467–3473 (1998)
https://doi.org/10.1063/1.368521
Wavelength selectivity of the complex grating structure formed in a photorefractive phase conjugator
J. Appl. Phys. 84, 3483–3490 (1998)
https://doi.org/10.1063/1.368523
Cumulative second-harmonic generation accompanying nonlinear shear horizontal mode propagation in a solid plate
J. Appl. Phys. 84, 3500–3505 (1998)
https://doi.org/10.1063/1.368525
A theoretical model for gas metal arc welding and gas tungsten arc welding. I.
J. Appl. Phys. 84, 3518–3529 (1998)
https://doi.org/10.1063/1.368527
CONDENSED MATTER: STRUCTURE, MECHANICAL, AND THERMAL PROPERTIES (PACS 61-68)
Effect of the silicon/oxide interface on interstitials: Di-interstitial recombination
J. Appl. Phys. 84, 3555–3560 (1998)
https://doi.org/10.1063/1.368530
Thermal donor formation and annihilation at temperatures above 500 °C in Czochralski-grown Si
J. Appl. Phys. 84, 3561–3568 (1998)
https://doi.org/10.1063/1.368586
Infrared studies of defects formed during postirradiation anneals of Czochralski silicon
J. Appl. Phys. 84, 3569–3573 (1998)
https://doi.org/10.1063/1.368531
A least squares method for fitting diffusion data to the Whipple/Suzuoka equations for grain boundary diffusion
J. Appl. Phys. 84, 3586–3592 (1998)
https://doi.org/10.1063/1.368534
Arsenic deactivation enhanced diffusion: A time, temperature, and concentration study
J. Appl. Phys. 84, 3593–3601 (1998)
https://doi.org/10.1063/1.368593
Thermal diffusivity measurement of solid materials by the pulsed photothermal displacement technique
J. Appl. Phys. 84, 3602–3610 (1998)
https://doi.org/10.1063/1.368535
Diffusion lengths of carriers in - and -type ZnMgSSe cladding layers of green laser diodes
J. Appl. Phys. 84, 3611–3616 (1998)
https://doi.org/10.1063/1.368819
Structure, magnetic, and magneto-optical properties of MnBi films grown on quartz and (001)GaAs substrates
J. Appl. Phys. 84, 3625–3629 (1998)
https://doi.org/10.1063/1.368537
The growth of pinhole-free epitaxial films on atomically clean Si(111)
J. Appl. Phys. 84, 3630–3635 (1998)
https://doi.org/10.1063/1.368538
An atomistic simulator for thin film deposition in three dimensions
J. Appl. Phys. 84, 3636–3649 (1998)
https://doi.org/10.1063/1.368539
Reciprocal space maps of PbTe/SnTe superlattices
S. O. Ferreira; E. Abramof; P. H. O. Rappl; A. Y. Ueta; H. Closs; C. Boschetti; P. Motisuke; I. N. Bandeira
J. Appl. Phys. 84, 3650–3653 (1998)
https://doi.org/10.1063/1.368540
Environment of Er in epitaxial thin films using local techniques
A. S. Barrière; T. Césaire; L. Hirsch; B. Porté; G. Villenueve; Luis Lezama; T. Rojo; G. E. Barberis
J. Appl. Phys. 84, 3654–3657 (1998)
https://doi.org/10.1063/1.368541
Surface structures and electronic states of clean and -treated InAs(111)A and (111)B
J. Appl. Phys. 84, 3658–3663 (1998)
https://doi.org/10.1063/1.368594
Combinatorial approaches toward patterning nanocrystals
J. Appl. Phys. 84, 3664–3670 (1998)
https://doi.org/10.1063/1.368542
CONDENSED MATTER: ELECTRICAL AND MAGNETIC PROPERTIES (PACS 71-76)
Bound exciton luminescence in Te-doped SrS
Philip D. Rack; Jay S. Lewis; Paul H. Holloway; Wounjhang Park; Brent K. Wagner; Christopher J. Summers
J. Appl. Phys. 84, 3676–3683 (1998)
https://doi.org/10.1063/1.368544
Finite-temperature full random-phase approximation model of band gap narrowing for silicon device simulation
J. Appl. Phys. 84, 3684–3695 (1998)
https://doi.org/10.1063/1.368545
Optical constants and electronic interband transitions of disordered alloys
J. Appl. Phys. 84, 3696–3699 (1998)
https://doi.org/10.1063/1.368546
Investigation of the electrical properties of varistor system using impedance spectroscopy
J. Appl. Phys. 84, 3700–3705 (1998)
https://doi.org/10.1063/1.368587
Improved Monte Carlo method for the study of electron transport in degenerate semiconductors
J. Appl. Phys. 84, 3706–3709 (1998)
https://doi.org/10.1063/1.368547
Finite element analysis of strain effects on electronic and transport properties in quantum dots and wires
J. Appl. Phys. 84, 3714–3725 (1998)
https://doi.org/10.1063/1.368549
Consequences of space dependence of effective mass in heterostructures
J. Appl. Phys. 84, 3726–3730 (1998)
https://doi.org/10.1063/1.368550
Photogeneration of charge carriers in anisotropic multilayer structures of phthalocyaninato-polysiloxane
J. Appl. Phys. 84, 3731–3740 (1998)
https://doi.org/10.1063/1.368551
Electrical characterization of InP/GaInP quantum dots by space charge spectroscopy
J. Appl. Phys. 84, 3747–3755 (1998)
https://doi.org/10.1063/1.368553
Electron transport in metallic dot arrays: Effect of a broad dispersion in the tunnel junction dimensions
J. Appl. Phys. 84, 3756–3763 (1998)
https://doi.org/10.1063/1.368554
