Skip Nav Destination
Issues
Optimum performance of a regenerative Brayton thermal cycle
J. Appl. Phys. 82, 2735–2741 (1997)
https://doi.org/10.1063/1.366104
Full-energy absorption of x-ray energies near the Xe - and -photoionization thresholds in xenon gas detectors: Simulation and experimental results
T. H. V. T. Dias; J. M. F. dos Santos; P. J. B. M. Rachinhas; F. P. Santos; C. A. N. Conde; A. D. Stauffer
J. Appl. Phys. 82, 2742–2753 (1997)
https://doi.org/10.1063/1.366105
Statistical models for charge collection efficiency and variance in semiconductor spectrometers
J. Appl. Phys. 82, 2754–2758 (1997)
https://doi.org/10.1063/1.366106
Cross relaxation and upconversion coefficients of the mid-infrared transitions of
J. Appl. Phys. 82, 2759–2765 (1997)
https://doi.org/10.1063/1.366107
Influence of noise in the route to chaos of directly modulated semiconductor lasers
J. Appl. Phys. 82, 2766–2772 (1997)
https://doi.org/10.1063/1.366108
Optically induced rotation of dissymmetrically shaped fluorinated polyimide micro-objects in optical traps
J. Appl. Phys. 82, 2773–2779 (1997)
https://doi.org/10.1063/1.366163
Effect of a magnetic field on the stability of the flow of molten material in laser cutting processes
J. Appl. Phys. 82, 2780–2790 (1997)
https://doi.org/10.1063/1.366109
Mechanical vibration of freely suspended ferroelectric liquid-crystal film excited by sound and electric field
J. Appl. Phys. 82, 2791–2794 (1997)
https://doi.org/10.1063/1.366162
Experimental and theoretical study of dissociation in the positive column of a hydrogen glow discharge
J. Appl. Phys. 82, 2795–2804 (1997)
https://doi.org/10.1063/1.366110
Argon metastable densities in radio frequency Ar, and electrical discharges
J. Appl. Phys. 82, 2805–2813 (1997)
https://doi.org/10.1063/1.366111
Characterization of pulse-modulated inductively coupled plasmas in argon and chlorine
J. Appl. Phys. 82, 2814–2821 (1997)
https://doi.org/10.1063/1.366277
Enhanced energy loss of short pulses of electrons in plasma
J. Appl. Phys. 82, 2822–2825 (1997)
https://doi.org/10.1063/1.366112
Shock waves from a water-confined laser-generated plasma
J. Appl. Phys. 82, 2826–2832 (1997)
https://doi.org/10.1063/1.366113
Shock wave initiation of the reaction in elemental powders
J. Appl. Phys. 82, 2840–2844 (1997)
https://doi.org/10.1063/1.366115
Dynamic analysis of the response of lateral piezoresistance gauges in shocked ceramics
J. Appl. Phys. 82, 2845–2854 (1997)
https://doi.org/10.1063/1.366116
Transient enhanced diffusion of boron in presence of end-of-range defects
J. Appl. Phys. 82, 2855–2861 (1997)
https://doi.org/10.1063/1.366117
Effects of the defect structure on hydrogen transport in amorphous silicon
J. Appl. Phys. 82, 2862–2868 (1997)
https://doi.org/10.1063/1.366118
Measurement of depth-dependent atomic concentration profiles in structures
J. Appl. Phys. 82, 2869–2876 (1997)
https://doi.org/10.1063/1.366119
Uniform bookshelf alignment of chiral smectic films with guided backflow
J. Appl. Phys. 82, 2877–2880 (1997)
https://doi.org/10.1063/1.366120
Strain relaxation in high electron mobility structures
J. Appl. Phys. 82, 2881–2886 (1997)
https://doi.org/10.1063/1.366281
Strain and defects depth distributions in undoped and boron-doped layers grown by solid phase epitaxy
J. Appl. Phys. 82, 2887–2895 (1997)
https://doi.org/10.1063/1.366121
