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Issues
1 August 1998
ISSN 0021-8979
EISSN 1089-7550
In this Issue
GENERAL PHYSICS: NUCLEAR, ATOMIC, AND MOLECULAR (PACS 01-39)
Systematic errors of locally resolved photothermal radiometric measurements
J. Appl. Phys. 84, 1163–1167 (1998)
https://doi.org/10.1063/1.368180
Efficient excimer ultraviolet sources from a dielectric barrier discharge
J. Appl. Phys. 84, 1174–1178 (1998)
https://doi.org/10.1063/1.368182
CLASSICAL PHENOMENOLOGY: ELECTRICITY, MAGNETISM, OPTICS, ACOUSTICS, HEAT, MECHANICS (PACS 41-52)
Linear and nonlinear optical properties of ridge waveguides
J. Appl. Phys. 84, 1186–1195 (1998)
https://doi.org/10.1063/1.368184
Optical-field calculations for lossy multiple-layer N laser diodes
J. Appl. Phys. 84, 1196–1203 (1998)
https://doi.org/10.1063/1.368185
Effect of buffer layer on propagation loss in channel waveguides
J. Appl. Phys. 84, 1204–1209 (1998)
https://doi.org/10.1063/1.368244
Numerical study on localized defect modes in two-dimensional triangular photonic crystals
J. Appl. Phys. 84, 1210–1214 (1998)
https://doi.org/10.1063/1.368186
destruction in 50 Hz and 25 kHz gliding arc reactors
J. Appl. Phys. 84, 1215–1221 (1998)
https://doi.org/10.1063/1.368187
Charge distribution function of dust particles in low temperature plasmas
J. Appl. Phys. 84, 1231–1235 (1998)
https://doi.org/10.1063/1.368188
Effects of rapidly decaying plasmas on Langmuir probe measurements
J. Appl. Phys. 84, 1236–1240 (1998)
https://doi.org/10.1063/1.368189
CONDENSED MATTER: STRUCTURE, MECHANICAL, AND THERMAL PROPERTIES (PACS 61-68)
Dependence of the density of defects in the oxide on Czochralski silicon on its thickness
J. Appl. Phys. 84, 1241–1245 (1998)
https://doi.org/10.1063/1.368190
Local vibrational mode bands due to a -like hydrogen-related center in silicon
J. Appl. Phys. 84, 1246–1250 (1998)
https://doi.org/10.1063/1.368191
Combined transmission electron microscopy and cathodoluminescence studies of degradation in electron-beam-pumped blue-green lasers
Jean-Marc Bonard; Jean-Daniel Ganière; Lia Vanzetti; Jens J. Paggel; Lucia Sorba; Alfonso Franciosi; Denis Hervé; Engin Molva
J. Appl. Phys. 84, 1263–1273 (1998)
https://doi.org/10.1063/1.368193
Electrical and optical characterization of ion-implanted single crystals
J. Appl. Phys. 84, 1274–1278 (1998)
https://doi.org/10.1063/1.368194
Equilibrium constant of segregation-induced Fe gettered by heavy boron doping in Si
J. Appl. Phys. 84, 1279–1283 (1998)
https://doi.org/10.1063/1.368195
Scaling approach to conical indentation in elastic-plastic solids with work hardening
J. Appl. Phys. 84, 1284–1291 (1998)
https://doi.org/10.1063/1.368196
A numerical study of shock-induced particle velocity dispersion in solid mixtures
J. Appl. Phys. 84, 1292–1298 (1998)
https://doi.org/10.1063/1.368197
Two-step dopant diffusion study performed in two dimensions by scanning capacitance microscopy and TSUPREM IV
J. Appl. Phys. 84, 1305–1309 (1998)
https://doi.org/10.1063/1.368245
Bistable nematic azimuthal alignment induced by anchoring competition
J. Appl. Phys. 84, 1321–1324 (1998)
https://doi.org/10.1063/1.368200
Deep level spectroscopy of high-power laser diode arrays
J. W. Tomm; A. Bärwolff; A. Jaeger; T. Elsaesser; J. Bollmann; W. T. Masselink; A. Gerhardt; J. Donecker
J. Appl. Phys. 84, 1325–1332 (1998)
https://doi.org/10.1063/1.368201
Fabrication of narrow-band-gap hydrogenated amorphous silicon by chemical annealing
J. Appl. Phys. 84, 1333–1339 (1998)
https://doi.org/10.1063/1.368202
The phototransformation of thin films on GaAs(100) studied by in situ Raman spectroscopy
J. Appl. Phys. 84, 1340–1345 (1998)
https://doi.org/10.1063/1.368203
Surface roughness and in-plane texturing in sputtered thin films
J. Appl. Phys. 84, 1346–1353 (1998)
