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High-frequency response of atomic-force microscope cantilevers
J. Appl. Phys. 82, 966–979 (1997)
https://doi.org/10.1063/1.365935
Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor
J. Appl. Phys. 82, 980–984 (1997)
https://doi.org/10.1063/1.365936
Inversion in x-ray Bragg diffraction: A practical technique to compensate for dynamical scattering features
J. Appl. Phys. 82, 989–993 (1997)
https://doi.org/10.1063/1.365937
Photorefractive effect in crystals enhanced by stoichiometry control
J. Appl. Phys. 82, 1006–1009 (1997)
https://doi.org/10.1063/1.365863
Relationship between refractive indices and hydrogen concentration in proton exchanged waveguides
J. Appl. Phys. 82, 1010–1017 (1997)
https://doi.org/10.1063/1.365864
Modeling of pyrolytic laser direct writing: Noncoherent structures and instabilities
J. Appl. Phys. 82, 1018–1025 (1997)
https://doi.org/10.1063/1.365865
Second-harmonic generation accompanying nonlinear reflection of shear waves in an isotropic layered structure
J. Appl. Phys. 82, 1026–1030 (1997)
https://doi.org/10.1063/1.365866
Anomalous behaviour of leaky surface waves for stiffening layer near cutoff
J. Appl. Phys. 82, 1031–1035 (1997)
https://doi.org/10.1063/1.365867
Implantation-induced disordering of -ordered GaInP
J. Appl. Phys. 82, 1042–1052 (1997)
https://doi.org/10.1063/1.365869
A model for ion-irradiation induced hydrogen loss from organic materials
J. Appl. Phys. 82, 1058–1064 (1997)
https://doi.org/10.1063/1.365871
Coherent Raman spectroscopy of nanoshocks
J. Appl. Phys. 82, 1080–1087 (1997)
https://doi.org/10.1063/1.365874
Crack softening damage model for ceramic impact and its application within a hydrocode
J. Appl. Phys. 82, 1088–1092 (1997)
https://doi.org/10.1063/1.365875
Speckle photography during dynamic impact of an energetic material using laser-induced fluorescence
J. Appl. Phys. 82, 1093–1099 (1997)
https://doi.org/10.1063/1.365876
Unsteady plane smooth wave fronts of combined growing-attenuating type
J. Appl. Phys. 82, 1100–1112 (1997)
https://doi.org/10.1063/1.365877
Atomic diffusion induced by stress relaxation in InGaAs/GaAs epitaxial layers
J. Appl. Phys. 82, 1147–1152 (1997)
https://doi.org/10.1063/1.365881
Measurement of thermal diffusivities of thin metallic films using the ac calorimetric method
J. Appl. Phys. 82, 1153–1156 (1997)
https://doi.org/10.1063/1.365882
Determination of the local microstructure of epitaxial AlN by x-ray absorption
J. Appl. Phys. 82, 1166–1171 (1997)
https://doi.org/10.1063/1.365884
Diffuse x-ray scattering of misfit dislocations at /Si interfaces by triple crystal diffractometry
J. Appl. Phys. 82, 1172–1177 (1997)
https://doi.org/10.1063/1.365885
Modeling and characterizing the propagation velocity of exothermic reactions in multilayer foils
J. Appl. Phys. 82, 1178–1188 (1997)
https://doi.org/10.1063/1.365886
Synthesis and magnetic properties of thin films
Gerald T. Kraus; Yung-Cheng Lu; Jessika E. Trancik; Diana M. Mitro; Emmanuel P. Giannelis; Michael O. Thompson; Stephen L. Sass
J. Appl. Phys. 82, 1189–1195 (1997)
https://doi.org/10.1063/1.365887
Unstable behavior of Ga atoms in ZnSe epitaxial layers
J. Appl. Phys. 82, 1196–1200 (1997)
https://doi.org/10.1063/1.365888
Determination of diffusion coefficients in degenerate electron gas using Monte Carlo simulation
J. Appl. Phys. 82, 1220–1226 (1997)
https://doi.org/10.1063/1.365892
Persistent photoconductivity in a two-dimensional electron gas system formed by an AlGaN/GaN heterostructure
J. Appl. Phys. 82, 1227–1230 (1997)
https://doi.org/10.1063/1.365893
Impact ionization in thin (x=0.15 and 0.30) p-i-n diodes
J. Appl. Phys. 82, 1231–1235 (1997)
https://doi.org/10.1063/1.365940
Contact boundary conditions and the Dyakonov–Shur instability in high electron mobility transistors
J. Appl. Phys. 82, 1242–1254 (1997)
https://doi.org/10.1063/1.365895