Phases, morphology, and diffusion in thin films
J. Appl. Phys. 82, 2896–2905 (1997)
https://doi.org/10.1063/1.366122
Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range
Eva Franke; Mathias Schubert; Horst Neumann; Thomas E. Tiwald; Daniel W. Thompson; John A. Woollam; Jens Hahn; Frank Richter
J. Appl. Phys. 82, 2906–2911 (1997)
https://doi.org/10.1063/1.366123
Microwave-induced low-temperature crystallization of amorphous silicon thin films
J. Appl. Phys. 82, 2918–2921 (1997)
https://doi.org/10.1063/1.366125
Agglomeration of thin film on (100) Si substrates
J. Appl. Phys. 82, 2933–2937 (1997)
https://doi.org/10.1063/1.366127
Surface morphology changes in ZnSe-related II–VI epitaxial films grown by molecular beam epitaxy
J. Appl. Phys. 82, 2938–2943 (1997)
https://doi.org/10.1063/1.366128
A comparison of surface roughness as measured by atomic force microscopy and x-ray scattering
J. Appl. Phys. 82, 2944–2953 (1997)
https://doi.org/10.1063/1.366129
Study of solid surfaces by metastable electron emission microscopy: Energy-filtered images and local electron spectra at the outermost surface layer of silicon oxide on Si(100)
Susumu Yamamoto; Shigeru Masuda; Hideyuki Yasufuku; Nobuo Ueno; Yoshiya Harada; Takeo Ichinokawa; Makoto Kato; Yuji Sakai
J. Appl. Phys. 82, 2954–2960 (1997)
https://doi.org/10.1063/1.366130
Calculation of the electron initiated impact ionization transition rate in cubic and hexagonal phase ZnS
J. Appl. Phys. 82, 2961–2964 (1997)
https://doi.org/10.1063/1.366131
New correlation procedure for the improvement of resolution of deep level transient spectroscopy of semiconductors
J. Appl. Phys. 82, 2965–2968 (1997)
https://doi.org/10.1063/1.366269
Properties of electron traps in grown on
J. Appl. Phys. 82, 2969–2973 (1997)
https://doi.org/10.1063/1.366132
High-energy electron–electron interactions in silicon and their effect on hot carrier energy distributions
J. Appl. Phys. 82, 2974–2979 (1997)
https://doi.org/10.1063/1.366133
Observation of new type resonances in triple barrier resonant tunneling diodes
J. Appl. Phys. 82, 2980–2983 (1997)
https://doi.org/10.1063/1.366134
Tunable band offsets in ZnSe/GaAs heterovalent heterostructures grown by metalorganic vapor phase epitaxy
J. Appl. Phys. 82, 2984–2989 (1997)
https://doi.org/10.1063/1.366135
Reproducible growth of highly crystalline thin films on by scanning pulsed laser deposition
J. Appl. Phys. 82, 3019–3023 (1997)
https://doi.org/10.1063/1.366140
Experimental evidence of Josephson noise in superconductor-insulator-superconductor quasiparticle mixers
J. Appl. Phys. 82, 3024–3027 (1997)
https://doi.org/10.1063/1.366160
Optimizing the two-coil mutual inductance measurement of the superconducting penetration depth in thin films
J. Appl. Phys. 82, 3028–3034 (1997)
https://doi.org/10.1063/1.366287
Field mapping characterization for axially magnetized, superconducting cylinders in the remanent critical state: theory and experiment
Th. Klupsch; Th. Strasser; T. Habisreuther; W. Gawalek; S. Gruss; H. May; R. Palka; F. J. Mora Serrano
J. Appl. Phys. 82, 3035–3041 (1997)
https://doi.org/10.1063/1.366141
Correlation between magnetic interactions and giant magnetoresistance in melt-spun granular alloys
J. Appl. Phys. 82, 3047–3053 (1997)
https://doi.org/10.1063/1.366164
Giant magneto radio frequency absorption in magneto-resistive materials
J. Appl. Phys. 82, 3054–3057 (1997)