Influence of the real shape of a sample on the pinning induced magnetostriction
J. Appl. Phys. 84, 3770–3775 (1998)
https://doi.org/10.1063/1.368555
Modeling of microwave magnetic envelope solitons in thin ferrite films through the nonlinear Schrödinger equation
J. Appl. Phys. 84, 3776–3785 (1998)
https://doi.org/10.1063/1.368556
Kinetic aspects of the solid hydrogenation– disproportionation–desorption–recombination process in alloys
J. Appl. Phys. 84, 3786–3791 (1998)
https://doi.org/10.1063/1.368589
Magnetization process and magnetoimpedance in
J. Appl. Phys. 84, 3792–3797 (1998)
https://doi.org/10.1063/1.368557
Magnetotransport and magnetocaloric properties of
J. Appl. Phys. 84, 3798–3801 (1998)
https://doi.org/10.1063/1.368558
CONDENSED MATTER: DIELECTRIC AND OPTICAL PROPERTIES (PACS 77-79)
Microscopic characterization of low-field switching in ferroelectric triglycine sulfate
J. Appl. Phys. 84, 3802–3805 (1998)
https://doi.org/10.1063/1.368590
Narrow band 390 nm emitting phosphors for photoluminescent liquid crystal displays
J. Appl. Phys. 84, 3827–3829 (1998)
https://doi.org/10.1063/1.368561
Properties of molecular-beam epitaxy-grown GaNAs from optical spectroscopy
J. Appl. Phys. 84, 3830–3835 (1998)
https://doi.org/10.1063/1.368562
A comparative analysis of by infrared spectroscopy and mass selected thermal effusion
J. Appl. Phys. 84, 3836–3847 (1998)
https://doi.org/10.1063/1.368563
Photoluminescence studies of excitonic transitions in GaN epitaxial layers
J. Appl. Phys. 84, 3848–3859 (1998)
https://doi.org/10.1063/1.368564
Room-temperature photoluminescence from Tb ions implanted in on Si
J. Appl. Phys. 84, 3867–3871 (1998)
https://doi.org/10.1063/1.368591
Influence of temperature and phase transitions on the Urbach’s tails of absorption spectra for single crystals
J. Appl. Phys. 84, 3872–3879 (1998)
https://doi.org/10.1063/1.368566
Mechanism of explosive electron emission for dielectric fiber (velvet) cathodes
J. Appl. Phys. 84, 3880–3889 (1998)
https://doi.org/10.1063/1.368567
Modification on the electron field emission properties of diamond films: The effect of bias voltage applied in situ
J. Appl. Phys. 84, 3890–3894 (1998)
https://doi.org/10.1063/1.368568
CROSS-DISCIPLINARY PHYSICS (PACS 81-98)
Interactions of SiH radicals with silicon surfaces: An atomic-scale simulation study
J. Appl. Phys. 84, 3895–3911 (1998)
https://doi.org/10.1063/1.368569
Plasma assisted molecular beam epitaxy of ZnO on c -plane sapphire: Growth and characterization
J. Appl. Phys. 84, 3912–3918 (1998)
https://doi.org/10.1063/1.368595
Growth and composition of dual-plasma polymer-like amorphous carbon films
J. Appl. Phys. 84, 3919–3932 (1998)
https://doi.org/10.1063/1.368570
Selective wet etching of GaAs on for AlGaAs/InGaAs/AlGaAs pseudomorphic high electron mobility transistor
J. Appl. Phys. 84, 3933–3938 (1998)
https://doi.org/10.1063/1.368571
Effect of Pt layers on the photoelectrochemical properties of a electrode
J. Appl. Phys. 84, 3954–3959 (1998)
https://doi.org/10.1063/1.368573
Effect of an inhomogeneous insulating film on the capacitance of metal–insulator–semiconductor structures
J. Appl. Phys. 84, 3960–3965 (1998)
https://doi.org/10.1063/1.368574
Critical current in high grain boundary junctions
J. Appl. Phys. 84, 3972–3979 (1998)
https://doi.org/10.1063/1.368576
Voltage switching and oscillations in a single barrier heterostructure hot-electron diode
J. Appl. Phys. 84, 3980–3985 (1998)
https://doi.org/10.1063/1.368577
Back-channel-oxidized thin-film transistors
J. Appl. Phys. 84, 3993–3999 (1998)
https://doi.org/10.1063/1.368579
Three-dimensional simulation of quantum cellular automata and the zero-dimensional approximation
J. Appl. Phys. 84, 4000–4005 (1998)
https://doi.org/10.1063/1.368580
Coplanar amorphous silicon thin film transistor fabricated by inductively coupled plasma chemical vapor deposition
J. Appl. Phys. 84, 4006–4012 (1998)
https://doi.org/10.1063/1.368581
Accurate thickness/density measurements of organic light-emitting diodes
J. Appl. Phys. 84, 4013–4016 (1998)
https://doi.org/10.1063/1.368582
COMMUNICATIONS
Exact electron momentum-relaxation times in GaN associated with scattering by polar-optical phonons
J. Appl. Phys. 84, 4020–4021 (1998)
https://doi.org/10.1063/1.368584
Temperature dependence of the Raman spectra of carbon nanotubes
J. Appl. Phys. 84, 4022–4024 (1998)
https://doi.org/10.1063/1.368585
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Celebrating notable advances in compound semiconductors: A tribute to Dr. Wladyslaw Walukiewicz
Kirstin Alberi, Junqiao Wu, et al.
GaN-based power devices: Physics, reliability, and perspectives
Matteo Meneghini, Carlo De Santi, et al.