https://doi.org/10.1063/1.368204
Electrically active point defects in -type
J. P. Doyle; M. K. Linnarsson; P. Pellegrino; N. Keskitalo; B. G. Svensson; A. Schöner; N. Nordell; J. L. Lindström
J. Appl. Phys. 84, 1354–1357 (1998)
https://doi.org/10.1063/1.368247
Elastic and piezoelectric fields around a buried quantum dot: A simple picture
J. Appl. Phys. 84, 1358–1365 (1998)
https://doi.org/10.1063/1.368205
Effect of plasma treatment on the density of defects at an amorphous -insulator interface
J. Appl. Phys. 84, 1371–1377 (1998)
https://doi.org/10.1063/1.368249
Geometrical field effects in voltage pulse fabrication of nanostructures using scanning tunneling microscopy
J. Appl. Phys. 84, 1378–1382 (1998)
https://doi.org/10.1063/1.368171
Nucleation processes during metalorganic vapor phase epitaxy of ZnSe on GaAs(001)
J. Appl. Phys. 84, 1383–1388 (1998)
https://doi.org/10.1063/1.368250
Phase separation and ordering in InGaN alloys grown by molecular beam epitaxy
J. Appl. Phys. 84, 1389–1395 (1998)
https://doi.org/10.1063/1.368251
CONDENSED MATTER: ELECTRICAL AND MAGNETIC PROPERTIES (PACS 71-76)
Balance-equation approach to hot-electron transport in semiconductors irradiated by an intense terahertz field
J. Appl. Phys. 84, 1396–1404 (1998)
https://doi.org/10.1063/1.368172
Doping effects on the high-frequency mobility of minority carriers in -GaAs
J. Appl. Phys. 84, 1405–1407 (1998)
https://doi.org/10.1063/1.368173
Electrical properties of Co-doped and Ni-doped
J. Appl. Phys. 84, 1408–1411 (1998)
https://doi.org/10.1063/1.368174
Kinetic behavior analysis of porphyrin Langmuir–Blodgett films for conductive gas sensors
J. Appl. Phys. 84, 1416–1420 (1998)
https://doi.org/10.1063/1.368252
Evolution in the charge injection efficiency of evaporated Au contacts on a molecularly doped polymer
J. Appl. Phys. 84, 1439–1444 (1998)
https://doi.org/10.1063/1.368179
Charge injection from polyaniline-poly (methylmethacrylate) blends into poly (p-phenylene vinylene)
J. Appl. Phys. 84, 1445–1448 (1998)
https://doi.org/10.1063/1.368606
Effects of recombination current on the current–voltage characteristics in metal–InGaAs Schottky diodes
J. Appl. Phys. 84, 1449–1453 (1998)
https://doi.org/10.1063/1.368206
The effects of electric field on the electronic structure of a semiconductor quantum dot
J. Appl. Phys. 84, 1454–1459 (1998)
https://doi.org/10.1063/1.368207
Resonant interband tunneling current in InAs/AlSb/GaSb/AlSb/InAs double barrier diodes
J. Appl. Phys. 84, 1460–1466 (1998)
https://doi.org/10.1063/1.368208
Anomalous Hall conductivity and magnetoresistance in epitaxial thin films
J. Appl. Phys. 84, 1467–1471 (1998)
https://doi.org/10.1063/1.368209
-type doping of lattice-matched ZnCdSe and epilayers on InP using
J. Appl. Phys. 84, 1472–1475 (1998)
https://doi.org/10.1063/1.368210
Small inductance approximation of phase locking in multijunction SQUIDs
J. Appl. Phys. 84, 1476–1480 (1998)
https://doi.org/10.1063/1.368211
Magnetic flux distribution around Bi2212 superconducting single crystal: The paramagnetic resonance technique
J. Appl. Phys. 84, 1481–1484 (1998)
https://doi.org/10.1063/1.368212
Negative remanent magnetization of fine particles with competing cubic and uniaxial anisotropies
J. Appl. Phys. 84, 1488–1492 (1998)
https://doi.org/10.1063/1.368214
Anomalous Hall resistivities of single-crystal and martensite films epitaxially grown by molecular beam epitaxy
J. Appl. Phys. 84, 1493–1498 (1998)
https://doi.org/10.1063/1.368253
Growth temperature dependence of the magnetic and structural properties of epitaxial Fe layers on MgO(001)
J. Appl. Phys. 84, 1499–1503 (1998)
https://doi.org/10.1063/1.368215
Structural and magnetic fourfold symmetry of Co/Cu multilayers electrodeposited on Si(001) substrates
J. Appl. Phys. 84, 1504–1507 (1998)
https://doi.org/10.1063/1.368254