Atomic force and scanning tunneling microscopy study of current-voltage properties of microcontacts
J. Appl. Phys. 82, 1255–1261 (1997)
https://doi.org/10.1063/1.365896
Characterization of the electrical properties of semimetallic Bi films by electrical field effect
J. Appl. Phys. 82, 1266–1273 (1997)
https://doi.org/10.1063/1.365897
Very strong influence of moisture on pyroelectric and dielectric properties of triglycine sulfate-gelatin films
J. Appl. Phys. 82, 1288–1292 (1997)
https://doi.org/10.1063/1.365900
Properties of epitaxial ferroelectric heterostructures with metallic oxide electrodes
J. Appl. Phys. 82, 1293–1298 (1997)
https://doi.org/10.1063/1.365901
aerogel film as a novel intermetal dielectric
J. Appl. Phys. 82, 1299–1304 (1997)
https://doi.org/10.1063/1.365902
Interplay of electrons and phonons in heavily doped GaN epilayers
J. Appl. Phys. 82, 1305–1309 (1997)
https://doi.org/10.1063/1.365903
Simple model for the dielectric constant of nanoscale silicon particle
J. Appl. Phys. 82, 1327–1329 (1997)
https://doi.org/10.1063/1.365762
Infrared ellipsometry study of evaporated films: Matrix densification, porosity, water sorption
J. Appl. Phys. 82, 1330–1335 (1997)
https://doi.org/10.1063/1.365906
Temperature dependence of photoluminescence intensity from AlGaInP/GaInP-quantum well structures
J. Appl. Phys. 82, 1336–1344 (1997)
https://doi.org/10.1063/1.365907
Photoluminescence of the Se and Si centers in grown by metalorganic vapor phase epitaxy
J. Appl. Phys. 82, 1350–1354 (1997)
https://doi.org/10.1063/1.365909
Magneto-optical enhancement in sputtered epitaxial films of praseodymium-substituted yttrium iron garnet
J. Appl. Phys. 82, 1359–1362 (1997)
https://doi.org/10.1063/1.365911
Acceleration–deceleration process of thin foils confined in water and submitted to laser driven shocks
J. Appl. Phys. 82, 1367–1373 (1997)
https://doi.org/10.1063/1.365913
K–Te photocathodes: A new electron source for photoinjectors
J. Appl. Phys. 82, 1384–1387 (1997)
https://doi.org/10.1063/1.365915
Growth mechanism of nanoparticles prepared by radio frequency sputtering
J. Appl. Phys. 82, 1404–1407 (1997)
https://doi.org/10.1063/1.365917
Amorphous magnetic films produced by pulsed laser deposition
P. I. Nikitin; A. A. Beloglazov; A. Yu. Toporov; M. V. Valeiko; V. I. Konov; A. Perrone; A. Luches; L. Mirenghi; L. Tapfer
J. Appl. Phys. 82, 1408–1415 (1997)
https://doi.org/10.1063/1.365918
On the initial oxidation of iron: Quantification of growth kinetics by the coupled-currents approach
J. Appl. Phys. 82, 1416–1422 (1997)
https://doi.org/10.1063/1.365919
Deep level transient spectroscopy of CdS/CdTe thin film solar cells
J. Appl. Phys. 82, 1423–1426 (1997)
https://doi.org/10.1063/1.366285
A thermionic-field-diffusion model for Npn bipolar heterojunction phototransistors
J. Appl. Phys. 82, 1427–1437 (1997)
https://doi.org/10.1063/1.365920
Image transformation in integrated quantum well infrared photodetector-light emitting diode
J. Appl. Phys. 82, 1446–1449 (1997)
https://doi.org/10.1063/1.365922
Residual conductivity of stressed Ge:Ga photoconductors after low-dose gamma irradiation
J. Appl. Phys. 82, 1450–1453 (1997)
https://doi.org/10.1063/1.365942
Calculation of levitation forces in permanent magnet-superconductor systems using finite element analysis
J. Appl. Phys. 82, 1461–1468 (1997)
https://doi.org/10.1063/1.365924
Excitonic transition and electronic subband studies in asymmetric step quantum wells
J. Appl. Phys. 82, 1494–1496 (1997)
https://doi.org/10.1063/1.365932
Realization of AlGaAs antidot arrays by pulsed laser interference gratings
C. E. Nebel; J. Rogg; M. K. Kelly; B. Dahlheimer; M. Rother; M. Bichler; W. Wegscheider; M. Stutzmann
J. Appl. Phys. 82, 1497–1499 (1997)
https://doi.org/10.1063/1.365933
Interface form birefringence in native oxided microcavities
J. Appl. Phys. 82, 1500–1502 (1997)
https://doi.org/10.1063/1.365934
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.