https://doi.org/10.1063/1.366143
Theory of microwave propagation in dielectric/magnetic film multilayer structures
J. Appl. Phys. 82, 3058–3067 (1997)
https://doi.org/10.1063/1.366144
Magnetic field effect on the complex permeability spectra in a Ni–Zn ferrite
J. Appl. Phys. 82, 3068–3071 (1997)
https://doi.org/10.1063/1.366145
A new semiconductor ferroelectric
J. Appl. Phys. 82, 3076–3080 (1997)
https://doi.org/10.1063/1.366146
Intrinsic dead layer effect and the performance of ferroelectric thin film capacitors
J. Appl. Phys. 82, 3081–3088 (1997)
https://doi.org/10.1063/1.366147
Electroreflectance of surface-intrinsic- -type doped GaAs
J. Appl. Phys. 82, 3089–3091 (1997)
https://doi.org/10.1063/1.366148
Airy function analysis of Franz–Keldysh oscillations in the photoreflectance spectra of layers
J. Appl. Phys. 82, 3092–3099 (1997)
https://doi.org/10.1063/1.366149
Dispersion of birefringence in and
J. Appl. Phys. 82, 3100–3104 (1997)
https://doi.org/10.1063/1.366150
Optical dispersion relations in amorphous semiconductors InSb and
J. Appl. Phys. 82, 3105–3110 (1997)
https://doi.org/10.1063/1.366151
Absorption and luminescence of the surface states in ZnS nanoparticles
J. Appl. Phys. 82, 3111–3115 (1997)
https://doi.org/10.1063/1.366152
Resonance effects in photoluminescence from deep traps in doped glasses
J. Appl. Phys. 82, 3116–3119 (1997)
https://doi.org/10.1063/1.366555
Grazing incidence reflectivity and total electron yield effects in soft x-ray absorption spectroscopy
D. Alders; T. Hibma; G. A. Sawatzky; K. C. Cheung; G. E. van Dorssen; M. D. Roper; H. A. Padmore; G. van der Laan; J. Vogel; M. Sacchi
J. Appl. Phys. 82, 3120–3124 (1997)
https://doi.org/10.1063/1.366153
The potential formation of on an oxidizing porous silicon surface a source of oxygen atoms
J. Appl. Phys. 82, 3125–3128 (1997)
https://doi.org/10.1063/1.366154
Li deficiencies in films prepared by pulsed laser deposition in a buffer gas
J. Appl. Phys. 82, 3129–3133 (1997)
https://doi.org/10.1063/1.366155
Wet oxidation of AlGaAs: the role of hydrogen
J. Appl. Phys. 82, 3134–3136 (1997)
https://doi.org/10.1063/1.366156
Stimulated etching of Si(100) by molecular beams with hyperthermal translational energies
J. Appl. Phys. 82, 3137–3142 (1997)
https://doi.org/10.1063/1.366157
A model of the Temkin isotherm behavior for hydrogen adsorption at interfaces
J. Appl. Phys. 82, 3143–3146 (1997)
https://doi.org/10.1063/1.366158
The elastic constants of silicon carbide: A Brillouin-scattering study of 4H and 6H SiC single crystals
J. Appl. Phys. 82, 3152–3154 (1997)
https://doi.org/10.1063/1.366100
Fractional-dimensional space and applications in quantum-confined semiconducting heterostructures
J. Appl. Phys. 82, 3155–3157 (1997)
https://doi.org/10.1063/1.366267
Dynamics of photoexcited carriers in double heterostructures
W. Shan; S. Xu; B. D. Little; X. C. Xie; J. J. Song; G. E. Bulman; H. S. Kong; M. T. Leonard; S. Krishnankutty
J. Appl. Phys. 82, 3158–3160 (1997)
https://doi.org/10.1063/1.366101
Thermoelectric power properties of graphitic nanotubule bundles
J. Appl. Phys. 82, 3164–3166 (1997)
https://doi.org/10.1063/1.366161
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Selecting alternative metals for advanced interconnects
Jean-Philippe Soulié, Kiroubanand Sankaran, et al.
Defects in semiconductors
Cyrus E. Dreyer, Anderson Janotti, et al.