CONDENSED MATTER: DIELECTRIC AND OPTICAL PROPERTIES (PACS 77-79)
Influence of sample thickness on the performance of photostrictive ceramics
J. Appl. Phys. 84, 1508–1512 (1998)
https://doi.org/10.1063/1.368216
The simulation of switching in polycrystalline ferroelectric ceramics
J. Appl. Phys. 84, 1530–1540 (1998)
https://doi.org/10.1063/1.368219
Optical and structural characterization of ZnSe films grown by molecular beam epitaxy on GaAs substrates with and without GaAs buffer layers
J. Luyo-Alvarado; M. Meléndez-Lira; M. López-López; I. Hernández-Calderón; M. E. Constantino; H. Navarro-Contreras; M. A. Vidal; Y. Takagi; K. Samonji; H. Yonezu
J. Appl. Phys. 84, 1551–1557 (1998)
https://doi.org/10.1063/1.368222
Infrared absorptions in crystals
J. Appl. Phys. 84, 1558–1560 (1998)
https://doi.org/10.1063/1.368255
Reflectivity study of hexagonal GaN films grown on GaAs: Surface roughness, interface layer, and refractive index
J. Appl. Phys. 84, 1561–1566 (1998)
https://doi.org/10.1063/1.368223
Optical properties of and single crystals
Tae-Young Park; Ji-Young Lim; Seok-Kyun Oh; Kwang-Ho Park; Ho-Jun Song; Wha-Tek Kim; Sung-Hyu Choe; Chang-Dae Kim; Chang-Sun Yoon
J. Appl. Phys. 84, 1567–1571 (1998)
https://doi.org/10.1063/1.368224
Indium phosphide vapor phase epitaxy at high growth rates, growth kinetics, and characterization
J. Appl. Phys. 84, 1572–1578 (1998)
https://doi.org/10.1063/1.368225
Gallium nitride/conjugated polymer hybrid light emitting diodes: Performance and lifetime
J. Appl. Phys. 84, 1579–1582 (1998)
https://doi.org/10.1063/1.368226
Photovoltaic measurement of the built-in potential in organic light emitting diodes and photodiodes
J. Appl. Phys. 84, 1583–1587 (1998)
https://doi.org/10.1063/1.368227
Photoreflectance spectroscopy of strained-layer (111)B InGaAs/GaAs quantum well diodes
J. Appl. Phys. 84, 1595–1601 (1998)
https://doi.org/10.1063/1.368229
Field emission from chemical vapor deposited diamond and diamond-like carbon films: Investigations of surface damage and conduction mechanisms
Paul W. May; Stefan Höhn; Michael N. R. Ashfold; Wang N. Wang; Neil A. Fox; Tim J. Davis; J. W. Steeds
J. Appl. Phys. 84, 1618–1625 (1998)
https://doi.org/10.1063/1.368231
CROSS-DISCIPLINARY PHYSICS (PACS 81-98)
Formation of carbon nanotubes and their filling with metallic fibers on ion-emitting field anodes
J. Appl. Phys. 84, 1626–1631 (1998)
https://doi.org/10.1063/1.368232
Reduction of the extended defect density in molecular beam epitaxy grown ZnSe based II-VI heterostructures by the use of a BeTe buffer layer
F. Fischer; M. Keller; T. Gerhard; T. Behr; T. Litz; H. J. Lugauer; M. Keim; G. Reuscher; T. Baron; A. Waag; G. Landwehr
J. Appl. Phys. 84, 1650–1654 (1998)
https://doi.org/10.1063/1.368234
Model for the chemical erosion of graphite due to low-energy and impact
J. Appl. Phys. 84, 1655–1669 (1998)
https://doi.org/10.1063/1.368235
Micromachined YBaCuO capacitor structures as uncooled pyroelectric infrared detectors
J. Appl. Phys. 84, 1680–1687 (1998)
https://doi.org/10.1063/1.368257
Surface effects on current mechanisms in structures passivated with a deposited oxide
J. Appl. Phys. 84, 1688–1692 (1998)
https://doi.org/10.1063/1.368237
Quasidrift limited field-effect current in polycrystalline silicon: Wide grain boundary approximation
J. Appl. Phys. 84, 1697–1702 (1998)
https://doi.org/10.1063/1.368239
COMMUNICATIONS
Polarity determination of a GaN thin film on sapphire (0001) with x-ray standing waves
A. Kazimirov; G. Scherb; J. Zegenhagen; T.-L. Lee; M. J. Bedzyk; M. K. Kelly; H. Angerer; O. Ambacher
J. Appl. Phys. 84, 1703–1705 (1998)
https://doi.org/10.1063/1.368240
Negative ion emission from a stainless steel surface due to positive ion collisions
J. Appl. Phys. 84, 1706–1707 (1998)
https://doi.org/10.1063/1.368241